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公开(公告)号：KR1019920005015B1
公开(公告)日：1992-06-22
申请号：KR1019890019582
申请日：1989-12-27
IPC: H04M3/22
Abstract: The data expanding circuit expands 8-bit data bus into 16-bit data bus which is applied to a circuit for interfacing a test bus distributing circuit and a TDX-10 test controller. The circuit includes a count enable circuit comprising an And gae for receiving address enable signal and strobe signal transmitted from a controller. D flip-flops (U1,U2) and AND gates (A2,A3), and multiple monostable circuit (12,13) comprising hexa decimal counter (U3,U5), 3/8 decoder (U4,U5), and an AND gate (A4) for transmitting data signal as acknowledge signal to the strobe signal and ready signal.
Abstract translation: 数据扩展电路将8位数据总线扩展为16位数据总线，该数据总线应用于连接测试总线分配电路和TDX-10测试控制器的电路。 该电路包括一个计数使能电路，该电路包括一个用于接收地址使能信号和一个从控制器发送的选通信号的数据。 D触发器（U1，U2）和与门（A2，A3）以及包含六进制计数器（U3，U5），3/8解码器（U4，U5）的多个单稳态电路（12,13） 门（A4），用于将数据信号作为确认信号发送到选通信号和就绪信号。
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公开(公告)号：KR1019920005013B1
公开(公告)日：1992-06-22
申请号：KR1019890019580
申请日：1989-12-27
IPC: H04M3/22
Abstract: The apparatus includes a (16x4)x2 relay matrix group (15) having a relay driver. A relay matrix column decoder means (14) and a relay matrix row decoder means (17) are connected to the relay matrix group (15), and data buffer means (13,16) are connected to the relay matrix decoder means (14,17) respectively. A delay and control signal generating means (12) is connected to both of the data buffer means (13,16), and an address decoder means (11) is connected to the delay and control signal generating means (12). With the apparatus, a subscriber line to be tested can be automatically connected to the testing equipment, and a manual testing mode is also provided.
Abstract translation: 该装置包括具有继电器驱动器的（16×4）×2中继矩阵组（15）。 中继矩阵列解码器装置（14）和中继矩阵行解码器装置（17）连接到中继矩阵组（15），数据缓冲装置（13,16）连接到中继矩阵解码装置（14， 17）。 延迟和控制信号发生装置（12）连接到数据缓冲装置（13,16），地址解码装置（11）连接到延迟和控制信号产生装置（12）。 使用该装置，待测试的用户线路可以自动连接到测试设备，并且还提供手动测试模式。
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公开(公告)号：KR1019920000139B1
公开(公告)日：1992-01-09
申请号：KR1019880017362
申请日：1988-12-23
IPC: H04M3/22
Abstract: setting initial threshold value; judging whether a change of the threshold value is required, or a test is required; performing test operations in accordance with the requirement of the preceding step; arranging the environment for carrying out the operation of the preceding step; making a checking unit (15) check the state of a subscriber line, and informing the checked result to a control board 12 upon carrying out the operation at the preceding step; and comparing the checked results with reference values, judging as to the existence of a disorder in the line, and informing the judged result to a maintenence processor 11.
Abstract translation: 设定初始阈值; 判断是否需要改变阈值，或者进行测试; 按照上述步骤的要求进行测试操作; 安排执行上述步骤的操作的环境; 使检查单元（15）检查用户线路的状态，并且在执行前一步骤的操作时将检查结果通知给控制板12; 并且将检查结果与参考值进行比较，判断该行中存在无序，并将判断结果通知给维护处理器11。
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Patent Agency Ranking
公开(公告)号：KR1019910007807B1
公开(公告)日：1991-10-02
申请号：KR1019880017978
申请日：1988-12-30
Abstract: The lens used for producing the semiconductor element, enables it to change the lens factors such as clearance, thickness, radius of the electrode, and to improve the focusing characteristics of lens without rebuilding of the whole electrode structure. The equipotential electrostatic lens composed of three electrodes, has the first electrode (100) with insert electrode (110), second electrode (200) with the insert electrode (210), and third electrode (300) with the insert electrode (310). An insert electrode is composed of the plate type electrode (7) laminated with two more plies. The lens suppresses increasing of the excessive voltage according to increasing of ion-beam energy, reduces the danger from electric discharge, and stabilizes the lenses.
