MICROSPECTROFLUORIMETER
    91.
    发明公开
    MICROSPECTROFLUORIMETER 失效
    显微镜分光光度计。

    公开(公告)号:EP0257093A1

    公开(公告)日:1988-03-02

    申请号:EP87901894.0

    申请日:1987-02-10

    Abstract: Un accessoire permet de convertir un microscope conventionnel en un microspectrofluorimètre. L'accessoire comprend un disque de filtrage (52) ayant des filtres passe-bande (54, 56) séparés par des segments opaques (58, 60). Le disque de filtrage (52) est mis en rotation rapide et continue afin de placer séquentiellement les filtres dans le trajet optique s'étendant entre une source de lumière à large bande et un échantillon microscopique. Le comptage photonique du rayonnement émis par l'échantillon est synchronisé avec la position des filtres pendant leur rotation à l'aide de marques de synchronisation sur le disque de filtrage. Le même accessoire peut être placé entre l'échantillon et un détecteur pour détecter l'émission de lumière de fréquences diverses.

    HYPERSPECTRAL OPTICAL ELEMENT FOR MONOLITHIC DETECTORS
    92.
    发明申请
    HYPERSPECTRAL OPTICAL ELEMENT FOR MONOLITHIC DETECTORS 审中-公开
    用于单片式检测器的高分辨光学元件

    公开(公告)号:WO2017044909A1

    公开(公告)日:2017-03-16

    申请号:PCT/US2016/051186

    申请日:2016-09-10

    Abstract: A hyperspectral optical element for monolithic detectors is provided. In one embodiment, for example a hyperspectral optical element includes a faceplate layer adapted to be mounted on top of a monolithic detector. The faceplate layer comprises a reflective inner surface. A notched layer includes a plurality of notched surfaces and is mounted to the faceplate layer. The notched surfaces oppose the reflective inner surface of the faceplate and define a plurality of variable depth cavities between the reflective inner surface of the faceplate layer and the plurality of notched surfaces of the notched layer. The faceplate layer and the notched layer are substantially transparent to a received signal and the plurality of variable depth cavities provides resonant cavities for one or more wavelengths of the received signal.

    Abstract translation: 提供了用于单片检测器的高光谱光学元件。 在一个实施例中,例如,高光谱光学元件包括适于安装在单片检测器顶部上的面板层。 面板层包括反射内表面。 缺口层包括多个缺口表面并且安装到面板层。 凹口表面与面板的反射内表面相对,并且在面板层的反射内表面和缺口层的多个缺口表面之间限定多个可变深度腔。 面板层和缺口层对接收信号基本上是透明的,并且多个可变深度腔为接收信号的一个或多个波长提供谐振腔。

    METHOD AND APPARATUS FOR AUTOMATED INDEXING OF PLURALITIES OF FILTER ARRAYS
    93.
    发明申请
    METHOD AND APPARATUS FOR AUTOMATED INDEXING OF PLURALITIES OF FILTER ARRAYS 审中-公开
    滤波器阵列自适应索引的方法和装置

    公开(公告)号:WO2013003469A2

    公开(公告)日:2013-01-03

    申请号:PCT/US2012/044411

    申请日:2012-06-27

    Abstract: A system comprises a base defining a plane perpendicular to an axis, a set of elements mounted on a surface of the base parallel to the axis, and a drive assembly in communication with the base. Each element is positionable within a respective guide channel of a mechanical structure containing optical detectors, and each element includes a plurality of sites generally parallel to the axis for securing an optical filter. The drive assembly is configured to move the base along the axis to position a respective site of each element in the set of elements in the respective guide channel relative to an optical detector.

