公开(公告)号：US12125857B2

公开(公告)日：2024-10-22

申请号：US17581464

申请日：2022-01-21

Applicant: LG INNOTEK CO., LTD.

Inventor： Mark Allen Itzler ,  Brian Piccione ,  Xudong Jiang ,  Krystyna Slomkowski

IPC: H01L27/144 ,  G01J1/44 ,  H01L31/02 ,  H01L31/107 ,  H01C7/00 ,  H01L27/146

CPC classification number: H01L27/1446 ,  G01J1/44 ,  H01L31/02027 ,  H01L31/107 ,  G01J2001/4466 ,  G01J2001/448 ,  H01C7/006 ,  H01L27/14609

Abstract: A GmAPD FPA having increased tolerance optical overstress includes a limit resistor that is monolithically integrated into each pixel in the FPA, and which limits the magnitude of the current entering the read out integrated circuit.

公开(公告)号：US12107099B2

公开(公告)日：2024-10-01

申请号：US18347257

申请日：2023-07-05

Applicant: Commissariat à l'Energie Atomique et aux Energies Alternatives

Inventor： François Ayel

IPC: H01L27/146 ,  G01J1/44 ,  H04N25/772 ,  H04N25/78

CPC classification number: H01L27/14612 ,  G01J1/44 ,  H01L27/14609 ,  G01J2001/446 ,  G01J2001/448 ,  H01L27/14634 ,  H04N25/772 ,  H04N25/78

Abstract: A light sensor (4) in which each of its pixels comprises: first and second MOS transistors (T1, T2) series-connected through their sources (S), a gate of the second transistor (T2) receiving a comparative voltage (Vcmp); a first current source (104) series-connected with said transistors (T1, T2) between a first supply voltage (GND) and a second supply voltage (VDD2); a third MOS transistor (T3) and a second current source (108) series-connected between a third supply voltage (GND) and a fourth supply voltage (VDD1), wherein the third transistor (T3) has a gate connected to a connection node (106) of the first current source (104) to the first and second transistors (T1, T2); a photodiode (PD) coupled to a gate of the first transistor (T1); and a switch (RST) connected to the gate of the first transistor (T1).

公开(公告)号：US12055434B2

公开(公告)日：2024-08-06

申请号：US17720093

申请日：2022-04-13

Applicant: MicaSense, Inc.

Inventor： Justin Bates McAllister ,  Steven Matthew Larsen

IPC: G01J1/04 ,  G01J1/02 ,  G01J1/42 ,  G01J3/02 ,  G01J3/28 ,  G02B1/04 ,  G01J1/44

CPC classification number: G01J1/0474 ,  G01J1/0271 ,  G01J1/0488 ,  G01J1/4228 ,  G01J3/0205 ,  G01J3/0291 ,  G01J3/2823 ,  G02B1/04 ,  G01J2001/448 ,  G01J2003/2826

Abstract: The present disclosure is directed to irradiance sensing devices and methods. One such device includes a housing and an optical diffuser coupled to the housing. The housing has an opening that extends into the housing from an outer surface, and the opening has a circular shape at the outer surface of the housing. The optical diffuser has a first region that extends at least partially beyond the outer surface of the housing and a second region housed within the housing. The first region of the optical diffuser has a curved surface, and the optical diffuser includes a cavity extending at least partially into the second region.

公开(公告)号：US20240167334A1

公开(公告)日：2024-05-23

申请号：US18425587

申请日：2024-01-29

Applicant: Lutron Technology Company LLC

Inventor： Craig A. Casey ,  Brent Protzman

IPC: E06B9/68 ,  E05F15/70 ,  E05F15/77 ,  E06B9/42 ,  E06B9/72 ,  G01J1/42 ,  G01J1/44 ,  G05B11/32 ,  G06T7/73 ,  H04L12/28 ,  H05B47/105 ,  H05B47/11 ,  H05B47/125 ,  H05B47/13

CPC classification number: E06B9/68 ,  E05F15/70 ,  E05F15/77 ,  G01J1/4204 ,  G01J1/44 ,  G05B11/32 ,  G06T7/73 ,  H04L12/2823 ,  H04L12/2825 ,  H05B47/105 ,  H05B47/11 ,  H05B47/125 ,  H05B47/13 ,  E05Y2400/40 ,  E05Y2400/44 ,  E05Y2900/146 ,  E06B9/42 ,  E06B2009/6818 ,  E06B2009/6827 ,  E06B9/72 ,  G01J2001/448 ,  G06T2207/10016 ,  G06T2207/20076

Abstract: A sensor may detect glare from a recorded image and a shade position of a motorized window treatment may be controlled based on the position of the detected glare in the image. A luminance of a pixel may be calculated in an image and a glare condition may be detected based on the luminance of the pixel. For example, the sensor may start at a first pixel in a bottom row of pixels and step through each of the pixels on the bottom row before moving to a next row of pixels. When the sensor detects a glare condition, the sensor may cease processing the remaining pixels of the image. The sensor may calculate a background luminance of the image by reordering the pixels of the image from darkest to lightest and calculating the luminance of a pixel that is a predetermined percentage from the darkest pixel.

公开(公告)号：US20240125647A1

公开(公告)日：2024-04-18

申请号：US17967898

申请日：2022-10-18

Applicant: Japan Display Inc.

Inventor： Naoki TAKADA ,  Xingle WANG ,  Chung-Kai CHEN

IPC: G01J1/44 ,  G01J1/46

CPC classification number: G01J1/44 ,  G01J1/46 ,  G01J2001/446 ,  G01J2001/448

Abstract: According to one embodiment, a sensor device comprises a sensor configured to output a sense signal, a value the sense signal changing over time based on incident light, a first reset circuit configured to set the value of the sense signal to a reset value when the value of the sense signal exceeds a threshold, a counter configured to count a first number of times of reset by the first reset circuit, and an arithmetic operation circuit configured to calculate an amount of incident light of a certain period based on the value of the sense signal, the reset value, and the first number of times of reset.

