公开(公告)号：US11657742B1

公开(公告)日：2023-05-23

申请号：US17399974

申请日：2021-08-11

Applicant: Apple Inc.

Inventor： Hasan Akyol ,  Chung-Lun Edwin Hsu ,  Baris Cagdaser ,  John T. Wetherell ,  Xuebei Yang ,  Ali Tabatabaei ,  Patrick Bryce Bennett ,  Yingkan Lin ,  Chun-Ming Tang ,  Xiaofeng Wang ,  Hopil Bae

IPC: G09G3/00 ,  G09G3/3258 ,  G09G3/3275

CPC classification number: G09G3/006 ,  G09G3/3258 ,  G09G3/3275 ,  G09G2320/04 ,  G09G2330/12

Abstract: Embodiments disclosed herein provide systems and methods for testing and repairing various aspects of an electronic display. The electronic display includes a reference array and an active array. The electronic display also includes test circuitry used to test individual or any combination of pixels of the electronic display. Switches may be disposed between the pixels and the test circuitry to be to repair the various components of the electronic display.