Abstract translation: 用于制造半导体元件的透镜使得能够改变诸如间隙，厚度，电极的半径的透镜因子，并且可以改善透镜的聚焦特性，而不会重建整个电极结构。 由三个电极构成的等电位静电透镜具有带有插入电极（110）的第一电极（100），具有插入电极（210）的第二电极（200）和具有插入电极（310）的第三电极（300）。 插入电极由层叠有两层的板状电极（7）组成。 透镜根据离子束能量的增加抑制过大电压的增加，减少放电的危险，并稳定透镜。
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公开(公告)号：KR1019910007806B1
公开(公告)日：1991-10-02
申请号：KR1019880017980
申请日：1988-12-30
IPC: H01J37/12
Abstract: The equipotential einzel lens composed of three electrodes, is used for focusing the charged particles such as electron or ion. The lens comprises upper projection (8) on third electrode (3), for removing the line of sight (12) to lower insulating material (5); connecting position, between third electrode (3) and lower insulating material (5), being lower than the center position, which suppresses charge-up of lower insulating material (5) generated by second electron or ion, and prevents the breakdown of insulating material.
Abstract translation: 由三个电极组成的等电位透镜透镜用于聚焦电子或离子等带电粒子。 透镜包括在第三电极（3）上的上凸起（8），用于去除视线（12）以降低绝缘材料（5）; 第三电极（3）和下绝缘材料（5）之间的连接位置低于中心位置，这抑制了由第二电子或离子产生的下部绝缘材料（5）的充电，并且防止了绝缘材料的击穿 。
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公开(公告)号：KR1019910007805B1
公开(公告)日：1991-10-02
申请号：KR1019880017977
申请日：1988-12-30
IPC: H01J37/10
Abstract: The instrument for the ion beam systedm applied to the semiconductor manufacturing, improves the system performance through improving the alignment accuracy in the system and minimizing spherical aberration for electrostatic lens. The instrument comprises a vacuum chamber (105), ion source (101), accelerator (102), and electrostatic lens (103). The whole system is composed of an ion source module assembled with ion source (101) , source holder (108), disk (109) for fixing the source (101), ion extraction electrode (107); an accelerator module assembled with first and second electrodes (111)(112), insert ring (114) for adjusting distance between electrodes; an ion-beam feed tube module with ion-beam feed tube (115) with air hole (115a); process chamber (106) for positioning wafer (104).
Abstract translation: 用于离子束系统的仪器适用于半导体制造，通过提高系统中的对准精度并使静电透镜的球面像差最小化来提高系统性能。 仪器包括真空室（105），离子源（101），加速器（102）和静电透镜（103）。 整个系统由离子源（101），源保持器（108），用于固定源（101）的盘（109），离子提取电极（107））组装的离子源模块组成。 与第一和第二电极（111）（112），用于调节电极之间的距离的插入环（114）组装的加速器模块; 具有带有空气孔（115a）的离子束供给管（115）的离子束供给管模块; 处理室（106），用于定位晶片（104）。
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公开(公告)号：KR1019910005334B1
公开(公告)日：1991-07-25
申请号：KR1019880017357
申请日：1988-12-23
IPC: H04M3/22
Abstract: The circuit checks the fault state of the line, terminal and circuit of the subscriber, and the analog relay line. It also checks whether the line is in use or not and provides the test tone to find out the fault position. It comprises an interface (10) interfacing between the subscriber and the exchange system, a test control unit (21), a testing circuit (22), a time switch (30), a microprocessor (40) being higher than the test control unit, and an operator station (50). The interface is connected to a test bus (A) for the subscriber line and a test bus (B) for the subscriber circuit.
Abstract translation: 该电路检查用户的线路，终端和电路以及模拟继电器线路的故障状态。 它还检查线路是否在使用中，并提供测试音以找出故障位置。 它包括在用户和交换系统之间接口的接口（10），测试控制单元（21），测试电路（22），时间开关（30），比测试控制单元高的微处理器（40） 和操作员站（50）。 接口连接到用户线的测试总线（A）和用户电路的测试总线（B）。
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