    Abstract translation: 系统包括限定垂直于轴的平面的基座,安装在平行于轴线的基座的表面上的一组元件以及与基座连通的驱动组件。 每个元件可定位在包含光学检测器的机械结构的相应引导通道内,并且每个元件包括大致平行于轴线的多个位置以固定滤光器。 所述驱动组件被构造成沿所述轴线移动所述基座,以相对于光学检测器将相应引导通道中的所述一组元件中的每个元件的相应位置定位。

    ENCODED VARIABLE FILTER SPECTROMETER
    94.
    发明申请
    ENCODED VARIABLE FILTER SPECTROMETER 审中-公开
    编码变量滤波器

    公开(公告)号:WO02084238A3

    公开(公告)日:2003-05-01

    申请号:PCT/US0209468

    申请日:2002-03-27

    Abstract: Spectroscopic system and spectrometers including an optical bandpass filter unit consisting of a plurality of bandpass regions and a spatial encoding unit for encoding discrete frequencies of light passing through the optical filter. The incorporation of the encoding unit allows the spectrometer system to use a detector consisting of one or a small number of elements, rather than using a more expensive detector array as is commonly used with filter-based spectrometers. The system can also include an integrating chamber that collects the light that is not transmitted through the bandpass filter unit and is substantially reflected, and redirects this light to strike the filter unit again, resulting in a significant increase in the optical power passing through the filter. The integrating chamber maximizes the return of the reflected light to the filter assembly and minimizes optical losses. The integrating chamber may be an orthogonal design to preserve the optical geometric characteristics of the light entering the chamber, even after multiple reflections from the optical filter.

    Abstract translation: 光谱系统和光谱仪包括由多个带通区域组成的光学带通滤波器单元和用于编码通过滤光器的光的离散频率的空间编码单元。 编码单元的结合允许光谱仪系统使用由一个或少量元件组成的检测器,而不是使用与基于滤波器的光谱仪通常使用的更昂贵的检测器阵列。 该系统还可以包括积分室,其收集未透射通过带通滤光器单元的光并且基本上被反射,并且重定向该光以再次撞击滤光器单元,导致通过滤光器的光功率的显着增加 。 积分室使反射光的返回最大化到滤光器组件,并使光损耗最小化。 积分室可以是正交设计,以便即使在来自滤光器的多次反射之后也能保持进入室的光的几何特性。

    HEMISPHERICAL DETECTOR
    95.
    发明申请
    HEMISPHERICAL DETECTOR 审中-公开
    半球形探测器

    公开(公告)号:WO0240951A3

    公开(公告)日:2002-12-19

    申请号:PCT/US0148163

    申请日:2001-10-30

    Abstract: A hemispherical detector comprising a plurality of photodetectors (12) arranged in a substantially contiguous array, the array being substantially in the shape of a half-sphere, the half-sphere defining a closed end (50) and an open end (60), the open end (60) defining a substancially circular face. Also provided is a method for constructing a hemispherical detector comprising the steps of making a press mold of the desired shape of the hemispherical detector, pouring a material into the press mold to form a cast, finishing the cast to remove any defects, coating the cast with a coating material, and attaching a plurality of photodetectors to the cast.

    Abstract translation: 一种半球形探测器,包括以基本上连续的阵列排列的多个光电探测器(12),该阵列基本上呈半球形,该半球形成封闭端(50)和开放端(60), 该开放端(60)限定了一个基本上圆形的面。 还提供了一种用于构造半球形检测器的方法,该方法包括以下步骤:制造半球形检测器的期望形状的压模,将材料注入压模中以形成铸件,精加工铸件以去除任何缺陷,涂覆铸件 用涂层材料,并将多个光电探测器连接到铸件上。

    SPECTROMETRIC USING BROADAND FILTERS WITH OVERLAPPING SPECTRAL RANGES
    96.
    发明申请
    SPECTROMETRIC USING BROADAND FILTERS WITH OVERLAPPING SPECTRAL RANGES 审中-公开
    使用宽带滤波器的光谱与超量程光谱范围

    公开(公告)号:WO2002088646A1

    公开(公告)日:2002-11-07

    申请号:PCT/IB2002/001323

    申请日:2002-04-17

    Abstract: The invention provides a spectrometer (10) which includes a filter arrangement (16,18), in addition to any optional filters (20) for limiting an operational wavelength range of the spectrometer, the filter arrangement (16,18) comprising a plurality of broadband optical filters or broadband optical filter areas each of known transmission and being located or selectively locatable in a path of collected incident spectral radiation (44). The spectrometer further includes at least one detector (24) arranged to measure the spectral radiation passing through at least one of the broadband filters located in the path of collected incident spectral radiation, and signal-processing means (34) for recovering the spectrum of the collected spectral radiation from measurements by the detector (24).

