公开(公告)号：US20240027366A1

公开(公告)日：2024-01-25

申请号：US17621237

申请日：2021-11-25

Applicant: Wuhan China Star Optoelectronics Semiconductor Display Technology Co., Ltd.

Inventor： Yali LIU ,  Yongzhen JIA

IPC: G01N21/95 ,  G01N21/88

CPC classification number: G01N21/9515 ,  G01N21/8851 ,  G01N2201/063 ,  G01N2021/8887 ,  G01N2021/9513

Abstract: The present application provides a detection method of a crease degree of a screen and a visual detection device, the detection method includes: providing detection rays and obliquely irradiating the detection rays onto a surface to be measured of a folding screen; acquiring detection rays reflected by the surface to be measured of the folding screen to obtain a corresponding light source reflection image; analyzing the light source reflection image to obtain an evaluation index of an crease degree of the folding screen; and evaluating the crease degree of the folding screen.

公开(公告)号：US11861966B2

公开(公告)日：2024-01-02

申请号：US17446790

申请日：2021-09-02

Applicant: WAVEFRONT TECHNOLOGY, INC.

Inventor： Christopher Chapman Rich ,  Joel Mikael Petersen ,  Roger Winston Phillips ,  John Michael Tamkin

IPC: G07D7/128 ,  G01N21/47 ,  G02B3/00 ,  G02B5/02 ,  B42D25/351 ,  B42D25/373 ,  B42D25/378 ,  B42D25/355 ,  B42D25/45 ,  B42D25/29 ,  G01N21/55 ,  B42D25/425 ,  B42D25/445 ,  B42D25/00 ,  B42D25/342 ,  B42D25/324 ,  B42D25/30 ,  B42D25/21 ,  B42D25/435 ,  B42D25/328 ,  B42D25/24 ,  B42D25/23 ,  B42D25/28

CPC classification number: G07D7/128 ,  B42D25/00 ,  B42D25/21 ,  B42D25/29 ,  B42D25/30 ,  B42D25/324 ,  B42D25/342 ,  B42D25/351 ,  B42D25/355 ,  B42D25/373 ,  B42D25/378 ,  B42D25/425 ,  B42D25/435 ,  B42D25/445 ,  B42D25/45 ,  G01N21/4738 ,  G01N21/55 ,  G02B3/005 ,  G02B3/0056 ,  G02B5/0278 ,  G02B5/0284 ,  B42D25/23 ,  B42D25/24 ,  B42D25/28 ,  B42D25/328 ,  G01N2201/063

Abstract: An optical device includes an array of lenses and a plurality of first and second segments disposed under the array of lenses. At a first viewing angle, the array of lenses presents a first image for viewing without presenting the second image for viewing, and at a second viewing angle different from the first viewing angle, the array of lenses presents for viewing the second image without presenting the first image for viewing. In some examples, individual ones of the first and second segments can comprise specular reflecting, transparent, diffusely reflecting, and/or diffusely transmissive features. In some examples, individual ones of the first and second segments can comprise transparent and non-transparent regions. Some examples can incorporate more than one region producing an optical effect.

公开(公告)号：US11796783B2

公开(公告)日：2023-10-24

申请号：US17506040

申请日：2021-10-20

Applicant: Applied Materials Israel Ltd.

Inventor： Elad Eizner ,  Amir Shoham

IPC: G02B21/06 ,  G02B5/30 ,  G01N21/47 ,  G01N21/95

CPC classification number: G02B21/06 ,  G01N21/47 ,  G01N21/9501 ,  G02B5/3025 ,  G01N2201/063

Abstract: An optical inspection system that may include an illumination optics configured to generate an illumination light beam and to illuminate a sample with the illumination light beam; at least one collection optics configured to collect light from the sample; at least one detector configured to detect at least one detected light beam outputted from the at least one collection optics; multiple polarizers that are configured to (a) set a polarization of the illumination light beam by selectively introducing, under a control of the control unit, at least one illumination optics polarization change, and (b) set a polarization of the at least one detected light beam by selectively introducing, under a control of the control unit, at least one collection optics polarization change. The multiple polarizers may include one or more illumination half-wave plates, one or more quarter-wave plates, and one or more inhomogeneous polarizers.

