Abstract:
Disclosed herein are systems for calibrating an analog-to-digital converter (ADC) device, as well as related devices and methods. In some embodiments, a system for calibrating an ADC device may include an ADC device, wherein the ADC device includes an ADC and a dither source, and wherein the ADC device is to apply a set of calibration parameters to generate digital outputs. The system may also include calibration circuitry, coupled to the ADC device, to determine which of multiple sets of values of calibration parameters results in the digital outputs having the lowest amount of noise, and to cause the ADC device to apply the calibration parameters associated with the lowest noise.
Abstract:
A Successive Approximated Register Analog-to-Digital Converter (“SARADC”) is provided that includes: a bootstrapping unit that receives and samples analog signals; and an Analog-to-Digital Conversion Unit (“ADCU”) that converts the analog signals into digital signals and outputs the digital signals. ADCU has a resolution increasing in response to an intentionally injected offset voltage. In this case, ADCU includes Capacitor Arrays (“CAs”) having: a differential structure each including reference voltage application capacitors having different capacitances and an Offset Voltage Injection Capacitor (“OVIC”); a delay cell that operates CAs in an asynchronous mode; Reference Transfer Switch Units (“RTSUs”) that apply a reference voltage to CAs; a comparator that compares output voltages of CAs; and Successive Approximated Register Logics (“SARLs”). SARLs control operations of RTSUs in response to an output signal of the comparator and perform control so that a reference voltage is applied to OVICs when the output of the comparator is abnormal.
Abstract:
An analog-to-digital converter includes a digital-to-analog converter comprising a capacitor divider network comprising a plurality of dividing capacitors and a dummy capacitor. The digital-to-analog converter is configured to selectively apply an input voltage and a reference voltage to the dividing capacitors and to selectively apply the input voltage and a shift voltage to the dummy capacitor. The analog-to-digital converter further includes a comparison circuit configured to compare an output of the capacitor divider network and a common mode voltage and a shift voltage generator circuit configured to generate the shift voltage. The shift voltage generator circuit may be configured to vary the shift voltage for different samples of the input voltage. For example, the shift voltage generator circuit may be configured to change the shift voltage for succeeding samples by an amount corresponding to 1/(2^M) times the reference voltage to support 2^M oversampling of the input voltage.
Abstract:
A novel and useful LC-tank digitally controlled oscillator (DCO) incorporating a split transformer configuration. The LC-tank oscillator exhibits a significant reduction in area such that it is comparable in size to conventional ring oscillators (ROs) while still retaining its salient features of excellent phase noise and low sensitivity to supply variations. The oscillator incorporates an ultra-compact split transformer topology that is less susceptible to common-mode electromagnetic interference than regular high-Q LC tanks which is highly desirable in SoC environments. The oscillator, together with a novel dc-coupled buffer, can be incorporated within a wide range of circuit applications, including clock generators and an all-digital phase-locked loop (ADPLL) intended for wireline applications.
Abstract:
A capacitive sensing system operates according to a method which uses an ADC with a low resolution r, to produce a digital signal with a higher resolution R. The analog signal to be digitized is modulated with a triangular or saw-tooth modulating signal, so that a modulated analog signal is obtained, which is sampled with the ADC. Thereby, digital samples are produced. An average is taken over N (>1) successive digital samples. The triangular or saw-tooth signal is chosen to have a peak-to-peak amplitude corresponding at least approximately to an integer multiple L, with L≧1, of the quantization step size of the ADC. The saw-tooth or triangular signal, furthermore, has a number M, of periods per each sequence of N samples. M and N are chosen such that M>1 and M≠N and such that R=r*N/(k*gcd(N, M)*L), where gcd(M, N) is the greatest common divisor of N and M and where k=2 if the modulating signal is a saw-tooth signal and k=4 if the modulating signal is a triangular signal.
Abstract:
A novel and useful look-ahead time to digital converter (TDC) that is applied to an all digital phase locked loop (ADPLL) as the fractional phase error detector. The deterministic nature of the phase error during frequency/phase lock is exploited to achieve a reduction in power consumption of the TDC. The look-ahead TDC circuit is used to construct a cyclic DTC-TDC pair which functions to reduce fractional spurs of the output spectrum in near-integer channels by randomly rotating the cyclic DTC-TDC structure so that it starts from a different point every reference clock thereby averaging out the mismatch of the elements. Associated rotation and dithering methods are also presented. The ADPLL is achieved using the look-ahead TDC and/or cyclic DTC-TDC pair circuit.
Abstract:
An analog-to-digital converter includes a digital-to-analog converter comprising a capacitor divider network comprising a plurality of dividing capacitors and a dummy capacitor. The digital-to-analog converter is configured to selectively apply an input voltage and a reference voltage to the dividing capacitors and to selectively apply the input voltage and a shift voltage to the dummy capacitor. The analog-to-digital converter further includes a comparison circuit configured to compare an output of the capacitor divider network and a common mode voltage and a shift voltage generator circuit configured to generate the shift voltage. The shift voltage generator circuit may be configured to vary the shift voltage for different samples of the input voltage. For example, the shift voltage generator circuit may be configured to change the shift voltage for succeeding samples by an amount corresponding to 1/(2̂M) times the reference voltage to support 2̂M oversampling of the input voltage.
Abstract:
A system and method for enhancing a dynamic range of a beamforming multi-channel digital receiver are described. The receiver comprises a plurality of receiving channels, each including an analog-to-digital converter configured for converting an analog input signal generated by antenna elements into a digital signal. A “spatial” dither signal is used to decorrelate the quantization noise of the analog-to-digital converters. A dither signal is generated and split into a predetermined number of coherent dithering signals. The method includes providing predetermined time delays to the coherent dithering signals, and adding the delayed coherent dithering signals to the input signals in each receiving channel, correspondingly, thereby creating a dither signal equivalent to a signal arriving from a certain specific direction out-of-field-of-view of the antenna array. Removing of the dither signal based on the direction of arrival, is implemented during beamforming signal processing, thus enhancing the dynamic range of electromagnetic signals arriving within a field-of-view of the antenna array.
Abstract:
A semiconductor communication device reduces influence of noise that is produced by applying a dither signal. The semiconductor communication device includes a Delta-Sigma analog-to-digital converter that converts input analog signals to digital signals, a power detecting unit that detects signal power of the digital signals, a gain control unit that changes a gain setting of analog signals to be input to the Delta-Sigma analog-to-digital converter depending on the signal power of the digital signals, and a dither signal control unit that causes the Delta-Sigma analog-to-digital converter to selectively add the dither signal when the gain setting changes.
Abstract:
An analog-to-digital converter is disclosed comprising a resonant oscillator comprising an input operable to receive an analog input signal and an output operable to output an oscillating signal. A DC offset detector detects a DC offset in the oscillating signal caused by the analog input signal, wherein the DC offset is converted into a digital output signal representing the analog input signal.