公开(公告)号：US5058178A

公开(公告)日：1991-10-15

申请号：US454210

申请日：1989-12-21

Applicant: Rajarshi Ray

Inventor： Rajarshi Ray

IPC: G01B11/30 ,  B23K1/00 ,  G01N21/88 ,  G01N21/93 ,  G01N21/956 ,  G06T1/00 ,  G06T7/00 ,  H04N7/18 ,  H05K3/34

CPC classification number: G06T7/0006 ,  G01N21/95684 ,  G01N2021/8825 ,  G01N2021/8867 ,  G01N2021/8887 ,  G01N2021/95661 ,  G01N2201/102 ,  G06T2207/30152

Abstract: Defective or missing solder bumps (18) on a surface (13) of an article (10) such as a chip carrier are detected by first illuminating the surface with dark field illumination. Next, the image of the surface of the article is captured, typically by a television camera (30). The captured image is processed to detect defects by first creating a window (57) in the image about each group of solder bumps and then creating a bounding box (58) about each bump in each window. Each of a set of attributes, including: the number, size and location of the windows, the size location and number of boxes in each window, and the dimensions, shape and brightness of the image in each box, is measured. The value of each attribute is compared to a reference value, representing the value of the attribute when no defects are present. If the attribute differs by more than a predetermined tolerance for its reference value, than a particular defect is prevent. Verification of certain defects may be accomplished by repeating the above-described process using bright field illumination.

Abstract translation: 通过首先用暗场照明照射表面，来检测诸如芯片载体的物品（10）的表面（13）上的缺陷或缺失的焊料凸块（18）。 接下来，通常通过电视摄像机（30）拍摄物品表面的图像。 处理捕获的图像以通过首先在关于每组焊料凸块的图像中创建窗口（57），然后在每个窗口中围绕每个凸起创建边界框（58）来检测缺陷。 一组属性中的每一个，包括：窗口的数量，大小和位置，每个窗口中的框的大小位置和数量，以及每个框中的图像的尺寸，形状和亮度。 将每个属性的值与参考值进行比较，表示当没有缺陷存在时属性的值。 如果属性对于其参考值差异超过预定的公差，则防止特定缺陷。 可以通过使用亮场照明重复上述过程来实现某些缺陷的验证。

公开(公告)号：US4972093A

公开(公告)日：1990-11-20

申请号：US439553

申请日：1989-11-20

Applicant: Don W. Cochran ,  James R. Austin

Inventor： Don W. Cochran ,  James R. Austin

IPC: G01N21/84 ,  G01N21/88 ,  G01N21/954 ,  G01N21/956

CPC classification number: G01N21/8806 ,  G01N2021/8455 ,  G01N2021/8887 ,  G01N2201/06153 ,  G01N2201/102

Abstract: An engineered lighting system for use in an inspection system is comprised of an array of light emitting diodes. A specimen is brought into the viewing area, and a current pulse is provided to the diodes of the array to selectively flash all or a portion of the diodes of the array. Reflected light from the specimen is sensed and a digitized image is generated therefrom. An illumination level of the digitized image is adjustable, in whole or in part, by varying the effective lighting intensity of one or more of the diodes of the array during a flash period. The digitized image of the specimen is compared to data indicative of acceptability of the specimen, and acceptance or rejection of the specimen is decided on a basis of a comparison therebetween.

Abstract translation: 用于检查系统的工程照明系统由发光二极管阵列组成。 将样本带入观察区域，并且向阵列的二极管提供电流脉冲以选择性地闪烁阵列的二极管的全部或一部分。 检测到来自样本的反射光并从其中产生数字化图像。 通过在闪光期间改变阵列的一个或多个二极管的有效照明强度，数字化图像的照明水平可以全部或部分地调整。 将样本的数字化图像与指示样品可接受性的数据进行比较，并且基于它们之间的比较来确定样品的接受或排除。

公开(公告)号：US4930890A

公开(公告)日：1990-06-05

申请号：US210097

申请日：1988-06-22

Applicant: Yasuhiko Hara ,  Kenzo Endo

Inventor： Yasuhiko Hara ,  Kenzo Endo

IPC: G01N21/88 ,  G01N21/64 ,  G01N21/956 ,  G01R31/28 ,  G01R31/309 ,  H05K3/00 ,  H05K13/08

CPC classification number: G01R31/309 ,  G01N21/95692 ,  G01R31/2806 ,  H05K13/08 ,  G01N2021/8887 ,  G01N2021/95653 ,  G01N21/64 ,  G01N2201/102

Abstract: A method and apparatus for detecting through-hole voids in a multi-layer printed circuit board. The through-hole is formed with an electrical conductor for interconnecting wiring patterns of upper layers and wiring patterns of lower layers of the printed wiring board and is illuminated with a beam having a wavelength falling within a specified wavelength band capable of exciting an luminescent beam from a layer material. The layer material is exposed by a through-hole void in the through-hole of the printed wiring board. The luminescent beam excited by the illumination beam impinging upon the layer material by way of the through-hole void in the through-hole is focussed by means of a focussing optical system and a photoelectric converter. The photoelectric converter converts the luminescent beam into an electrical signal. The presence of a through-hole void is indicated by the electrical signal.

