中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

2639 records (took 0.031 seconds)

    METHOD OF INSTRUCTING PATH TO HIGH SPEED PACKET SWITCHING SYSTEM
    181.
    发明专利
    METHOD OF INSTRUCTING PATH TO HIGH SPEED PACKET SWITCHING SYSTEM 失效

    公开(公告)号：JPH0225135A

    公开(公告)日：1990-01-26

    申请号：JP12168089

    申请日：1989-05-17

    Applicant: CSELT CENTRO STUDI LAB TELECOM

    Inventor： MEEREN RITSUKARUDO

    IPC: H04L12/56

    Abstract: PURPOSE: To obtain the best path between the input and the output of a network by evaluating many alterable paths available between the input and the output by a general cost function. CONSTITUTION: The input/output in the network are grouped into four input sections PE1 to PE4 and four output sections PU1 to PU4 which include an element SE. In the case where connection is established between the input connected to controlling elements UC1-3 and the output connected to elements UC3-7, lines A, B, C and D show four alterable paths between the input and the output. As for the connection, two possible cost functions are inspected. The 1st function selects a path which introduces the minimum delay into a packet column intended to be proceeded through the network. The 2nd function selects a path which permits the maximum utilization of the maximum available bandwidth in the available bandwidth. These results of two functions are added to each other and a general cost is evaluated, so that a path at the minimum cost is directed.

    METHOD AND APPARATUS FOR AUTOMATIC FREQUENCY CONTROL OF SEMICONDUCTOR LASER
    182.
    发明专利
    METHOD AND APPARATUS FOR AUTOMATIC FREQUENCY CONTROL OF SEMICONDUCTOR LASER 失效

    公开(公告)号：JPH01276786A

    公开(公告)日：1989-11-07

    申请号：JP5398089

    申请日：1989-03-08

    Applicant: CSELT CENTRO STUDI LAB TELECOM

    Inventor： PIERO GANBINI

    IPC: H01S5/068 ,  H01S5/0687 ,  H01S5/40 ,  H04B10/155

    Abstract: PURPOSE: To enable compensation for a wide-range frequency oscillation by performing the light analysis of a light signal emitted from a laser, transforming the spectrum signal into an electric signal and finding the derivative of the electric signal to extract an error signal. CONSTITUTION: A light signal emitted from a laser 1 is supplied to a modulator 2 and a control device 100. A beam directed to the device 100 is given to a spectrum analyzing device. A distance between the mirrors of an interferometer 6 is corrected by an piezo-electric device 10 receiving the output of a tilt voltage generating device 11. A detector 12 transforms the output of the interferometer 6 into electric signal to supply it to a differential circuit 14. A comparator 15 detects the zero point of intersection of a derivative signal to transform 16 a detection signal into a pulse. A sample and hold circuit 17 accords a tilt signal from the generating device 11 to the zero point of intersection of the interferometer spectrum derivative to perform sampling. A sample from the circuit 17 is given to a differential amplifier 19 through a low-pass filter 18 and compared with a reference signal VR. An error signal outputted from the amplifier 19 compensates for the frequency change of the laser 1.

    FIXING DEVICE FOR MEASURING ELECTROSTATIC CHARACTERISTIC FOR MICROWAVE 3-TERMINAL ACTIVE PART
    183.
    发明专利
    FIXING DEVICE FOR MEASURING ELECTROSTATIC CHARACTERISTIC FOR MICROWAVE 3-TERMINAL ACTIVE PART 失效

    公开(公告)号：JPH01276077A

    公开(公告)日：1989-11-06

    申请号：JP5397989

    申请日：1989-03-08

    Applicant: CSELT CENTRO STUDI LAB TELECOM

    Inventor： ANJIERO ANGERUTSUCHI ,  ROBERUTO BUROTSUKO ,  JIANNI KURERIKO TEITEINETSUTO

    IPC: G01R31/26 ,  G01R1/04

    Abstract: PURPOSE: To prevent generation of stress by providing two metallic supporting block being screwed, respectively, to two flanges having two holes for receiving and electric connector. CONSTITUTION: Two metallic supporting blocks SU1, SU2 are screwed, respectively, to two flanges FL1, FL2 having two holes FO1, F02 for receiving an electric connector provided with a boise suppression filter for applying a bias voltage to an FET. Two plates PO1, PO2 are screwed to the supporting blocks SU1, SU2 and support dielectric substrates CI1, CI2. The plates PO1, PO2 can prevent generation of undue mechanical stress in a heating period during measurement of an FET to be measured by adapting thermal expansion of the supporting blocks SU1, SU2 to that of the dielectric substrates CI1, CI2.

Patent Agency Ranking