Abstract:
PROBLEM TO BE SOLVED: To provide a method and an apparatus for reducing noise in an original signal which contains a linear time-varying signal and the noise.SOLUTION: In the method and apparatus, the original signal is differentiated to obtain a differentiated original signal. The differentiated original signal is Fourier transformed to obtain power spectral densities of the differentiated original signal. A noise frequency is detected in a power spectral density spectrum of the obtained power spectral densities of the differentiated original signal. For the noise frequency, a corresponding noise component is determined. The noise component is subtracted from the original signal to obtain a noise-reduced original signal.
Abstract:
PROBLEM TO BE SOLVED: To reduce or eliminate the risk of imaging defect.SOLUTION: There is provided a method of adjusting speed and/or routing of a part of a movement plan of a table under an immersion fluid supply system of a lithographic apparatus. The method includes splitting the movement plan of the table into a plurality of discrete movements; determining a risk of a bubble of a size greater than a certain size being present in immersion fluid through which a patterned beam of the lithographic apparatus will pass during a certain discrete movement by determining whether the immersion fluid supply system passes over a position at which immersion fluid leaked from the immersion fluid supply system is present; and adjusting the speed and/or routing of a part of the movement plan corresponding to (i) a discrete movement earlier than a discrete movement for which the risk of a bubble is determined, and/or (ii) a discrete movement for which the risk of a bubble is determined.
Abstract:
PROBLEM TO BE SOLVED: To provide an improved lithography device, especially, a lithography device whose overlay and imaging performance are improved.SOLUTION: The lithography device includes an illumination system for adjusting a radiant beam, a support configured to support a patterning device capable of forming a pattern-imparted radiant beam by imparting a pattern to a section of the radiant beam, a substrate table configured to hold a substrate, a stage system for positioning the substrate table relative to a reference structure, a projection system for projecting the pattern-imparted radiant beam on a target part of the substrate, and an optical measurement system having a sensor part and an optical part. The optical part optically interacts with the pattern-imparted radiant beam, and transmits a result of the interaction as an output to the sensor part. The optical part is provided to the substrate table, and the sensor part is provided to the stage system or reference structure.
Abstract:
PROBLEM TO BE SOLVED: To transmit clock data to a movable stage by radio, and to at least partially compensate for dependency of propagation delay on a length of a propagation path at this time.SOLUTION: A stage device for positioning an object includes a table for holding the object and a support structure for supporting the table, wherein the table can be displaced relative to the support structure, the support structure includes at least one of a first data clock and a second data clock, and the table includes at least the other of the first data clock and second data clock and further includes a circuit for synchronizing the first data clock and second data clock with each other. The circuit includes a transmitter and a receiver, and the transmitter is configured to transmit clock signal data from the first data clock to the second data clock by radio, and further includes a synchronizing circuit for synchronizing the second data clock with the first data clock based upon the clock signal data transmitted by radio and received by the receiver.
Abstract:
PROBLEM TO BE SOLVED: To reduce fast ions in a plasma radiation source.SOLUTION: The radiation source includes a first activation source to direct a first energy pulse onto a first spot in the radiation source near discharge space to create a main plasma channel which triggers discharge. The radiation source also has a second activation source to direct a second energy pulse onto a second spot in the radiation source near the discharge space to create an additional plasma channel. By directing the second energy pulse during the same discharge, a shortcut of a main plasma current is realized, which can reduce an amount of fast ions to be produced.
Abstract:
PROBLEM TO BE SOLVED: To provide a substrate table of an immersion liquid lithographic apparatus configured to prevent contamination caused by immersion liquid.SOLUTION: A substrate table WT includes a drainage ditch, or a barrier 40 surrounding an outer peripheral edge of a substrate W, and a barrier 100 surrounding other objects 20, such as sensors, positioned on a flat surface which is substantially the same plane as the upper surface of the substrate W. The barriers 40, 100 can collect any liquid which is spilt from a liquid supply system during exposing the substrate W to reduce the risk of contamination of delicate components of a lithographic projection apparatus.
Abstract:
PROBLEM TO BE SOLVED: To provide a reduction, if not a complete prevention, of intrusion of bubbles into a light path of a projection beam during exposure, to thereby ease defects.SOLUTION: A fluid handling structure is disclosed. The fluid handling structure is configured to confine immersion liquid to a space defined between a projection system and a facing surface facing a substrate or a space defined between the projection system and a facing surface facing a table supporting the substrate, or a space defined between the projection system and both facing surfaces. The fluid handling structure includes a transponder that melts at least a part of gas within bubbles in the immersion liquid or performs control to prevent the bubbles from intruding into a light path of a beam from the projection system.
Abstract:
PROBLEM TO BE SOLVED: To provide an optical sensor device capable of monitoring the extent of contamination accumulated in an EUV system.SOLUTION: An optical sensor device for use in an extreme ultraviolet ray lithography system comprises an optical sensor including a sensor surface and a removing mechanism for removing debris from the sensor surface. Therefore, measurement of the dose and/or contamination can be accomplished favorably for the lithography system.
Abstract:
PROBLEM TO BE SOLVED: To provide a lithography device and a lithography method that can help reduce the generation of bubbles in liquid.SOLUTION: A lithography device comprising a substrate table that holds a substrate, a projection system so configured as to project a radiation beam whose pattern is formed on the substrate, a liquid feed system so configured as to feed liquid into a space among the projection system, the substrate and the substrate table, and a ring so disposed as to cover a gap between the substrate and the substrate table and to come into contact with the substrate and the substrate table.
Abstract:
PROBLEM TO BE SOLVED: To provide a lithographic apparatus with an increased throughput.SOLUTION: A lithographic apparatus includes an illumination system configured to condition a radiation beam; a support constructed to support a patterning device, the patterning device being capable of imparting the radiation beam with a pattern in its cross-section to form a patterned radiation beam; at least three substrate tables that are each constructed to hold a substrate; and a projection system configured to project the patterned radiation beam onto a target portion of the substrate, wherein the substrate tables are moveable in a common moving area extending substantially in a plane perpendicular to the patterned radiation beam, the moving area comprising at least three working locations of which at least one working location is arranged for exposure of the substrate to the patterned radiation beam and at least one working location is arranged for non-exposure purposes.