Abstract translation: 一种用于检测多层印刷电路板中的通孔空隙的方法和装置。 通孔形成有电导体，用于互连印刷线路板的上层的布线图案和下层的布线图案，并且用波长落在能够激发发光束的规定波长带内的波长照射 一层材料。 层状材料通过印刷电路板的通孔中的通孔空洞露出。 由通过通孔中的通孔空穴撞击在层材料上的照明光束激发的发光束通过聚焦光学系统和光电转换器聚焦。 光电转换器将发光束转换为电信号。 电气信号表示通孔空隙的存在。

公开(公告)号：US4853776A

公开(公告)日：1989-08-01

申请号：US176540

申请日：1988-04-01

Applicant: Hisao Itaya ,  Toshihiko Okada ,  Morishige Hata ,  Shunji Koike ,  Takahiro Onishi

Inventor： Hisao Itaya ,  Toshihiko Okada ,  Morishige Hata ,  Shunji Koike ,  Takahiro Onishi

IPC: D06H3/08 ,  G01N21/898 ,  H04N7/18

CPC classification number: H04N7/18 ,  G01N21/8983 ,  H04N7/188 ,  G01N2021/8867 ,  G01N2021/8887 ,  G01N2201/102

Abstract: An inspection method and apparatus for searching a fabric in strip form to find lump type and void type flaws on both faces of the fabric. Strobes and image pickup elements are arranged at opposite sides of the fabric in transportation. The strobes at one side of the fabric are caused to emit light, and the image pickup elements at the same side detect light reflected by the fabric while the image pickup elements at the other side detect light passing through the fabric.

Abstract translation: 一种检索方法和装置，用于以织带形式搜索织物以在织物的两个面上发现块状和空隙型缺陷。 色带和图像拾取元件布置在运输中织物的相对两侧。 使织物一侧的闪光灯发光，同时侧面的图像拾取元件检测由织物反射的光，同时另一侧的图像拾取元件检测穿过织物的光。

公开(公告)号：KR1020150043346A

公开(公告)日：2015-04-22

申请号：KR1020157004500

申请日：2013-07-30

Applicant: 엘렉트리씨트 드 프랑스

Inventor： 롬베즈로랑 ,  길레모레스장프랑소와 ,  들라마르아모리

IPC: G01N21/62 ,  G01N21/63 ,  G01N21/66 ,  G01N21/71 ,  G01N21/21 ,  G01N21/17

CPC classification number: G01N21/95 ,  G01N21/6445 ,  G01N21/6489 ,  G01N21/9501 ,  G01N2021/646 ,  G01N2201/06113 ,  G01N2201/12 ,  G01N21/63 ,  G01N21/21 ,  G01N21/66 ,  G01N21/71 ,  G01N2021/218 ,  G01N2201/0484 ,  G01N2201/102

Abstract: 다결정반도체물질의결정구조를분석하는방법이설명된다. 일실시예에따라, 분석방법은물질이발광신호를방출하도록상기물질을여기시키는단계, 상기물질의프리셋공간구역내 메쉬의각 점에서, 상기물질의대역갭의폭 이상의폭의주파수대역에서가변편광각도에서발광신호를검출하는단계, 상기물질의프리셋공간구역내 상기메쉬의각 점에서, 상기메쉬의상기점에대해검출된신호로부터, 상기편광각도의함수로사인파의합성으로모델링된상기발광신호의변조의데이터특성을추정하는단계, 및상기프리셋공간구역내 상기메쉬의모든점에걸쳐특성데이터를나타내는단계를포함한다.

公开(公告)号：KR1020120082543A

公开(公告)日：2012-07-24

申请号：KR1020110003851

申请日：2011-01-14

Applicant: 안신병

Inventor： 안신병

IPC: G01N25/02 ,  G01N35/00

CPC classification number: G01N25/14 ,  G01N1/44 ,  G01N2201/0621 ,  G01N2201/102

Abstract: PURPOSE: A device for inspecting crystallization is provided to minimize time and efforts required for the crystallization inspection and to enhance the accuracy of the inspection. CONSTITUTION: A device for inspecting crystallization comprises a body, a cover, a specimen container rotating unit(130), a heater(140), and a photographing member(150). The body comprises a mounting unit where the specimen container is fitted in. The over is joined to be slid in a horizontal direction for opening/closing the top of the body. The specimen container rotating unit rotates the mounting unit for the rotation of the specimen container. The heater is installed in the body to supply heat to the specimen container. The photographing member obtains images of a specimen with respect to the specimen container.

