APPARATUS FOR EQUIPMENT MONITORING
    11.
    发明申请

    公开(公告)号:US20220003637A1

    公开(公告)日:2022-01-06

    申请号:US17480163

    申请日:2021-09-21

    Applicant: ABB Schweiz AG

    Abstract: An apparatus for equipment monitoring includes an input unit, a processing unit, and an output unit. The input unit is configured to provide the processing unit with batches of temporal sensor data for an item of equipment. Each batch of temporal sensor data includes temporal sensor values as a function of time. The processing unit is configured to process the batches of temporal sensor data to determine batches of spectral sensor data. Each batch of spectral sensor data includes spectral sensor values as a function of frequency. The processing unit is configured to implement at least one statistical process algorithm to process the spectral sensor values for the batches of spectral sensor data to determine index values. For each batch of spectral sensor data there is an index value determined by each of the statistical process algorithms.

    APPARATUS FOR MONITORING A SWITCHGEAR

    公开(公告)号:US20210396584A1

    公开(公告)日:2021-12-23

    申请号:US17467295

    申请日:2021-09-06

    Applicant: ABB Schweiz AG

    Abstract: An apparatus for monitoring a switchgear includes: an input unit; a processing unit; and an output unit. The input unit provides the processing unit with a monitor infra-red image of a switchgear. The processing unit implements a machine learning classifier algorithm to analyse the monitor infra-red image and determine if there is one or more anomalous hot spots in the switchgear. The machine learning classifier algorithm has been trained based on a plurality of different training infra-red images, the plurality of training infra-red images including a plurality of synthetic infra-red images generated from a corresponding plurality of visible images. The output unit outputs information relating to the one or more anomalous hot spots.

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