Abstract:
This invention relates to a fuzzy processor having an input X for at least a plurality of input variables X-i and an output U for one or more output results U-k, and comprising a fuzzyfication unit FU having an input coupled to the input X, a fuzzy rule processing unit RU having an input coupled to the output of the fuzzyfication unit FU, and a defuzzyfication unit DU having an input coupled to the output of the processing unit CU and an output coupled to said output U, wherein the output of the defuzzyfication unit DU is coupled to the input of the fuzzyfication unit FU and/or to the input of the processing unit RU.
Abstract:
A circuit for limitation of maximum current delivered by a power transistor (PW) comprises:
A network for detection of the current delivered by the power transistor (PW) which generates a first electrical signal, a reference network for generating a reference current (IR) proportional to a resistor (Rext) and self-limited, provided by means of a current generator circuit (5) and a limiting circuit (6) with current mirror, and
an operational amplifier (3) which compares the first electrical signal with the reference current (IR) and which tends to inhibit the power transistor (PW) if the current delivered exceeds a certain threshold value.
Abstract:
Inductive structures making highly efficient use of the magnetic flux generated, and being consistent with integrated circuit manufacturing techniques, and a method of making them on a semiconductor substrate concurrently with the formation of the integrated circuit itself.
Abstract:
A first principle on which the driver circuit of this invention operates is to delay the turning on of the MOS transistor (M2) by utilizing the time-wise pattern of the circuit input (G) signal rather than generating a delay within the circuit itself. The basic idea is one of using a threshold type of circuit element and arranging for no current to flow toward or from, depending on the type of the MOS transistor, the control terminal before the voltage at the circuit input exceeds a predetermined value. This is achieved, for example, by coupling a Zener diode (D1) serially to the control terminal. Where the input signal is of a kind which increases with a degree of uniformity, the time required to exceed that threshold will correspond to the desired delay. Thus, the driver circuit can match the dynamic range of the input signal automatically.
Abstract:
An electronic semiconductor device (20) with a control electrode (19) consisting of self-aligned polycrystalline silicon (4) and silicide (12), of the type in which said control electrode (19) is formed above a portion (1) of semiconductor material which accommodates active areas (9) of the device (20) laterally with respect to the electrode, has the active areas (9) at least partially protected by an oxide layer (10) while the silicide layer (12) is obtained by means of direct reaction between a metal film deposited on the polycrystalline silicon (4) and on the oxide layer (10).
Abstract:
A semiconductor power device comprising an isolated gate bipolar transistor, of the type which comprises a semiconductor substrate with a first type of conductivity and an overlying epitaxial layer with a second type of conductivity, opposite from the first, and whose junction to the substrate forms the base/emitter junction of the bipolar transistor, has the junction formed by a layer of semiconductor material with conductivity of the second type but a higher concentration of dopant than that of the epitaxial layer. Furthermore, the device has the epitaxial layer with conductivity of the second type provided with at least two zones at different dopant concentrations, namely a first lower zone being part of the junction and having a higher dopant concentration, and a second upper zone having a lower concentration.
Abstract:
A circuit for generating a reference voltage and detecting a drop in a supply voltage, comprising at least one threshold comparator (12) having an input terminal (IN) and an output terminal, and a voltage divider (14) connected between a first supply voltage reference (Vs) and a second voltage reference (GND) and connected to the input terminal (IN) of the comparator (12), further provides for the output terminal (OUT) of said comparator (12) to be connected to the input terminal (IN) through at least one feedback network comprising at least one current generator (CG1). The feedback network further comprises a buffer block (13) having an input terminal connected to said comparator (12) and a first output terminal (DO) connected to a switch (SW) which is connected between a circuit node (X2) of said voltage divider (14) and the second voltage reference (GND).
Abstract:
A particle-detector is formed on a die of semiconductor material (20) comprising: first and second layers (22, 23) with a first type of conductivity (N), a third layer (21) with a second type of conductivity (P), interposed between the first and second layers (22, 23), first and second means (25, 31; 26, 32) for electrical connection with the first and second layers (22, 23), respectively, disposed on the opposite surfaces thereof to those of the junctions with the third layer (21) and third means (27, 24) for electrical connection with the third layer (21). To permit large-scale industrial manufacture, the third means (27, 24) for electrical connection with the third layer (21) comprise a region (24) with the second type of conductivity (P) which extends from the front face of the die as far as the third layer (21) and means (27) for surface electrical contact with this region.