Abstract:
An imaging system includes forward directed optical coherence tomography (OCT), and non-retroreflected forward scanning OCT, and also interferometric imaging and ranging techniques and fluorescent, Raman, two-photon, and diffuse wave imaging can be used. The forward scanning mechanisms include a cam (70) attached to a motor (61), pneumatic devices (96), a pivoting device (90, 94), piezoelectric transducers (74), electrostatic driven slides (108) for substantially transverse scanning; counter-rotating prisms (144), and offset lenses (62) are used for arbitrary scanning. The imaging system of the invention is applied to hand held probes including probes integrated with surgical probes, scalpels, scissors, forceps and biopsy instruments. Hand held probes include forward scanning lasers. The imaging system is also applicable to laparoscopes and endoscopes for diagnostic and therapeutic intervention in body orifices, canals, tubes, ducts, vessels and cavities of the body.
Abstract:
A method and apparatus for performing optical imaging on a sample wherein longitudinal scanning or positioning in the sample is provided by either varying relative optical path lengths for an optical path leading to the sample and to a reference reflector (32), or by varying an optical characteristic of the output from an optical source applied to the apparatus. Transverse scanning in one or two dimensions is provided on the sample by providing controlled (28) relative movement between the sample and a probe module in such direction and/or by steering optical (18) radiation in the probe module to a selected transverse position. The probe module may be an external module or may be an endoscope or angioscope utilized for scanning internal channels.
Abstract:
An imager that can provide separated images corresponding to differing depths in a sample is presented. In accordance with some embodiments of the invention, an imager can include a light source; a sample arm that receives light from the light source, directs the light to a sample, and captures light returning from the sample; a modulation source that provides different modulations corresponding to differing imaging depths in the sample; a detector system to receive the captured light from the sample with the different modulations; and a processor that receives signals from the detector system and separates a plurality of images corresponding with the differing image depths in the sample.
Abstract:
An interferometer includes a tunable laser source (1) of coherent radiation generating an input beam; a first polarizer (2) configured to transmit a polarized beam with adjustable intensities of orthogonally polarized components; a broadband non-polarizing beam splitter (3) forming two optically connected arms (I; II), first one with a transmitted beam, and sequentially comprising a birefringent element (4) configured to split the polarized input beam into two separate, parallel, orthogonally polarized reference beam and object beam and mounted on the base (5) with fine rotation, the birefringent element acts as both the splitter and the combiner in an interferometer; and a sample (6) with means of its shifting and inclining; and a chopper wheel (10) with a system of holes that opens sequentially for some time object and reference beams separately, then simultaneously, providing interference of said beams; and a broadband plane mirror (11) reflecting incident object and reference beams in the opposite direction and providing double passing of the beams through the sample and the birefringent element which converts two said beams into orthogonally polarized components of a single output beam falling on a non-polarizing beam splitter; this beam, been reflected, forms the second arm (II) of the interferometer, where there are sequentially arranged a controllable phase retarder (12), configured to introduce phase shift only into one polarization component of a said beam; and the second polarizer (13) that equalizes and mixes the polarization components of the input said beam and transforms input said beam into a beam, which is the result of interference of polarization components of the input beam; and a photodetector (14) configured to receive an input beam and transform an intensity of the beam into output electric signal (27), which can be amplified and analyzed by various electronic devices.
Abstract:
The invention relates to optical measurement systems and optical measurement methods on the basis of digital holography for measuring at least one component of the deformation and/or expansion of a measurement object in at least one prespecified or prespecifiable direction using digital holography. The optical measurement system comprises a digital holography apparatus (12, 12-1, 12-2, 12-3) for illuminating a scanning region of a measurement object, which digital holography apparatus has an out-of-plane and/or and in-plane digital holography arrangement with at least two coherent beams, and a microscope objective (24), the optical axis of which is substantially parallel to a vertical direction and which is arranged in the optical path of the at least one part of the light reflected by the measurement object (22), wherein, when viewed in the vertical direction, the digital holography apparatus (12, 12-1, 12-2, 12-3) is arranged below or above the microscope objective (24) and/or a microscope base body.
Abstract:
The invention relates to an interferometry method for optically examining coatings. This can be carried out as a white light interferometry or spectral thin-film interferometry method, for example. In the process, a measuring spot (18) is generated with a diameter (d), said spot used to optically examine the surface (12) of a measured object (11). According to the invention, the method is carried out on a measured object (11) with velocity (v), wherein the illumination of the measured object is done with light pulses of a duration (t). In the process, the fact that the extent (a) of the coating section to be examined must be greater than d + vt in order to perform a measurement must be taken into account. According to the invention, the parameters (d, v and t) are suitably selected for a pre-determined velocity (v) of the measured object. The measurement method can therefore be advantageously applied in ongoing, continuous production of coated components.
Abstract:
A method including comparing information derivable from a scanning interferometry signal for a first surface location of a test object to information corresponding to multiple models of the test object, wherein the multiple models are parametrized by a series of characteristics for the test object. The derivable information being compared may relate to a shape of the scanning interferometry signal for the first surface location of the test object.
Abstract:
An apparatus and method for differential spectral interferometry comprising providing an interferometer comprising a light source; employing an element to provide a dithered relative phase shift between target and reference arms of the interferometer, detecting output from the interferometer, demodulating signals received from the detector at different multiples of the dither frequencies, generating more than one real-valued interferograms from demodulated signals, and using the real- valued interferograms to obtain the complex spectral interferogram.