Abstract:
The present invention is directed to a method and system for use in a computing environment to monitor parameters and detect abnormalities. A monitoring system for monitoring a process may include a signature creation module (22) for creating a signature representative of the process, a signature updating module (24) for continuously updating the created signature, and an abnormality detection module (26) for detecting abnormalities based upon deviations from the updated signature. The system may perform a method for detecting abnormalities occurring during a process based upon the continuously updated signature representative of the process. The method may include continuously monitoring a system parameter and computing a normal range of values for the system parameter based on the continuously updated signature. The method may additionally include determining if the monitored system parameter is within the normal range and indicating existence of an abnormality if the monitored system parameter is outside of the normal range.
Abstract:
PROBLEM TO BE SOLVED: To provide a comparison redundancy type information processing apparatus for improving the reliability of operation data diagnosis without deteriorating the processing speed of the comparative determination of the data of two processing units. SOLUTION: The comparison redundancy type information processing apparatus includes: a first processing unit 10a and a second processing unit 10b that perform the same control program to the same input data in synchronization; an input/output unit 12 that generates the input data, and receives output data; and a channel selection unit 11 that sends the input data from the input/output unit to the processing units in parallel, and selects one from the output data to send the one to the input/output unit. Each of the processing units includes: a program memory 2a; a control cycle synchronization unit 6a that generates a control cycle signal; a processor 1a that performs the control program; a data memory 4a that stores operation data; a diagnostic unit 3a that comparatively determines whether the operation data match each other. The diagnostic unit compares summary information obtained by compressing the operation data with each other, and determines whether or not the summary information matches the other summary information, and outputs a determination signal to the channel selection unit 11. COPYRIGHT: (C)2011,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a microcontroller capable of improving processing performance as a whole by making a plurality of CPUs execute mutually different programs, and detecting abnormality by evaluating results of executing the same processing by the plurality of CPUs about a processing whose safety is required. SOLUTION: The microcontroller includes a plurality of processing systems configured of CPU (1, 4) and memories, wherein data to be output by the CPU for each processing system are separately compressed by compressors (7, 8) for each CPU, and stored, and the compressed storage data are compared by a comparator (9), and the abnormality of processing is detectable according to the mismatching of the comparison result. Even when timings in which the plurality of CPU obtain the same processing results by asynchronously executing the same processing are different, both the processing results can be easily compared by compressing the data by the compressors. Also, since the comparison of the comparator is made valid by giving comparison permission from all the CPU, it is possible to obtain the comparing operation result by using the timing in which the comparison result by the plurality of compressors is determined as a reference. COPYRIGHT: (C)2010,JPO&INPIT
Abstract:
A testing methodology for very large scale integrated circuits, for example, microprocessors having several million transistors. Initially a set of pseudorandom test patterns is selected. During the design of the integrated circuit it is partitioned into functional units and each unit is designed to be verified and tested by the test patterns. During a test mode all of the units of the integrated circuit receives the test patterns in parallel. The output from each unit is coupled to a signature register. The contents of the signature registers are examined following application of the test pattern. This testing methodology lends itself to the simultaneous testing of many integrated circuits.
Abstract:
PROBLEM TO BE SOLVED: To automatically detect abnormalities during process which is cyclic or in other form. SOLUTION: A monitoring system is equipped with a signature creation module 22 for creating a signature representative of the process, a signature updating module 24 for continuously updating the created signature, and an abnormality detection module 26 for detecting abnormalities on the basis of deviations from the updated signature. COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
Examples include application of a variable-size content-defined chunking technique to a first data portion to identify a content-defined chunk boundary at least partially defining a remainder section, merging of the remainder section with a second data portion ordered before the first data portion to create a merged section, and application of the chunking technique to the merged section.