公开(公告)号：US20240344980A1

公开(公告)日：2024-10-17

申请号：US18301486

申请日：2023-04-17

Applicant: The Boeing Company

Inventor： Brian Gunther ,  James Thaddeus Wegner ,  Jeffery Thomas Murphy

IPC: G01N21/55 ,  G02B26/08

CPC classification number: G01N21/55 ,  G02B26/0816 ,  G01N2201/021 ,  G01N2201/06113 ,  G01N2201/0633 ,  G01N2201/0637

Abstract: A reflectometer configured to test a sample. The reflectometer includes a light source that emits a light beam to the sample that is placed on a sample holder. The reflectometer focuses the light beam to a reduced spot size on the sample. The reflectometer is configured to view structure/defects in the sample using a detector that is downstream from the sample.

公开(公告)号：US20240328931A1

公开(公告)日：2024-10-03

申请号：US18240257

申请日：2023-08-30

Applicant: MOTION METRICS INTERNATIONAL CORP.

Inventor： Obada Alhumsi ,  Timothy A. McKinley

IPC: G01N21/31 ,  G01N33/24

CPC classification number: G01N21/31 ,  G01N33/24 ,  G01N2201/021 ,  G01N2201/08

Abstract: An imaging system for earthen material, including a support structure adjacent an image location for a pathway of earthen material exposed to varying and uncontrolled illumination and/or artificial illumination, a spectral imager and a reference device each mounted to the support structure, the spectral imager directed at the image location and arranged to measure an intensity of illumination reflected from earthen material at the image location.

公开(公告)号：US12044630B2

公开(公告)日：2024-07-23

申请号：US17425307

申请日：2020-01-24

Applicant: FASPAR S.p.A.

Inventor： Paolo Ottavio Aime ,  Maddalena Lucia Aime ,  Alessandro Grassi

IPC: G01N21/95 ,  B23Q17/09 ,  B23Q17/24 ,  G01N35/10 ,  G05B19/4065

CPC classification number: G01N21/95 ,  B23Q17/0995 ,  G01N35/10 ,  G05B19/4065 ,  B23Q17/2457 ,  G01N2201/021 ,  G01N2201/06113 ,  G01N2201/062 ,  G05B2219/37228 ,  G05B2219/37252 ,  G05B2219/37256 ,  G05B2219/45159 ,  G05B2219/50203

Abstract: An automatic system for inspecting a cutting edge of a ring shaped blade. An example system includes one supporting and moving group rotatably mounted around one rotation axis and configured to support the ring shaped blade between at least one parking position and at least one reading position, one first emitting unit configured to emit at least one first inspection light beam, one second emitting unit configured to emit at least one second inspection light beam, one first detecting unit configured to detect a first light beam reflected from the ring shaped blade, and one second detecting unit configured to detect a second light beam reflected from the ring shaped blade, and one control and processing unit configured to receive an input and process at least one detection signal and output at least one quality index of the cutting edge of the ring shaped blade.

公开(公告)号：US20240167937A1

公开(公告)日：2024-05-23

申请号：US18508305

申请日：2023-11-14

Applicant: Endress+Hauser Conducta GmbH+Co. KG

Inventor： Andreas Müller ,  Hans Meyer ,  Matthias Großmann

IPC: G01N21/01

CPC classification number: G01N21/01 ,  G01N2201/021

Abstract: A measuring device includes: a measuring cell, which can be manufactured cost-effectively and is easy to handle, insert and/or replace; a measuring cell receptacle for receiving the measuring cell, which is or can be clamped in the measuring cell receptacle; and a sensor for measuring for measuring at least one measured variable for a medium located in the measurement chamber or flowing through the measurement chamber of the measuring cell. The measuring cell includes a measurement chamber through which the medium can flow or which can be filled with a medium and a spring system with which the measuring cell can be clamped in the measuring cell receptacle in at least one clamping direction relating to a measurement chamber axis of the measurement chamber.

公开(公告)号：US11971358B2

公开(公告)日：2024-04-30

申请号：US17614007

申请日：2019-08-14

Applicant: ACADEMY OF MILITARY MEDICAL SCIENCES

Inventor： Shengqi Wang ,  Rui Xiao ,  Zhen Rong

IPC: G01N21/65 ,  G01N21/01

CPC classification number: G01N21/65 ,  G01N21/01 ,  G01N2201/021 ,  G01N2201/06113

Abstract: A sample rotating rack and a Raman spectrum detector are provided. The sample rotating rack comprises a rotating body and a plurality of sample carriers provided thereon, distributed around the circumference of the rotating body and able to be irradiated by light rays at the periphery of the rotating body. The Raman spectrum detector comprises a laser, a spectrum analyzer, a Raman probe, a rotating table and a sample rotating rack; the sample rotating rack is arranged on the rotating table, the Raman probe is arranged at the periphery of the sample rotating rack, and the Raman probe is electrically connected to the laser and the spectrum analyzer respectively; and the laser is used for emitting excitation light by means of the Raman probe, and the Raman probe can receive Raman scattered light and return same to the spectrum analyzer.