Abstract translation: 目的：提供一种用于检查结晶的装置，以最小化结晶检查所需的时间和精力，并提高检查的准确性。 构成：用于检查结晶的装置包括主体，盖，样本容器旋转单元（130），加热器（140）和拍摄构件（150）。 主体包括装配有检体容器的安装单元，该接合件沿水平方向接合以打开/关闭本体的顶部。 样本容器旋转单元旋转安装单元以使样本容器旋转。 加热器安装在身体中以向样品容器供热。 拍摄部件获取样本相对于标本容器的图像。

公开(公告)号：KR1020040078564A

公开(公告)日：2004-09-10

申请号：KR1020040013970

申请日：2004-03-02

Applicant: 무라타 기카이 가부시키가이샤

Inventor： 시오타타케시

IPC: G01N21/88

CPC classification number: G01M3/38 ,  G01N21/8803 ,  G01N2021/8835 ,  G01N2201/102 ,  H04N7/185

Abstract: PURPOSE: A pipe probing apparatus is provided to easily adjust a position of a camera according to the size of the pipe by attaching the camera to a running member for moving forward and backward in a cylindrical pipe. CONSTITUTION: A pipe apparatus includes a running member for moving forward and backward in a cylindrical pipe while pulling a cable and a camera having a lens. The pipe apparatus arranges the camera and a link appliance on the running member by using a lifting adjustment unit. The link appliance integrally lifts the camera and a radar device(8) positioned at the upper part of the camera. The pipe apparatus includes arm members which individually lift the radar device. The lifting adjustment unit simultaneously lifts the camera and the radar device in a state in which the pivoting arm members are contracted. When the camera is positioned in the center of a pipe, the radar device has not abutted against an upper inner surface of the pipe but is located inside the pipe.

Abstract translation: 目的：提供一种管道探测装置，通过将摄像机安装在圆柱形管道中前进和后退的行进构件上，根据管道的尺寸容易地调节摄像机的位置。 构成：管道装置包括用于在拉动电缆和具有透镜的照相机的同时在圆柱形管道中前后移动的行进构件。 管道装置通过使用提升调节单元将摄像机和链接设备布置在运行构件上。 连杆装置一体地提升相机和位于相机上部的雷达装置（8）。 管道装置包括单独提升雷达装置的臂构件。 提升调节单元同时在旋转臂构件收缩的状态下提升照相机和雷达装置。 当相机位于管道的中心时，雷达装置没有抵靠管道的上内表面，而是位于管道内。

公开(公告)号：KR1019910002268B1

公开(公告)日：1991-04-08

申请号：KR1019880007491

申请日：1988-06-21

Applicant: 가부시끼가이샤 히다치 세이사꾸쇼

Inventor： 하라야스히고 ,  엔도겐조

IPC: H05K3/42

CPC classification number: G01R31/309 ,  G01N21/64 ,  G01N21/95692 ,  G01N2021/8887 ,  G01N2021/95653 ,  G01N2201/102 ,  G01R31/2806 ,  H05K13/08

Abstract: 내용 없음.

公开(公告)号：US20240349451A1

公开(公告)日：2024-10-17

申请号：US18682556

申请日：2022-08-11

Applicant: Modine LLC

Inventor： John David Enright ,  Jacob Mertel ,  Taylor Monnig

IPC: H05K7/20 ,  G01N21/80

CPC classification number: H05K7/203 ,  G01N21/80 ,  H05K7/20318 ,  H05K7/20327 ,  H05K7/20381 ,  H05K7/208 ,  G01N2201/102

Abstract: A two-phase liquid immersion cooling system is described in which heat generating computer components cause a dielectric fluid in its liquid phase to vaporize. Advantageously, a pH indicator is employed to monitor the dielectric fluid.

公开(公告)号：US09842430B2

公开(公告)日：2017-12-12

申请号：US15018587

申请日：2016-02-08

Applicant: General Electric Company

Inventor： Clark Alexander Bendall

IPC: G06T17/00 ,  G01B11/30 ,  G01N21/88 ,  G06T7/00 ,  G06K9/00 ,  G01B11/24

CPC classification number: G06T17/00 ,  G01B11/24 ,  G01B11/30 ,  G01N21/8851 ,  G01N2201/08 ,  G01N2201/102 ,  G06K9/00214 ,  G06K2209/19 ,  G06T7/0012 ,  G06T2207/20112

Abstract: A method and device for automatically identifying a point of interest (e.g., the deepest or highest point) on a viewed object using a video inspection device. The method involves placing a first cursor on an image of the object to establish a first slice plane and first surface contour line, as well as placing another cursor, offset from the first cursor, used to establish an offset (second) slice plane and an offset (second) surface contour line. Profile slice planes and profile surface contour lines are then determined between corresponding points on the first surface contour line and the offset (second) surface contour line to automatically identify the point of interest.