Abstract:
An apparatus for sensing a force. The apparatus includes a nanostructure being suitable for emitting electrons and a collector. The collector is proximately positioned with respect to the nanostructure so as to receive the emitted electrons and define a gap therebetween. The gap is partially dependent upon the applied force and the emission and reception of the electrons are indicative of the applied force.
Abstract:
A force detecting microsensor (12) comprises a single crystal Si substrate (14), a single crystal cone (16) formed on the substrate (14) and a resilient electrode mounted above the tip of the Si cone (16). The space between the tip of the Si cone (16) and the resilient electrode is maintained in a vacuum environment and the distance between the tip and the resilient anode is in the order of a few atomic diameters. The tunneling effect of electrons occurs between the tip of the Si cone (16) and the resilient electrode when a potential is applied to the resilient electrode and the Si cone tip. The resilient electrode deflects as a result of the force acting on the microsensor (12) which alters the electrical characteristics between the resilient electrode and the Si cone tip. The changes in the electrical characteristics can be measured to determine the level of force acting on the microsensor (12). The process for making the microsensor (12) according to the invention comprises the steps of forming an insulating layer (20) and support layer (24) on the substrate (14), forming a recess (22) in the insulating layer (20) and aperture (27) in the support layer (24) depositing a single crystal Si cone (16) on the substrate (14) and fully enclosing the Si cone (16) within the recess (22) of the support layer (24) and the insulating layer (20).
Abstract:
A force measuring system comprising a triboelectric sensor, a thin film transistor (TFT) operably coupled to the triboelectric sensor such that an output voltage of the triboelectric sensor, which depends on the force applied to it, can be used as a gate voltage (VG) received by a gate of the TFT, and a device configured to measure an output of the thin film transistor and calculate a force being applied to the triboelectric sensor. A method of measuring a force is also provided.
Abstract:
Systems and methods for determining the instantaneous force generated by a motor. In one embodiment, AC power (e.g., three-phase power) is provided to a linear motor of an ESP. An instantaneous current for each of the phases is measured at a particular point in time. These instantaneous current vectors are used to determine an instantaneous force by, for example, computing a root-mean-square of the instantaneous current vectors and multiplying the root-mean-square by a power factor. The instantaneous force computation may be performed successively for multiple, distinct points in time, and these computed force values may be used to form a graphical representation of the force generated by the linear motor over the stroke of the motor. The computed force values may also be used as the basis for controlling the motor.
Abstract:
Methods, systems, and apparatus, including computer programs encoded on a computer storage medium, for monitoring a load condition over a specified area In one aspect, a load sensor comprises: a protective top cover having a load transfer assembly; a bottom plate attachable to the top cover; the bottom plate including a circuit board comprising; a load sensor, a power source; and a wireless processor; wherein the circuit board is configured on the bottom plate such that the load transfer assembly of the top plate is in contact with the load sensor.
Abstract:
The invention provides a method and system of monitoring bending strain on a wind turbine blade. The method in one aspect comprises:. locating at least three strain sensors on the turbine blade, in use each strain sensor providing a strain measurement, the strain sensors located such that edgewise and flapwise bending can be determined from the strain measurements; calculating a plurality of resultant bending strains using the strain measurements; calculating an average resultant bending strain from the plurality of resultant bending strains; and calculating a confidence value for a first sensor based on a comparison of resultant bending strains derived from the strain measurement from the first sensor with the average resultant bending strain.
Abstract:
A pressure testing device (10) for calculating a pressure in a flexible line (11) comprises a housing unit (14), a force sensor (70) mounted on the housing unit (14) and a clamp assembly having a clamp (60) mounted on the housing unit (14). The clamp (60) is operable to compress the flexible line (11) against the force sensor (70) by a predetermined degree of deformation of the flexible line (11). The device (10) includes a displacement sensor (90) adapted to measure a displacement of the clamp (60). The device (10) also includes a controller (120) having a processor in communication with the force sensor (70) and the displacement sensor (90), and a memory unit (122) containing stored data. At the predetermined degree of deformation of the flexible line (11), the processor compares a first signal from the force sensor (70) and a second signal from the displacement senor (90) with the stored data to estimate the pressure within the flexible line (11).
Abstract:
A surface mounted monitoring system is disclosed that is useful for detecting the presence of both ordinary and excessive loads on a surface, and for providing real-time or near real-time trending data. The system includes an array of force transducers disposed on the exterior surface of a structural member such as a roof. In an exemplary embodiment, transducers may be placed on an interior surface, such as embedded within insulation. The force transducers detect the magnitude of a load force acting on the surface. A data analysis module (DAM) may record force readings in a circular memory buffer, so that recent data can be recovered in the event of a catastrophic collapse. The DAM may also communicate with a monitoring device that can display real-time loading data to a user and perform other analysis.
Abstract:
Die Erfindung bezieht sich auf einen Dehnungsmesser zur Messung der Dehnung einkristallinen Halbleitermaterials. Auf dem einkristallinen Halbleitermaterial soll zur Anzeige der Dehnung des Halbleitermaterials ein Signalgeber mit hoher Empfindlichkeit, d.h. hohem Signalanteil bei kleinem Störgrössenanteil angebracht werden. Das Problem wird durch einen als Signalgeber eingesetzten MOSFET gelöst. Es wird mittels einer Konstantstromquelle (als Mittel zur Erzeugung eines konstanten Source-Drain-Stromes) der Source-Drain-Strom konstant gehalten und die sich ändernde Source-Drain-Spannung gemessen. Die Änderung der Source-Drain-Spannung ist Mass für die Dehnung.