公开(公告)号：US11692947B2

公开(公告)日：2023-07-04

申请号：US17378049

申请日：2021-07-16

Applicant: Fasford Technology Co., Ltd.

Inventor： Yuta Ono ,  Hideharu Kobashi ,  Koji Hosaka ,  Masaaki Yoshiyama

IPC: G01N21/95 ,  G01N21/88 ,  G06T7/00

CPC classification number: G01N21/9505 ,  G01N21/8806 ,  G06T7/0002 ,  G01N2021/8825 ,  G01N2201/063

Abstract: A die bonding apparatus includes a first illumination device for irradiating a die with light along an optical axis of a photographing device, and a second illumination device that is located above the first illumination device and irradiates the die with light having a predefined angle with respect to the optical axis. The second illumination device includes a second light emitting section, and a light path control member that limits a light path of second irradiation light emitted from the second light emitting section. The second illumination device is disposed in such a way that the second irradiation light, the light path of which is limited by the light path control member, passes through the cylinder of the first illumination device, and the top surface of the die is irradiated with the second irradiation light.

公开(公告)号：US11644420B2

公开(公告)日：2023-05-09

申请号：US17077273

申请日：2020-10-22

Applicant: Ford Global Technologies, LLC

Inventor： Avrokin Surnilla ,  David Michael Herman ,  John Craig Elson ,  Scott Andrew Amman ,  Nikhitha Bekkanti ,  Michael Monforton

IPC: G01N21/55 ,  B60R11/04 ,  B60R16/037 ,  B60R11/00 ,  G06N20/00

CPC classification number: G01N21/55 ,  B60R11/04 ,  B60R16/037 ,  G06N20/00 ,  B60R2011/0003 ,  G01N2201/063

Abstract: A system, comprising a processor and a memory. The memory stores instructions executable by the processor to determine, from an image including a portion of a surface of a human body, a reflected light intensity from the body surface portion, determine, a skin reflectance of the body surface portion based on a location of the body surface, a light source, and an image sensor location, and to determine, for the body surface portion, an incoming radiance, based on the skin reflectance and the reflected light intensity.

公开(公告)号：US20190212536A1

公开(公告)日：2019-07-11

申请号：US16325733

申请日：2017-08-16

Applicant: LEICA MICROSYSTEMS CMS GMBH

Inventor： Florian Fahrbach

IPC: G02B21/00 ,  G01N21/64

CPC classification number: G02B21/0032 ,  G01N21/6458 ,  G01N2021/6463 ,  G01N2201/063 ,  G02B21/0076 ,  G02B21/367

Abstract: A light sheet microscope includes an illuminator having a beam source which is designed to direct an illumination beam propagating along an illumination axis onto a sample. A light-sheet generator is designed to generate a light-sheet-like illumination light distribution illuminating the sample in a partial area from the illumination beam. A detection unit has a detector which is designed to capture detection light originating from the partial area of the sample illuminated with the illumination light distribution. The illuminator comprises a beam modulator adapted to illuminate the illumination beam along the illumination axis in such a way that light exposure of the partial area of the sample illuminated by the illumination light distribution varies along the illumination axis.

公开(公告)号：US10054551B2

公开(公告)日：2018-08-21

申请号：US15134278

申请日：2016-04-20

Applicant: APPLIED MATERIALS ISRAEL LTD.

Inventor： Boris Golberg ,  Ron Naftali

IPC: G01N21/88

CPC classification number: G01N21/8851 ,  G01N2201/063 ,  G01N2201/105

Abstract: An inspection system that may include an illumination module that may be configured to scan a sample during multiple scan iterations; wherein during each scan iteration the illumination module scans each beam of a plurality of spaced apart beams along a scan line; a mechanical stage that may be configured to move the sample during the multiple scan iterations; a detection module; and a processor; wherein when the inspection system operates in an interlaced mode, the mechanical stage may be configured to move at a first speed thereby preventing a substantial overlap between scan lines obtained during the multiple scan iterations; wherein when the inspection system operates in a non-interlaced mode: the mechanical stage may be configured to move at a second speed that differs from the first speed thereby introducing an overlap between scan lines of different beams that may be obtained during different scan iterations; the detection module may be configured to generate detection signals in response to a detection of radiation emitted from the sample as a result of each scan line; and wherein the processor may be configured to independently process detection signals relating to different scan lines.

