Abstract:
PROBLEM TO BE SOLVED: To provide a radiation sensitive resin composition having sensitivity to active light rays such as far-ultraviolet light represented by an ArF excimer laser, for example, superior in the flatness of a pattern surface without impairing fundamental material properties such as transparency to radiation, sensitivity, a resolution, and a pattern shape, and useful as a chemical amplification type resist which is improved against pattern collapse on a substrate. SOLUTION: The radiation sensitive resin composition includes: (A) an alkali-insoluble or alkali-hardly-soluble resin in which solubility in alkaline aqueous solution is increased by the action of an acid; (B) radiation sensitive acid generator; and (C) a compound represented by a general formula (1) where R 1 and R 2 are a hydrogen atom, a hydroxyl group, an (thio)alkoxyl group or the like, R 3 is a hydrogen atom or a monovalent acid-dissociative group, and n is 0 or 1. COPYRIGHT: (C)2010,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a positive radiation-sensitive resin composition excellent in depth-of-focus latitude (DOF) as a positive radiation-sensitive resin composition using an ArF light source, and suitable for use as a chemically amplified positive resist excellent also in sensitivity, developability and dimensional faithfulness. SOLUTION: The positive radiation-sensitive resin composition contains a resin (A) containing a repeating unit represented by formula [1] and having a weight average molecular weight (expressed in terms of polystyrene) of 1,000-100,000 by gel permeation chromatography (GPC) and a radiation-sensitive acid generator (B), wherein R 1 is hydrogen atom, methyl group, ethyl group or a 1-4C perfluoroalkyl group; one of R 2 and R 3 is RfSO 2 NHCH 2 -group(where Rf represents a 1-4C perfluoroalkyl group) and the remainder is hydrogen atom. The positive radiation-sensitive resin composition preferably contains an acid diffusion control agent (C) in combination with the resin (A) and the radiation-sensitive acid generator (B). COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a resin composition capable of forming a coating film on a photo resist without causing intermixing with the photo resist film, wherein the coating film can be kept stable without dissolving into a medium upon exposure to a light under liquid-impregnation, and it is possible to produce a top-coating film having a large contact angle such as 70°or more for the liquid-impregnation medium and showing high solubility in an alkaline developing liquid without degradation in a pattern form in a case where a dry exposure to a light is conducted in place of liquid-impregnation exposure to a light. SOLUTION: A copolymer for forming a top-coating film to be applied on a photo resist film exposed to a light under liquid-impregnation contains a repeating unit containing a carboxylic group in an amount of 20-60 mol% relative to the total repeating unit, has a weight average molecular weight of 2,000-100,000 as measured by the gel permeation chromatography method, and can be produced by the copolymerization of a (meth)acrylic acid ester containing a side chain having a fluorine atom and further by the copolymerization of a (meth)acrylic acid alkyl ester containing a hydroxy group. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a radiation-sensitive resin composition, containing a dissociable group-containing polysiloxane as a resin component and suitable for use as a chemically amplified resist, particularly superior in resolution. SOLUTION: The radiation-sensitive resin composition contains (A) the dissociable group-containing polysiloxane and (B) a radiation-sensitive acid generator, containing as essential components, a compound (B1) capable of generating an acid represented by Formula (I) and a compound (B2) capable of generating other sulfonic acid or a carboxylic acid. In the Formula (I), four symbols Rf each independently denote F or a trifluoromethyl group; Ra denotes a 3-20C cyclic monovalent hydrocarbon group or a 3-20C cyclic monovalent fluorinated hydrocarbon group, and the cyclic monovalent hydrocarbon group and the cyclic monovalent fluorinated hydrocarbon group may be substituted. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a radiation-sensitive composition which forms a crosslinked structure upon exposure to radiation, is degraded to low molecular weight by heating at a relatively low temperature after crosslinking, can easily be removed without damaging a substrate, has a high stationary wave preventing effect, does not cause intermixing with a resist film, and is useful to form a hard mask capable of forming a resist pattern excellent in resolution, pattern profile, etc. SOLUTION: The radiation-sensitive composition comprises (A) a copolymer typified by a copolymer having a repeating unit represented by formula (1-1) and a repeating unit represented by formula (2-1), (B) a radiation-sensitive acid generator and (C) a solvent. In the formula (1-1), R 5 denotes hydrogen atom or methyl group. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a radiation sensitive resin composition having high transparency at a wavelength of ≤193 nm and useful as a chemically amplified resist excellent particularly in sensitivity, DOF and LER. SOLUTION: The radiation-sensitive resin composition contains (A) a siloxane resin having a weight average molecular weight of 500-1,000, in terms of polystyrene, by gel permeation chromatography, (B) a compound having a repeating structure represented by formula (4), and (C) a photoacid generator. In the formula (4), each R 1 is H or a group represented by formula (4-1) and at least one of the symbols R 1 is a group represented by the formula (4-1). COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a process for applying a vinyl-based naphthalenecarboxylic acid (derivative) and a vinyl-based naphthalenemethanol, with which technical idea or technical concept reaching application to an antireflection film having extremely excellent properties is created. SOLUTION: The process for applying a naphthalene derivative comprises using a polymer obtained by polymerizing the naphthalene derivative represented by formula (1) or formula (5) (R 1 , R 2 and R 3 are each independently a hydrogen atom or a 1-10C monofunctional organic group) as a main component for an antireflection film. COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To obtain a new polysiloxane that is suitable as a resin component in chemically amplified resist particularly having excellent I-D bias and depth of focus (DOF), a new silane compound useful as a raw material for producing the polysiloxane, and a polysiloxane-containing radiation ray-sensitive resin composition. SOLUTION: The silane compound is represented by formula (I). The polysiloxane has a structural unit represented by formula (1) or has the unit (1) and a structural unit represented by formula (2) (wherein R is an alkyl, R 1 and R 2 are each fluorine atom, or a lower alkyl or a lower fluorinated alkyl, (n) and (m) are each 0 or 1, (k) is 1 or 2, (i) is an integer of 0 to 10). The radiation ray-sensitive resin composition contains the polysiloxane and a radiation ray sensitive acid-generating agent. COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a norbornane-based fluorine-containing compound providing a chemical amplification-type resist having excellent smoothness of the pattern surface and preventing the falling down of a pattern on a substrate without damaging the basic properties such as transparency to radiation, sensitivity, resolution and a pattern shape as an additive component of the chemical amplification-type resist sensitive to far ultraviolet rays or the like exemplified by ArF excimer laser; and to provide a radiation-sensitive resin composition containing the compound. SOLUTION: The compound is represented by general formula (1) (wherein, R 1 and R 2 are each a hydrogen atom, a hydroxy group, a (thio)alkoxy group or the like; R 3 is a hydrogen atom or a monovalent acid-dissociating group; and m is 0 or 1). The radiation-sensitive resin composition contains (A) an alkali-insoluble or alkali-slightly soluble resin increasing the solubility in an aqueous alkali solution by the action of an acid, and (B) a radiation sensitive acid-generating agent besides the compound. COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide an antireflection film forming composition which has a high antireflection effect, does not cause intermixing, and can form a resist pattern excellent in resolution, pattern shape, etc.; and a polymer useful as a constituting component for the composition. SOLUTION: The polymer comprises first structural units represented by formula (1) and second structural units having cross-linking properties. In formula (1), R 1 and R 2 are each a monovalent atom or a monovalent organic group; R 3 and R 4 are each a hydrogen atom or a monovalent organic group; and m and n are each an integer of 0 or 1-3. COPYRIGHT: (C)2005,JPO&NCIPI