公开(公告)号：US11955501B2

公开(公告)日：2024-04-09

申请号：US17805573

申请日：2022-06-06

Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.

Inventor： Shih-Yu Liao ,  Tsai-Hao Hung ,  Ying-Hsun Chen

IPC: H01L27/146 ,  G01J1/44 ,  H04N25/70

CPC classification number: H01L27/1464 ,  G01J1/44 ,  H01L27/14621 ,  H01L27/14627 ,  H01L27/14629 ,  H01L27/1463 ,  H01L27/14634 ,  H01L27/14636 ,  H01L27/14685 ,  H04N25/70 ,  G01J2001/448

Abstract: The present disclosure describes a method for the formation of mirror micro-structures on radiation-sensing regions of image sensor devices. The method includes forming an opening within a front side surface of a substrate; forming a conformal implant layer on bottom and sidewall surfaces of the opening; growing a first epitaxial layer on the bottom and the sidewall surfaces of the opening; depositing a second epitaxial layer on the first epitaxial layer to fill the opening, where the second epitaxial layer forms a radiation-sensing region. The method further includes depositing a stack on exposed surfaces of the second epitaxial layer, where the stack includes alternating pairs of a high-refractive index material layer and a low-refractive index material layer.

公开(公告)号：US11953629B2

公开(公告)日：2024-04-09

申请号：US17367443

申请日：2021-07-05

Applicant: Guangzhou Tyrafos Semiconductor Technologies Co., LTD

Inventor： Ping-Hung Yin ,  Jia-Shyang Wang

IPC: G01S7/4865 ,  G01J1/44 ,  G01S7/481 ,  G01S7/484 ,  G01S7/4863 ,  G01S17/10 ,  G01S17/14 ,  G04F10/00 ,  H01L27/144 ,  H01L27/146 ,  H01L31/107

CPC classification number: G01S7/4865 ,  G01J1/44 ,  G01S7/4814 ,  G01S7/4816 ,  G01S7/484 ,  G01S7/4863 ,  G01S17/10 ,  G01S17/14 ,  G04F10/005 ,  H01L27/1446 ,  H01L27/14609 ,  H01L31/107 ,  G01J2001/442 ,  G01J2001/444 ,  G01J2001/4466 ,  G01J2001/448

Abstract: A light sensor and a ranging method are provided. The light sensor includes a light source, a sensing sub-pixel, and a control circuit. The sensing sub-pixel includes a diode. The control circuit operates the diode in a Geiger mode or an avalanche linear mode. The control circuit includes a time-to-digital converter, and the time-to-digital converter includes a counting circuit. The counting circuit includes a plurality of counting units. When the time-to-digital converter receives a sensing signal provided by the sensing sub-pixel, the control circuit generates a plurality of count values according to the sensing signal through the counting units of the counting circuit, where the count values are histogram data corresponding to a distance sensing result.

公开(公告)号：US11953373B1

公开(公告)日：2024-04-09

申请号：US17967898

申请日：2022-10-18

Applicant: Japan Display Inc.

Inventor： Naoki Takada ,  Xingle Wang ,  Chung-Kai Chen

IPC: G01J1/44 ,  G01J1/46

CPC classification number: G01J1/44 ,  G01J1/46 ,  G01J2001/446 ,  G01J2001/448

Abstract: According to one embodiment, a sensor device comprises a sensor configured to output a sense signal, a value the sense signal changing over time based on incident light, a first reset circuit configured to set the value of the sense signal to a reset value when the value of the sense signal exceeds a threshold, a counter configured to count a first number of times of reset by the first reset circuit, and an arithmetic operation circuit configured to calculate an amount of incident light of a certain period based on the value of the sense signal, the reset value, and the first number of times of reset.

公开(公告)号：US20230408331A1

公开(公告)日：2023-12-21

申请号：US18461314

申请日：2023-09-05

Applicant: Panasonic Intellectual Property Management Co., Ltd.

Inventor： Masato TAKEMOTO ,  Shota YAMADA ,  Shinzo KOYAMA

IPC: G01J1/44 ,  H01L31/02 ,  H04N25/772

CPC classification number: G01J1/44 ,  H01L31/02027 ,  H04N25/772 ,  G01J2001/4466 ,  G01J2001/448

Abstract: A voltage control system has a light receiving array part receiving incident light and a light shielding array part shielding light receiving elements from incident light by a light shielding mechanism. The voltage control system also includes: a voltage application unit applying a bias voltage to an anode terminal; a multiplication state determination unit determining the multiplication state of the light shielding array part based on output signals from cathodes of the light receiving elements in the light shielding array part; and a voltage setting unit performing voltage setting for the bias voltage to be output from the voltage application unit based on the determination results from the multiplication state determination unit.

公开(公告)号：US20230375402A1

公开(公告)日：2023-11-23

申请号：US18308915

申请日：2023-04-28

Applicant: Meso Scale Technologies, LLC.

Inventor： Manish Kochar

IPC: G01J1/44

CPC classification number: G01J1/44 ,  G01J2001/4466 ,  G01J2001/448 ,  G01J2001/444

Abstract: Systems and methods for improving assay results obtained by silicon photomultiplier devices are provided. Systems may include assay devices including silicon photomultiplier devices and computing systems. Systems may further include processing components and storage units configured for receiving silicon photomultiplier device input and output information and for determining silicon photomultiplier device temperatures.