Abstract:
PROBLEM TO BE SOLVED: To improve the position measuring accuracy of a lithography device. SOLUTION: A stage system for the lithography equipment is provided. The stage system includes a movable stage and a still motor coil assembly including a coil, and the coil forms a moving magnetic motor for interacting with the magnet of the movable stage and driving the movable stage. The stage system further includes a position measuring system for measuring the position within an operation area of the movable stage, and the position measuring system moves a measuring beam along a measuring beam path extending toward the movable stage at the upper part of a part of the motor coil assembly. The coil assembly includes a coil assembly path between motor coils for driving a motor, and the coil assembly path extends at the lower part of the measuring beam path. The movable stage can include a substrate stage or a reticle stage. COPYRIGHT: (C)2008,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide an improved controlling system for a lithographic apparatus and the lithographic apparatus having the same. SOLUTION: A controlling system for controlling a position parameter of a stage in a lithographic apparatus has a stage controller for controlling at least a position parameter of a stage at least in a first direction. The controlling system has a disturbance torque estimator for estimating a disturbance torque on a stage around an axis line extended in a second direction which is substantially orthogonal to the first direction. The controlling system has a correcting signal calculator to which the estimated disturbance torque and a signal which represents a position of a stage extended in a third direction which is substantially orthogonal to the first and second directions are provided. The correcting signal calculator determines a feed forward correcting signal for correcting a position error of the stage extended in the first direction caused by the disturbance torque. The feed forward correcting signal is provided to the stage. COPYRIGHT: (C)2008,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide lithography equipment having reduced a relative position error between a first movable part and a second movable part, a position amount controller, and a control method. SOLUTION: The lithography equipment comprises a first movable element and a first control system for controlling the position amount of the first movable element. Further, the lithography equipment comprises a second movable element and a second control system for controlling the position amount of the second movable element. In order to reduce a tracking error, that is, a relative error between the first movable part and the second movable part, a feed forward table is provided as comprising feed forward table programming for generating a feed forward signal in synchronization with a set value signal to be provided to the first and second control systems. In order to correct the position amount of the first movable element to reduce the relative error between the position amount of the first movable element and the position amount of the second movable element, a feed forward is provided to the first control system. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To obtain a lithographic projection apparatus, having a lower MSD value and MA value by improving synchronization. SOLUTION: The lithographic projection apparatus comprises a data storage means 35 for reading disturbance compensation force from the storage means in response to a signal, representing the position of one of first and second object tables MT and WT and a processing means 37 for generating a force adjustment signal, in response to the disturbance compensation force for adjusting the force exerted by drive means PS1 and PS2 on the object table.
Abstract:
PROBLEM TO BE SOLVED: To provide an improved positioning system for an upper part component and a lower part component (e.g. a support structure for patterning means and a substrate table) of a lithographic apparatus.SOLUTION: In the positioning system for controlling a relative position between the upper part component and the lower part component of the lithographic apparatus, a position of each component is defined by a set of orthogonal coordinates. The positioning system includes: a measuring device configured to determine an error in a momentary position of one of the components with respect to a set value position in a measurement coordinate; and a controller configured to control movement of the other component in a control coordinate based on the determined error. The measurement coordinate is different from the control coordinate.
Abstract:
PROBLEM TO BE SOLVED: To provide an apparatus having an improved imaging performance.SOLUTION: A lithographic apparatus includes: a support frame which is supported by a base via a vibration isolation system; a projection system configured to transfer a pattern from a patterning device onto a substrate, and including a first frame which is spring-supported by the support frame; and an active damping system configured to damp movement of the first frame, and including a first sensor system configured to provide a first sensor output representative of absolute movement of the first frame, a first actuator system arranged to apply a force between the first frame and the support frame, and a control system configured to provide a drive signal to the first actuator system based on the first sensor output.
Abstract:
PROBLEM TO BE SOLVED: To provide an efficient feed forward compensation mechanism for compensating pressure pulses caused by movements of an object of a device in relation to a metrology frame. SOLUTION: A lithographic apparatus including: a projection system; a metrology frame MF supported by a vibration isolation support device ISD; a movable object WT; and a displacement determining unit to determine positions, speeds and/or accelerations of the object WT in relation to the metrology frame MF and/or a projection system. At least one actuator F is provided for applying correcting forces and/or torques on the metrology frame MF, and a controller C is provided which is configured to calculate the correcting forces and/or torques to be applied to the metrology frame MF on the basis of the determined positions, speeds and/or accelerations of the object WT in order to compensate pressure pulses exerted on the metrology frame MF caused by movements of the object WT in relation to the metrology frame MF. COPYRIGHT: (C)2010,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To reduce an influence of vibrations in a lithographic apparatus. SOLUTION: A lithographic apparatus transfers a pattern from a patterning device onto a substrate. This lithographic apparatus includes an acoustic sensor which measures first acoustic vibrations in a sensor measurement region of the lithographic apparatus. An actuator is provided at least in a region within the lithographic apparatus in order to generate second acoustic vibrations. Furthermore, a control device is provided which has a sensor input part for receiving a sensor signal of the acoustic sensor and an actuator output part for giving an actuator driving signal to the actuator. The control device drives the actuator so that the second acoustic vibrations cancel the first acoustic vibrations at least partially in the region. COPYRIGHT: (C)2009,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a stable control system for controlling the position or position related quantity such as the speed or acceleration of an object, especially a stable active damping system. SOLUTION: A control system for controlling the position or position related quantity of an object includes: a measuring system for measuring the position or position related quantity of the object; a controller for supplying control signals on the basis of the measured position or position related quantity; and an actuator for actuating the object on the basis of the control signal. The control system further includes at least one filter unit for filtering the measured position or position related quantity. At least one filter unit is a partial order filter unit. COPYRIGHT: (C)2009,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a method for controlling a short stroke module in a lithography equipment substrate stage or a reticle stage. SOLUTION: A movable object is operated at a first degree of freedom. Step (a) makes a first motor assembly including at least one motor of first type or a plurality of motors and a second motor assembly including at least one motor of second type or a plurality of motors and enables each of the first and second motor assemblies to move the movable object at the first degree of freedom; step (b) supplies a feed forward signal from a feed forward unit to the first motor assembly based on the feed forward reference signal; and step (c) supplies a position control signal from a position control unit to the second motor assembly based on the position control reference signal. COPYRIGHT: (C)2008,JPO&INPIT