Abstract:
An image sensor arranged inside and on top of a semiconductor substrate, having a plurality of pixels, each including: a photosensitive area, a read area, and a storage area extending between the photosensitive area and the read area; at least one first insulated vertical electrode extending in the substrate between the photosensitive area and the storage area; and at least one second insulated vertical electrode extending in the substrate between the storage area and the read area.
Abstract:
A pixel circuit including: a differential detection circuit having first and second transistors coupled in series between differential output nodes of an antenna, the antenna being configured to be sensitive to terahertz radiation, and wherein: a first main conducting node of the first transistor is coupled to a first of the differential output nodes of the antenna; and a first main conducting node of the second transistor is coupled to a second of said differential output nodes of the antenna, wherein second main conducting nodes of the first and second transistors are formed by a common semiconductor region.
Abstract:
A duty cycle protection circuit including a first synchronous device adapted to receive a first clock signal on an input line and to generate a first clock transition of a second clock signal in response to a first clock transition of the first clock signal; and reset circuitry coupled to the input line and adapted to generate a second clock transition of the second clock signal by resetting the first synchronous device a time delay after the first clock transition of the first clock signal.
Abstract:
A nanoprojector panel formed of an array of cells, each cell including a liquid crystal layer between upper and lower transparent electrodes, a MOS control transistor being arranged above the upper electrode, each transistor being covered with at least three metallization levels. The transistor of each cell extends in a corner of the cell so that the transistors of an assembly of four adjacent cells are arranged in a central region of the assembly. The upper metallization level extends above the transistors of each the assembly of four adjacent cells. The panel includes, for each assembly of four adjacent cells, a first conductive ring surrounding the transistors, the first ring extending from the lower metallization level to the upper electrode of each cell, with an interposed insulating material.
Abstract:
A variable capacitance device including: first and second transistors coupled in series by their main current nodes between first and second nodes of the device, a control node of the first transistor being adapted to receive a first control signal, and a control node of the second transistor being adapted to receive a second control signal; and control circuitry adapted to generate the first and second control signals from a selection signal.
Abstract:
The invention concerns a scanning circuit, comprising a power supply providing a negative voltage on a first terminal (Tdown), an intermediate voltage on a second terminal (Gnd) and a positive voltage on a terminal of a switch (S), the other terminal of the switch being connected to a third terminal (Tup), a control circuit (6) supplied by connections to the second and third terminals, a differential amplifier receiving a positive and a negative input signal provided by the control circuit, a power amplifier controlled by the differential amplifier, both amplifiers being supplied by connections to the first and third terminals, a deflection coil (Ly) connected between the output of the power amplifier and the second terminal, biasing means setting, when the switch is open, the output of the differential amplifier so that the possible current paths through the power amplifier between the deflection coil and the first terminal are cut.
Abstract:
A CAM cell with masking made in the form of an integrated circuit, including a first storage cell including a first transistor, first and second inverters in anti-parallel, and a second transistor; a comparison cell, including third and fourth transistors controlling a fifth transistor, connected in series with a sixth inhibiting transistor to a result line; and a second storage cell, including a seventh transistor in series with two inverters in anti-parallel and an eighth transistor, the second storage cell controlling the inhibiting transistor. The first, second, seventh, and eighth transistors may be N-channel transistors, and the third, fourth, fifth, and sixth transistors may be P-channel transistors.
Abstract:
The content of a few pages of the dynamic random access memory is backed up, then one tries to refresh them less quickly, for example two times less quickly, and one observes whether this does or does not cause errors. The operation is repeated on the entire memory. Depending on the number of errors that have appeared on the pages refreshed less often, the refresh period is decreased or increased. Thus, the memory self-adjusts its refresh period to what is necessary for it.
Abstract:
A method of repairing a defect in an integrated electronic circuit caused by an incorrect lithographic mask includes the formation of an electrical isolation between two conducting parts of the circuit. The electrical isolation is obtained by at least partly filling, with an electrically insulating material, a volume hollowed out beforehand which would otherwise, and incorrectly, form an electrical connection between the two conducting parts. To do this, a mask having an aperture revealing the hollowed out volume is formed on the circuit, and the mask used to direct the filling of the electrically insulating material and correction of the lithography defined defect.
Abstract:
The present invention relates to a method for controlling and for refreshing memory cells in an electrically erasable and programmable memory comprising a memory array organized in sectors, each sector comprising memory cells linked to bit lines and to word lines. The method comprises controlling and refreshing memory cells of pages of the memory array the address of which is indicated by a control and refresh counter comprising data forming tokens usable once. According to the present invention, a control and refresh counter is integrated into each sector of the memory and comprises memory cells linked to the bit lines of the sector. A counter of a sector is erased after reaching a maximum counting value that is chosen so that, when this maximum counting value is reached, memory cells of the counter have undergone a number of electrical stress cycles that is at the most equal to a determined number. Application to Flash memories.