公开(公告)号：US09897537B2

公开(公告)日：2018-02-20

申请号：US14949284

申请日：2015-11-23

Applicant: International Business Machines Corporation

Inventor： Tymon Barwicz ,  William M. Green ,  Yves C. Martin ,  Jason S. Orcutt ,  Lionel Tombez

IPC: G01N21/00 ,  G01N21/39 ,  G01N21/3504 ,  G01J3/42 ,  G01N21/552 ,  G01J3/02 ,  G02B6/12 ,  G02B6/122

CPC classification number: G01N21/39 ,  G01J3/0218 ,  G01J3/0256 ,  G01J3/42 ,  G01J2003/423 ,  G01N21/3504 ,  G01N21/552 ,  G01N2021/399 ,  G01N2201/06113 ,  G01N2201/063 ,  G01N2201/08 ,  G02B6/12004 ,  G02B6/12007 ,  G02B6/122 ,  G02B2006/12138 ,  G02B2006/1215

Abstract: A method of fabricating a gas sensor on a substrate and a gas sensor fabricated on a substrate that includes optical and electronic components are described. The method includes fabricating a laser to output light over a range of wavelengths within a waveguide, fabricating a splitter to split the light output by the laser to a reference waveguide and to a detection waveguide, fabricating a reference cell to house the reference waveguide and a reference gas. An output of the reference waveguide is coupled to a first optical detector and an output of the detection waveguide is coupled to a second optical detector to identify or quantify an ambient gas.

公开(公告)号：US20170307539A1

公开(公告)日：2017-10-26

申请号：US15134278

申请日：2016-04-20

Applicant: APPLIED MATERIALS ISRAEL LTD.

Inventor： Boris Golberg ,  Ron Naftali

IPC: G01N21/88

CPC classification number: G01N21/8851 ,  G01N2201/063 ,  G01N2201/105

Abstract: An inspection system that may include an illumination module that may be configured to scan a sample during multiple scan iterations; wherein during each scan iteration the illumination module scans each beam of a plurality of spaced apart beams along a scan line; a mechanical stage that may be configured to move the sample during the multiple scan iterations; a detection module; and a processor; wherein when the inspection system operates in an interlaced mode, the mechanical stage may be configured to move at a first speed thereby preventing a substantial overlap between scan lines obtained during the multiple scan iterations; wherein when the inspection system operates in a non-interlaced mode: the mechanical stage may be configured to move at a second speed that differs from the first speed thereby introducing an overlap between scan lines of different beams that may be obtained during different scan iterations; the detection module may be configured to generate detection signals in response to a detection of radiation emitted from the sample as a result of each scan line; and wherein the processor may be configured to independently process detection signals relating to different scan lines.

公开(公告)号：US20170307528A1

公开(公告)日：2017-10-26

申请号：US15138660

申请日：2016-04-26

Applicant: Molecular Devices, LLC

Inventor： Josef J. Atzler ,  Michael Katzlinger ,  Klaus Wagner

IPC: G01N21/64

CPC classification number: G01N21/6428 ,  G01N21/6408 ,  G01N21/6445 ,  G01N21/645 ,  G01N2021/174 ,  G01N2201/061 ,  G01N2201/063

Abstract: In an optical-based sample analysis, for example fluorescence-based or absorbance-based measurement, a selection is made between a first excitation light path and a second excitation light path. The first excitation light path directs excitation light from a light source, through an excitation monochromator, through an excitation filter, and to a sample. The second excitation light path directs excitation light from the light source, through the excitation filter, and to the sample while bypassing the excitation monochromator. Excitation light generated by the light source is transmitted along either the first excitation light path or the second excitation light path in accordance with the selection made, thereby irradiating the sample. In response the sample produces emission light (transmitted light in the case of absorbance measurements), which is transmitted to and measured by a light detector.