Abstract:
An interference measurement system self-alignment method, which can be realized through an optical image interference measurement system. The method comprises the following steps of: utilizing the imaging device to get the optical information of the object to be measured and store the optical information thus obtained; performing the inclination adjustment of the first direction rotation axis of the object platform based on the direction of the interference fringe in the optical information until the interference fringes are adjusted to a defined orthogonal direction, thus eliminating the inclination of the first direction rotation axis; and performing the inclination adjustment of the second direction rotation axis of the object platform based on the expansion direction of the interference fringe in the optical information until the spacing of the interference fringes are adjusted to the maximum, thus eliminating the inclination of the second direction rotation axis.
Abstract:
The invention disclosed a method and circuit for conducting an AC offset current compensation and a testing device using the same, capable of providing a high voltage measurement that fulfils a voltage resistance condition of safety regulation, so that it is possible to achieve the requirement of increasing the test accuracy on voltage resistance by controlling the magnitude, phase and offset current compensation of the voltage output.
Abstract:
The invention disclosed a trace following powered amplifier mainly used in solving the problem of circuit overheating caused by long test time, especially to an amplifier applicable to a low frequency and low distortion test apparatus such as a capacitor ripple current tester. The amplifier of present invention can make the most efficient use of electrical energy by incorporating a low frequency voltage peak value of an amplifier signal plus an estimated tolerance.
Abstract:
A chassis for interface card modules includes a housing and a pair of parallel first rails disposed within the housing. A second rail is disposed between and in parallel to the first rails. A plurality of card guides are mounted detachably on the first and second rails. The second rail includes a main rail section and an extension rail section which are interconnected releaseably by a fastening unit. A partition plate has two opposite ends connected respectively and detachably to the first rails. The extension rail section is connected detachably to the partition plate. The partition plate is changeable in position on the first rails. The total length of the second rail is changeable due to the presence of the extension rail section.
Abstract:
The present invention relates to an electronic device testing apparatus and a testing method thereof. When the test is completed, a pressing head picks up a tested electronic device from a test socket and places the tested electronic device on an output carrier, the output carrier moves out of a test zone, and an input carrier follows immediately after the output carrier and successively moves into the test zone at the same speed; after the pressing head picks up an electronic device to be tested from the input carrier, the input carrier moves out of the test zone, and the pressing head places the electronic device to be tested in the test socket. Accordingly, in the present invention, the operation of the pressing head is simplified, and the overall test efficiency is improved.
Abstract:
A pre-interception device includes an input portion for a fluid to flow in, an output portion for the fluid to flow out, a plurality of diversion flow channels and a plurality of interception portions. Each diversion flow channel is in communication with the output portion and the input portion, is configured to provide turning guidance for flow of the fluid, and has a fluid lift section. The interception portions are configured to form a turbulent flow field in the fluid. The turbulent flow field can have foreign objects flowing through the diversion flow channel be captured. Accordingly, a filtering effect is achieved based on physical properties of the foreign objects. When the pre-interception device is additionally combined with a filter net to form a filtering system, the burden on the filter net is further alleviated, hence extending a service life of the filter net and reducing costs.
Abstract:
A full-open and full-angle stall device for a motor test system is disclosed. The stall device is used to provide a stall function to a motor under test and includes a base, a driving source connection module and a brake module. The driving source connection module includes a coupling and a first disc and a second disc that are detachably joined together. The first disc and the second disc are fixed on the coupling. The coupling is defined with a mounting hole for connecting a transmission shaft so as to receive a driving source from the motor under test. The brake module is disposed on the base and is configured at an edge of the driving source connection module, and is controlled to generate a clamping force on the driving source connection module, wherein the clamping force is selectively applied to any edge of the first disc and the second disc so as to brake the driving source connection module.
Abstract:
The present invention relates to a pitch-variable battery fixture and a battery cell formation apparatus having the same. A pitch of clamping plates of a plurality of clamping blocks is increased by a slide actuator of the pitch-variable battery fixture, and then the clamping plates are inserted into a plurality of compartments of a battery tray. The clamping plates are urged to clamp batteries by the slide actuator. The battery tray is provided for placement of the batteries, and a compressing force is exerted for shaping the batteries during a battery cell formation. The pitch-variable battery fixture is provided for clamping batteries having different thicknesses. According to the actual thickness of each battery, the thickness of the formed battery can be shaped.
Abstract:
Herein disclosed is a test head connection method, the method comprises the following steps. First, a load board and a card holder are provided between a test head and a probing machine, the card holder is disposed in the probing machine, and the card holder is used to accommodate the load board. A vacuum function of the test head is activated, and the test head is moved to align the card holder. The test head is moved to touch the load board in the card holder. At least one clamping piece is used to fix the test head and the card holder. Wherein the load board and a wafer are connected by direct probing.