SPECTROMETRY DEVICE AND SPECTROMETRY METHOD
    183.
    发明公开

    公开(公告)号:EP3229000A4

    公开(公告)日:2018-06-13

    申请号:EP15866174

    申请日:2015-11-19

    Abstract: A spectroscopic measurement apparatus 1 includes a light source 10, an integrator 20, a first spectroscopic detector 41, a second spectroscopic detector 42, and an analysis unit 50. The integrator 20 includes an internal space 21 in which a measurement object is disposed, a light input portion 22 for inputting light to the internal space 21, a light output portion 23 for outputting light from the internal space 21, and a sample attachment portion 24 for attaching the measurement object. The first spectroscopic detector 41 receives the light output from the integrator 20, disperses the light of a first wavelength region in the received light, and acquires first spectrum data. The second spectroscopic detector 42 receives the light output from the integrator 20, disperses the light of a second wavelength region in the received light, and acquires second spectrum data. The first wavelength region and the second wavelength region include a wavelength region partially overlapping each other. Thus, the spectroscopic measurement apparatus and the spectroscopic measurement method that can perform spectroscopic measurement of the measurement target light with a wider wavelength region can be provided.

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