Abstract:
Apparatus and methods for analyzing single molecule and performing nucleic acid sequencing. An apparatus can include an assay chip that includes multiple pixels with sample wells configured to receive a sample, which, when excited, emits emission energy; at least one element for directing the emission energy in a particular direction; and a light path along which the emission energy travels from the sample well toward a sensor. The apparatus also includes an instrument that interfaces with the assay chip. The instrument includes an excitation light source for exciting the sample in each sample well; a plurality of sensors corresponding the sample wells. Each sensor may detect emission energy from a sample in a respective sample well. The instrument includes at least one optical element that directs the emission energy from each sample well towards a respective sensor of the plurality of sensors.
Abstract:
An active-source-pixel, integrated device capable of performing biomolecule detection and/or analysis, such as single-molecule nucleic acid sequencing, is described. An active pixel of the integrated device includes a sample well into which a sample to be analyzed may diffuse, an excitation source for providing excitation energy to the sample well, and a sensor configured to detect emission from the sample. The sensor may comprise two or more segments that produce a set of signals that are analyzed to differentiate between and identify tags that are attached to, or associated with, the sample. Tag differentiation may be spectral and/or temporal based. Identification of the tags may be used to detect, analyze, and/or sequence the biomolecule.
Abstract:
Apparatus and methods for analyzing single molecule and performing nucleic acid sequencing. An integrated device includes multiple pixels with sample wells configured to receive a sample, which, when excited, emits radiation; at least one element for directing the emission radiation in a particular direction; and a light path along which the emission radiation travels from the sample well toward a sensor. The apparatus also includes an instrument that interfaces with the integrated device. Each sensor may detect emission radiation from a sample in a respective sample well. The instrument includes an excitation light source for exciting the sample in each sample well.
Abstract:
There is provided a method and system for real time inspection of a silicon wafer. The method includes using an infrared plane polariscope to obtain an image of a bonded interface of the silicon wafer, the image showing stress patterns; and assessment of the stress patterns. The stress patterns in a form of at least one butterfly pattern indicates a presence of at least one of: at least one trapped particle, trapped gases and at least one de-bonding region. No computer/algorithm processing is carried out to locate defects/de-bondings at the bonded interface. Furthermore, the stress fields being generated can be used to approximate the size of the de-bonding region/trapped particle. The system employs the infrared plane polariscope to obtain an image of a bonded interface of the silicon wafer.
Abstract:
A universal rapid diagnostics test reader is disclosed and described herein that includes a set of control electronics, a digital camera component, an illumination component, a housing component, and a rapid diagnostics test tray, wherein the tray can hold at least one rapid diagnostics test having a shape and a size in a fixed position relative to the digital camera component and the illumination component, and wherein the reader can accommodate more than one different rapid diagnostics test. Methods are also disclosed that include: providing at least one first rapid diagnostics test having a first physical size, first feature and first format; providing at least one second rapid diagnostics test having a second physical size, second feature and second format; inserting the first rapid diagnostics test in a universal rapid diagnostics test reader; analyzing the first rapid diagnostics test using the universal rapid diagnostics test reader; removing the first rapid diagnostics test from the reader; inserting the second rapid diagnostics test in a universal rapid diagnostics test reader without any mechanical adjustments of the reader or without the use of any additional parts or additional inserts; and analyzing the second rapid diagnostics test using the universal rapid diagnostics test reader.
Abstract:
A system for location based wafer analysis, the system comprising: (i) a first input interface; (ii) a second input interface; (iii) a correlator; and (iv) a processor, configured to generate inspection results for the inspected wafer, with the help of at least one frame run-time displacement.
Abstract:
The invention features a method including: (i) providing spectrally resolved information about light coming from different spatial locations in a sample comprising deep tissue in response to an illumination of the sample, wherein the light includes contributions from different components in the sample; (ii) decomposing the spectrally resolved information for each of at least some of the different spatial locations into contributions from spectral estimates associated with at least some of the components in the sample; and (iii) constructing a deep tissue image of the sample based on the decomposition to preferentially show a selected one of the components.
Abstract:
Disclosed are apparatus, kits, methods, and systems that include a radiation source configured to direct radiation to a sample; a detector configured to measure radiation from the sample; an electronic processor configured to determine infotmation about the sample based on the measured radiation; a housing enclosing the source, the detector, and the electronic processor, the housing having a hand-held form factor; an arm configured to maintain a separation between the sample and the housing, the arm including a first end configured to connect to the housing and a second end configured to contact the sample; and a layer positioned on the second end of the arm, the layer being configured to contact the sample and to transmit at least a portion of the radiation from the sample to the detector.
Abstract:
A device comprising an illumination means and a light sensing means, that can examine and memorize a discrete color of an object based on the magnitude of the reflected light bouncing off of the colored surface in at least three areas of the electromagnetic spectrum. The device also provides output as a visually and/or audibly perceptible signal for deciphering the color. The color range identified by the device is not limited to the visible spectrum and may include infra-red and ultra-violet light. A storage means for memorizing colors may also be included in the device. Applications of ColorStick technology may include children's toys, aids for the visually handicapped (e.g. blind or color blind individuals), designers, internet shoppers, gardeners, etc.
Abstract:
An apparatus and method of quantitatively obtaining a measurement of pollen of a plant. One method of counting comprises imaging the sample with the pollen well-distributed in the focal plane of the imager. Image evaluation software can identify and count objects in the image that are consistent with pollen. Total pollen count for the plant can be derived from the count of pollen of the sample, proportionality of the sample volume to the starting volume, and proportionality of area of sample imaged to total area of sample. Pollen quantification can be used for research or commercial production decisions relative to the plant or its seed.