公开(公告)号：PL374284A1

公开(公告)日：2005-10-03

申请号：PL37428402

申请日：2002-12-20

Applicant: ABB INC

Inventor： HAMDAN FADI ADEL

IPC: G01R31/06 ,  G01R31/28 ,  G01R29/20

Abstract: A system and method for creating, editing, and/or executing a test program for testing a transformer is provided. The system includes an input that allows the user to select the desired test instructions and pre-existing sequences of test instructions to create or edit a test program having a sequence of test instructions. The processor executes the test program by generating commands that are performed in a predetermined order.

公开(公告)号：DE69403950T3

公开(公告)日：2005-03-10

申请号：DE69403950

申请日：1994-01-14

Applicant: ABB INC

Inventor： BEITELMAN LEONID ,  MULCAHY JOSEPH A

IPC: B22D11/115 ,  B22D11/10 ,  B22D11/04

公开(公告)号：ES2106501T5

公开(公告)日：2005-03-01

申请号：ES94904542

申请日：1994-01-14

Applicant: ABB INC

Inventor： BEITELMAN LEONID ,  MULCAHY JOSEPH A

IPC: B22D11/115 ,  B22D11/10 ,  B22D11/04

Abstract: UN METODO DE AGITACION DE INDUCCION EN DONDE EL METAL FUNDIDO SE AGITA ELECTROMAGNETICAMENTE DURANTE EL FUNDIDO CONTINUO EN UN MOLDE INCLUYE CONTROL DE DEPRESION CURVA, O PARA DISMINUIR O PARA AUMENTAR LA AGITACION DEL METAL FUNDIDO PRODUCIDO POR EL AGITADOR ELECTROMAGNETICO PRINCIPAL. UN MODIFICADOR DE AGITACION MAGNETICO DE C.A SE COLOCA JUNTO A LA REGION DE LA CURVA PARA PRODUCIR LA AGITACION ELECTROMAGNETICA DEL METAL FUNDIDO EN LA CURVA, O PARA OPONER EL MOVIMIENTO GIRATORIO DEL AGITADOR ELECTROMAGNETICO PRINCIPAL Y PROPORCIONAR UNA SUPERFICIE LIBRE DE TURBULENCIA O PARA AUMENTAR EL MOVIMIENTO GIRATORIO DEL AGITADOR MAGNETICO PRINCIPAL. ESTOS DOS MODOS ALTERNATIVOS DE OPERACION PERMITEN QUE SE UTILICE UNA MAQUINA DE FUNDICION PARA FUNDIR METALES QUE REQUIERAN VARIAR AMPLIAMENTE LAS CONDICIONES DE OPERACION.

公开(公告)号：CA2532462A1

公开(公告)日：2005-02-10

申请号：CA2532462

申请日：2004-07-23

Applicant: ABB INC

Inventor： STURM STEVEN PERRY

IPC: G01N23/16 ,  G01G9/00 ,  G01G17/02

Abstract: Beta gauge composition correction is performed using signals from a plurality of detectors that are positioned so that the ratio of radiation received by the detectors depends on the composition of material through which the radiation passes before reaching the detectors. Radiation is measured at the detectors and the differences between radiation received by the detectors is used to compensate the beta gauge to correct for composition variations. An array of detectors is divided into inner detectors generally aligned with the central portion of a beta radiation beam and at least one set of outer detectors surrounding, at least in part, the inner detectors. Measurements are made including all the detectors, the inner detectors and the at least one set of outer detectors with the difference between the measurements made by the inner detectors and the outer detectors being used to compensate the total measurement made by all the detectors.

公开(公告)号：CA2528880A1

公开(公告)日：2005-01-06

申请号：CA2528880

申请日：2004-06-21

Applicant: ABB INC

Inventor： RAFFERTY BERNARD

IPC: B04B1/20 ,  B04B1/00 ,  B04B15/02 ,  F01M1/02 ,  F16N7/38 ,  F16N29/02

Abstract: A control system for a centrifuge that allows the centrifuge to continue to run when there is a short duration failure or outage of the AC power source. The control system allows the centrifuge to be brought to a stop in a normal shutdown mode where there are longer duration failures or outages of the AC power source. This allows power to be maintained to the pump that lubricates the centrifuge bearings so that the bearings are lubricated during the coast down of the centrifuge and the differential speed of the centrifuge to be controlled during coast down allowing the centrifuge bowl to be cleared of solids so that the centrifuge can be immediately started up at lower vibrati on levels once power is restored.

公开(公告)号：GB2369496B

公开(公告)日：2004-10-20

申请号：GB0205371

申请日：2001-07-11

Applicant: ABB POWER T & D CO ,  ABB INC

Inventor： MEYER JEFFRY R

IPC: H01H33/02 ,  H02B13/045 ,  H01H33/53

公开(公告)号：ES2212117T3

公开(公告)日：2004-07-16

申请号：ES97932163

申请日：1997-06-11

Applicant: ABB INC

Inventor： OOMMEN THOTTATHIL V ,  CLAIBORNE C CLAIR

IPC: C11C3/00 ,  H01B3/20

公开(公告)号：PT912981E

公开(公告)日：2004-04-30

申请号：PT97932163

申请日：1997-06-11

Applicant: ABB INC

Inventor： OOMMEN THOTTATHIL V ,  CLAIBORNE C CLAIR

IPC: C11C3/00 ,  H01B3/20

公开(公告)号：DE10291282T5

公开(公告)日：2004-04-29

申请号：DE10291282

申请日：2001-05-21

Applicant: ABB INC N D GES D STAATES DELA

Inventor： BOOK WILLIAM J ,  REINKE DAVID A

IPC: H01H9/00 ,  H01H33/66 ,  H01H33/02 ,  H01H33/06 ,  H01H33/14

公开(公告)号：CA2499396A1

公开(公告)日：2004-04-15

申请号：CA2499396

申请日：2003-10-02

Applicant: ABB INC

Inventor： DAUGHERTY DENNIS CHARLES ,  STURM STEVEN PERRY ,  MAXSON RODNEY DALE ,  DOMIN THOMAS MICHAEL ,  BURK GARY NEIL

IPC: G01N21/35 ,  G01N21/86 ,  G01N21/89 ,  G01N33/34 ,  G02B26/04 ,  G01N21/27 ,  G02B6/04

Abstract: A single vane (46, 48) shutter flag (38) is asynchronously controlled (82) s o that a measuring system light source (22) is interrupted for a minimum necessary amount of time for standardization/calibration and normalization o f InGaAs system detectors (68a - 68d). Source/detector hemispheres (50, 62) or serially connected randomly oriented fiber bundles (132) homogenize light passing to the detectors. Light source testing is performed by measuring spectral power distributions at a plurality of light source power levels and comparing the measurements to baseline characteristics established for the light source. Calibration sample life is extended indefinitely by controllin g the shutter flag to block source light except for short calibration time periods during which standard light levels are provided.