公开(公告)号：US20230341325A1

公开(公告)日：2023-10-26

申请号：US18043794

申请日：2021-08-16

Applicant: ASML NETHERLANDS B.V.

Inventor： Lars LOETGERING ,  Stefan Michiel MICHIEL ,  Christina Lynn PORTER ,  Petrus Wilhelmus SMORENBURG

IPC: G01N21/47 ,  G01N23/20025 ,  G01N23/2055 ,  G03F7/20 ,  G03F7/00

CPC classification number: G01N21/4788 ,  G01N23/20025 ,  G01N23/2055 ,  G03F7/70625 ,  G03F7/70633 ,  G03F7/70681 ,  G01N2201/021

Abstract: Disclosed is a wavefront sensor for measuring a wavefront of a radiation. The wavefront sensor comprises a mask comprising a pattern located in path of the radiation to interact with the radiation. The radiation impinging on the mask forms a radiation detection pattern on a radiation detector subsequent to the mask, and the pattern of the mask is designed at least partly based on a requirement of the radiation detection pattern.

公开(公告)号：US11798155B2

公开(公告)日：2023-10-24

申请号：US17551535

申请日：2021-12-15

Applicant: Fu Tai Hua Industry (Shenzhen) Co., Ltd.

Inventor： Liu-Bin Hu ,  Wei Yang

IPC: G06T7/00 ,  G01N21/88 ,  H04N23/56

CPC classification number: G06T7/0004 ,  G01N21/8806 ,  G01N21/8851 ,  H04N23/56 ,  G01N2021/8845 ,  G01N2201/021 ,  G06T2207/20081

Abstract: A device to detect defects in a finished surface by analyzing images thereof taken under lighting of different colors includes a supporting mechanism, a transmitting mechanism, a detecting mechanism, and a processor. The transmitting mechanism carries and transmits the product. The detecting mechanism includes a detecting frame, and a light source assembly. The processor connects to a camera assembly, and preprocesses images obtained of the long side surfaces, of the width side surfaces, and of the chamfered side surfaces of the product to detect any defects of these surfaces of the product.

公开(公告)号：US11749546B2

公开(公告)日：2023-09-05

申请号：US17016975

申请日：2020-09-10

Applicant: CANON KABUSHIKI KAISHA

Inventor： Kohei Suzuki ,  Shinichiro Hirai ,  Kenichi Kobayashi

IPC: H01L21/67 ,  G01N21/01 ,  G01N21/47 ,  G01N21/95 ,  H01L21/027 ,  G03F7/00 ,  H01L21/66

CPC classification number: H01L21/67288 ,  G01N21/01 ,  G01N21/47 ,  G01N21/9505 ,  G03F7/0002 ,  H01L21/0271 ,  H01L22/12 ,  G01N2201/021 ,  G01N2201/06113

Abstract: Surface inspection apparatus includes stage for holding substrate, light source, scanning optical system for scanning light from the light source along first direction for plural times, stage scanning mechanism for scanning the stage in second direction intersecting with the first direction, and detector for detect scattered light from the substrate Inspection target region of the substrate is scanned by the light from the light source by an operation of the scanning optical system and the stage scanning mechanism. Chromatic aberration of the scanning optical system is corrected to fall within predetermined wavelength range. Fluctuation range of wavelength of the light from the light source is determined based on variation in total lighting time of the light source in scanning period of each light scanning operation along the first direction. The fluctuation range falls within the predetermined wavelength range.

公开(公告)号：US11740176B2

公开(公告)日：2023-08-29

申请号：US17803029

申请日：2022-01-18

Applicant: J.A. WOOLLAM CO., INC.

Inventor： Stefan Schoeche ,  Craig M. Herzinger ,  Steven E. Green ,  Martin M. Liphardt ,  James D. Welch

IPC: G01N21/21

CPC classification number: G01N21/211 ,  G01N2021/213 ,  G01N2201/021 ,  G01N2201/06113 ,  G01N2201/12

Abstract: An ellipsometer, polarimeter and the like system operating in the infrared spectral range (0.75 μm to 1000 μm), utilizing a tunable quantum cascade laser (QCL) source in combination with dithering capability to reduce speckle and standing wave effects, dual-rotating optical elements, a single-point detector, as well as optional means of reducing the size of the probe beam at the measurement surface and optional chopper for lock-in detection.

公开(公告)号：US20230258557A1

公开(公告)日：2023-08-17

申请号：US18108791

申请日：2023-02-13

Applicant: Shimadzu Corporation

Inventor： Kazumi KAWAHARA

IPC: G01N21/3559 ,  G01N1/31 ,  G01N1/44 ,  G01N1/36

CPC classification number: G01N21/3559 ,  G01N1/312 ,  G01N1/44 ,  G01N1/36 ,  G01N2201/021

Abstract: A holder for drying includes a first member including a first tubular portion that protrudes like a tube and an annular second member that can fix filter paper in a flat state under tension by being fitted over the filter paper to surround an outer side of the first tubular portion while the filter paper is carried on the first tubular portion.