Abstract:
PROBLEM TO BE SOLVED: To limit the movement of immersion liquid in a gap between immersion system structure and a projection system, and to reduce the quantity of immersion liquid that escapes the immersion system through the gap.SOLUTION: A lithographic apparatus includes a projection system configured to project a patterned radiation beam onto a target portion of a substrate. The lithographic apparatus also includes a barrier member, surrounding a space between the projection system, and the substrate in use, to define in part with the projection system a reservoir for liquid. A radially outer surface of the barrier member facing a portion of the projection system and a radially outer surface of the portion of the projection system facing the barrier member each have a lyophobic outer surface. The lyophobic outer surface of the barrier member and/or the lyophobic outer surface of the portion of the projection system has an inner edge that defines in part the reservoir.
Abstract:
PROBLEM TO BE SOLVED: To at least reduce or mitigate for an effect of non-uniform heating of elements in a lithographic apparatus when using a localized illumination mode.SOLUTION: A lithographic apparatus comprises a beam modifying apparatus mounted in the path of a radiation beam. The beam modifying apparatus comprises a conduit configured to allow the flow of a fluid through it, the conduit being arranged such that, in use, the radiation beam passes through the conduit and the fluid flowing through it. The beam modifying apparatus further comprises a heat exchanger in thermal communication with a portion of the conduit located upstream, having regard to the direction of the fluid flow, of the location at which the radiation beam passes through the conduit.
Abstract:
PROBLEM TO BE SOLVED: To provide a more efficient method for driving movement of a substrate table.SOLUTION: A lithographic apparatus comprises a carrier, and a drive system for moving the carrier relative to a projection system in a plane defined by reference to orthogonal axes X and Y. The drive system comprises a shuttle configured and arranged so as to move parallel to the Y-axis, a shuttle connector connecting the shuttle to the carrier and allowing movement of the carrier in a direction parallel to the X-axis relative to the shuttle, and a shuttle driver for driving movement of the shuttle parallel to the Y-axis. The shuttle is located to one side of the carrier in a direction parallel to the X-axis, and only one shuttle is connected to the carrier. The shuttle driver and the shuttle connector are configured to supply at least 10% of the Y-component of forces applied to the carrier by the drive system.
Abstract:
PROBLEM TO BE SOLVED: To reduce an influence which vibration has on a pattern projected on a substrate.SOLUTION: The lithographic apparatus comprises: a radiation source for generating a radiation beam; a support structure for supporting a patterning device; a substrate table for supporting a substrate; and a projection system for projecting a patterned radiation beam onto a target portion of the substrate. The lithographic apparatus further includes a vibration measuring device configured to measure a relative vibration between the patterning device and the substrate during exposure onto the target portion. A control device adjusts an intensity of the radiation beam so as to compensate an influence which the measured relative vibration has on the pattern projected onto the substrate.
Abstract:
PROBLEM TO BE SOLVED: To provide an immersion-type lithography projection device with improved functionality.SOLUTION: An immersion-type lithography projection device comprises: a radiation systems Ex, IL which are provided with a radiation source LA and supply projection beams PB of radiation; a first object table (mask table) MT connected to first positioning means for correctly positioning a mask with respect to a member PL; a second object table (substrate table) WT connected to second positioning means for correctly positioning a substrate with respect to the member PL; and a projection system PL for forming an image of a radiated part of the mask MA on a target part C of a substrate W.
Abstract:
PROBLEM TO BE SOLVED: To arrange replaceable optical components in the beam path of an optical assembly with sufficient precision and reproducibility, to prevent transmission of interfering vibration from an exchange mechanism and replaceable optical components to the optical assembly, and to prevent contamination of the optical assembly and respective optical components thereof due to particles generated from the exchange mechanism.SOLUTION: In the optical assembly (1) having a plurality of optical components (2), at least one optical component (2', 2") is connected with a structure (5) separated movably from the optical assembly (1). Consequently, the optical component (2', 2") is sufficiently separated movably also from other optical components (2) and optical assembly (1).
Abstract:
PROBLEM TO BE SOLVED: To protect an immersion fluid from an atmospheric environment in an immersion lithographic apparatus.SOLUTION: A lithographic apparatus is disclosed in which a liquid supply system is configured to supply a liquid to a region between a substrate W and a projection system PL of the lithographic apparatus and which has a liquid confinement structure fixed in a plane substantially perpendicular to an optical axis of the projection system PL and configured to hold the substrate W in order to restrict the liquid to a region above an upper surface of a substrate table WT so that a side of the substrate W to be exposed is substantially covered in the liquid during exposure.
Abstract:
PROBLEM TO BE SOLVED: To provide a variable attenuator which satisfies necessary performance conditions to be used in a sub system of a lithographic apparatus used for controlling a dose of radiation in a lithographic exposure process.SOLUTION: A system and method provides a high speed variable attenuator. The attenuator can be used within a lithographic apparatus to control intensity of radiation of one or more correction pulses used to correct a dose of the radiation subsequently to an initial pulse of the radiation.
Abstract:
PROBLEM TO BE SOLVED: To provide a system that reduces lithography errors arising from an immersion liquid.SOLUTION: A lithographic apparatus includes: an illumination system configured to condition a radiation beam; a support constructed to support a patterning device capable of imparting a pattern to the radiation beam in its cross section to form a patterned radiation beam; a substrate table constructed to hold a substrate; a projection system configured to project the patterned radiation beam onto a target portion of the substrate; a liquid supply system configured to at least partly fill a space between a final element of the projection system and the substrate with a liquid; a seal member arranged to substantially contain the liquid within the space between the final element of the projection system and the substrate; and elements to control and/or compensate for evaporation of the immersion liquid from the substrate.
Abstract:
PROBLEM TO BE SOLVED: To provide an immersion-type lithographic projection apparatus with improved functionality.SOLUTION: The immersion-type lithographic projection apparatus comprises: a radiation system Ex which is provided with a radiation source LA and supplies a radiation projection beam PB; an illumination system IL; a first object table (mask table) MT connected to first positioning means for accurately positioning a mask to a member PL; a second object table (substrate table) WT connected to second positioning means for accurately positioning the substrate to the member PL; and a projection system PL for imaging an irradiated part of a mask MA on a target part C of a substrate W. This apparatus also includes at least one sensor that is disposed so as to be illuminated with a radiation projection beam that has passed through an immersion liquid.