    Abstract translation: 本发明提供了一种光谱仪(10),其包括滤光器装置(16,18),除了用于限制光谱仪的操作波长范围的任何可选滤光器(20)之外,滤光器装置(16,18)包括多个 宽带光学滤波器或宽带光学滤波器区域,每个已知传输并且位于或选择性地定位在所收集的入射光谱辐射(44)的路径中。 光谱仪还包括至少一个检测器(24),其被布置成测量通过位于收集的入射光谱辐射的路径中的至少一个宽带滤光器的光谱辐射;以及信号处理装置(34),用于恢复 通过检测器(24)的测量收集光谱辐射。

    OPTICAL ANALYSIS INSTRUMENT HAVING ROTATING OPTICAL STANDARDS
    98.
    发明申请
    OPTICAL ANALYSIS INSTRUMENT HAVING ROTATING OPTICAL STANDARDS 审中-公开
    具有旋转光学标准的光学分析仪器

    公开(公告)号:WO1985003575A1

    公开(公告)日:1985-08-15

    申请号:PCT/HU1985000007

    申请日:1985-02-13

    Abstract: A near-infrared and/or visible optical analyzer which is able to measure the concentrations of material in industrial processes. The analyzer is equipped with a number of interference filters (9), mounted in a rotating filter wheel (11). The monochromatic radiation is reflected by the material moving along the optical window (27) of the analyzer. More than one type of detectors (29) are mounted in a detector head (30) to measure the reflected radiation in a wide wavelength range. The amplified and dark current compensated signal is processed by a microprocessor controlled circuit. The reflection optical standard (24) used as a reference in the analyzer periodically intercepts the radiation beam and radiation reflected from the standard is also impinging upon the same detectors. The reflection standard is mounted on a blade (22) rotated by a reduction gear mechanism (20). On the other side of the blade a so called absorption optical standard (25) is mounted, with the help of which the stable operation of the analyzer can be checked.

    Abstract translation: 近红外和/或可见光分析仪,能够测量工业过程中材料的浓度。 分析仪配有多个安装在旋转滤光轮(11)中的干涉滤光片(9)。 单色辐射被沿着分析仪的光学窗口(27)移动的材料反射。 多于一种类型的检测器(29)安装在检测器头(30)中以测量宽波长范围内的反射辐射。 放大和暗电流补偿信号由微处理器控制电路处理。 在分析仪中用作参考的反射光学标准(24)周期性地拦截辐射束,并且从标准反射的辐射也撞击在相同的检测器上。 反射标准安装在由减速齿轮机构(20)旋转的叶片(22)上。 在叶片的另一侧,安装了所谓的吸收光学标准(25),借此可以检查分析仪的稳定运行。

    測光装置
    99.
    发明专利
    測光装置 审中-公开

    公开(公告)号:JP2017207406A

    公开(公告)日:2017-11-24

    申请号:JP2016100886

    申请日:2016-05-19

    Inventor: 井崎 雄三

    Abstract: 【課題】低輝度から高輝度までを高精度で且つ短時間に測光することのできる測光装置を提供すること。 【解決手段】ディスプレイ(2)のような測定対象の光を測定する測光装置(1)であって、三刺激値に応じた特定の波長を選択透過する干渉フィルタ(20X、20Y、20Z)と、入射された光を分光して透過するLVF(21)と、これら干渉フィルタ及び前LVFを支持する円板(22)と、測定対象からの光を干渉フィルタ及びLVFに順次走査させるよう円板を回転駆動するモータ(23)と、干渉フィルタを介した光及びLVFを介した光を電気信号に変換する受光部(13)と、受光部により変換された干渉フィルタを介した光の電気信号及びLVFを介した光の電気信号に基づき測光情報を出力する測光制御部(14)と、を備える。 【選択図】図2

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