METHOD AND SYSTEM FOR REAL TIME INSPECTION OF A SILICON WAFER
    114.
    发明申请
    METHOD AND SYSTEM FOR REAL TIME INSPECTION OF A SILICON WAFER 审中-公开
    用于实时检测硅波的方法和系统

    公开(公告)号:US20150069247A1

    公开(公告)日:2015-03-12

    申请号:US14394616

    申请日:2013-04-14

    Abstract: There is provided a method and system for real time inspection of a silicon wafer. The method includes using an infrared plane polariscope to obtain an image of a bonded interface of the silicon wafer, the image showing stress patterns; and assessment of the stress patterns. The stress patterns in a form of at least one butterfly pattern indicates a presence of at least one of: at least one trapped particle, trapped gases and at least one de-bonding region. No computer/algorithm processing is carried out to locate defects/de-bondings at the bonded interface. Furthermore, the stress fields being generated can be used to approximate the size of the de-bonding region/trapped particle. The system employs the infrared plane polariscope to obtain an image of a bonded interface of the silicon wafer.

    Abstract translation: 提供了一种用于硅晶片实时检测的方法和系统。 该方法包括使用红外平面偏振器来获得硅晶片的键合界面的图像,该图像显示出应力模式; 并评估压力模式。 至少一个蝶形图案形式的应力模式表示存在至少一种捕获的颗粒,捕获的气体和至少一个去粘合区域中的至少一种。 不进行计算机/算法处理来定位键合界面处的缺陷/去粘合。 此外,产生的应力场可以用于近似去结合区域/捕获的颗粒的尺寸。 该系统采用红外平面偏振器来获得硅晶片的键合界面的图像。

    Universal Rapid Diagnostic Test Reader with Trans-Visual Sensitivity
    115.
    发明申请
    Universal Rapid Diagnostic Test Reader with Trans-Visual Sensitivity 审中-公开
    具有跨视觉灵敏度的通用快速诊断测试读取器

    公开(公告)号:US20150056719A1

    公开(公告)日:2015-02-26

    申请号:US14313615

    申请日:2014-06-24

    Abstract: A universal rapid diagnostics test reader is disclosed and described herein that includes a set of control electronics, a digital camera component, an illumination component, a housing component, and a rapid diagnostics test tray, wherein the tray can hold at least one rapid diagnostics test having a shape and a size in a fixed position relative to the digital camera component and the illumination component, and wherein the reader can accommodate more than one different rapid diagnostics test. Methods are also disclosed that include: providing at least one first rapid diagnostics test having a first physical size, first feature and first format; providing at least one second rapid diagnostics test having a second physical size, second feature and second format; inserting the first rapid diagnostics test in a universal rapid diagnostics test reader; analyzing the first rapid diagnostics test using the universal rapid diagnostics test reader; removing the first rapid diagnostics test from the reader; inserting the second rapid diagnostics test in a universal rapid diagnostics test reader without any mechanical adjustments of the reader or without the use of any additional parts or additional inserts; and analyzing the second rapid diagnostics test using the universal rapid diagnostics test reader.

    Abstract translation: 本文公开和描述了一种通用快速诊断测试读取器,其包括一组控制电子设备,数字照相机部件,照明部件,外壳部件和快速诊断测试托盘,其中托盘可以容纳至少一个快速诊断测试 具有相对于数字照相机部件和照明部件的固定位置的形状和尺寸,并且其中读取器可容纳多于一种不同的快速诊断测试。 还公开了包括:提供具有第一物理尺寸,第一特征和第一格式的至少一个第一快速诊断测试的方法; 提供具有第二物理尺寸,第二特征和第二格式的至少一个第二快速诊断测试; 将第一个快速诊断测试插入通用快速诊断测试读取器; 使用通用快速诊断测试阅读器分析第一次快速诊断测试; 从阅读器中删除第一个快速诊断测试; 将第二个快速诊断测试插入通用快速诊断测试读取器,无需读取器的任何机械调整或不使用任何附加部件或附加插入件; 并使用通用快速诊断测试读取器分析第二次快速诊断测试。

Patent Agency Ranking