Abstract:
PROBLEM TO BE SOLVED: To provide a monolithic integrated high-voltage resistance structure having an IGBT(insulated gate bipolar transistor) device which has structural and functional characteristics capable of suppressing the occurrence of a parasitic transistor and which overcomes a limited condition and defect affecting the above conventional devices. SOLUTION: In the device in which a second conductive semiconductor layer(19) is integrated on a laminated first conductive semiconductor substrate(16) and which includes a resistance structure(17) for voltage control and an IGBT device(18), the resistance structure(17) surrounds a part(22) of the semiconductor layer(19), shows the first conductive type, and includes at least one of substantially ring-like regions(21a). COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a memory device generating bias voltage varied temporally and monotonously with a simple configuration. SOLUTION: This memory device (100) is provided with a plurality of memory cells (MC) storing a value respectively, at least one reference cell (Mr 0 to Mr 2 ), a bias means (115) for applying bias voltage (Vc, Vr) having a pattern of almost monotonous temporal time variation to a selected one group of the memory cells and at least the one reference cell, a means (130) detecting that current of the selected each memory cell and each reference cell reached the threshold value, and a means (145) for specifying a value stored in selected each memory cell conforming to time relation in which a current of the selected memory cell reaches the threshold value and a current of at least the one reference cell reaches the threshold value. The bias means is provided with a means (305) supplying the prescribed biasing current (Ib) to the selected memory cell and at least the one reference cell. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a method for controlling a load current even when a current ripple significantly varies. SOLUTION: The method includes: (A) a step of setting a threshold value of a comparator in correspondence to a reference current value for a load; (B) a step of measuring a first time interval from an active ON state of an ON phase of a power stage to a point of time when the load current reaches the reference current value; and (C) a step of continuously maintaining the power stage in the ON phase. Step (C) is performed while the power stage is further maintained in the predictive ON state for an additional time interval. The additional time interval is determined based on an average value of the first time interval and a time interval of the active ON state measured during a past PWM (pulse width modulation) cycle. COPYRIGHT: (C)2010,JPO&INPIT