Microfluidic autoregulator devices and arrays for operation with newtonian fluids
    12.
    发明授权
    Microfluidic autoregulator devices and arrays for operation with newtonian fluids 有权
    用于牛顿流体操作的微流控自动调节器和阵列

    公开(公告)号:US07992587B2

    公开(公告)日:2011-08-09

    申请号:US11606312

    申请日:2006-11-28

    Abstract: By use of the vias a microfluidic autoregulator is fabricated comprising an origin of a fluid, a sink for the fluid, a main flow channel coupling the origin and the sink, a valve communicated to the main flow channel to selectively control flow of fluid therethrough, and means dependent on flow through the main flow channel for creating a pressure differential across the valve to at least partially activate the valve to control flow of fluid through the main flow channel. The means for dependent on flow for creating a pressure differential comprises either a dead-end detour channel from the flow channel to the valve, or a loop channel fed back to the control chamber of the valve.

    Abstract translation: 通过使用通孔,制造微流体自动调节器,该微流控自动调节器包括流体的来源,用于流体的水槽,连接原点和水槽的主流动通道,连通到主流动通道的阀,以选择性地控制流体的流动, 并且取决于通过主流动通道的流动的装置,用于在阀门两端产生压差,至少部分地启动阀门,以控制通过主流动通道的流体流动。 用于产生压力差的用于依赖于流动的装置包括从流动通道到阀门的死端迂回通道或反馈到阀的控制室的回路通道。

    ON-CHIP PHASE MICROSCOPE/BEAM PROFILER BASED ON DIFFERENTIAL INTERFERENCE CONTRAST AND/OR SURFACE PLASMON ASSISTED INTERFERENCE
    15.
    发明申请
    ON-CHIP PHASE MICROSCOPE/BEAM PROFILER BASED ON DIFFERENTIAL INTERFERENCE CONTRAST AND/OR SURFACE PLASMON ASSISTED INTERFERENCE 有权
    基于差分干涉对比和/或表面质谱辅助干扰的片上相位显微镜/光束分布器

    公开(公告)号:US20110063623A1

    公开(公告)日:2011-03-17

    申请号:US12823201

    申请日:2010-06-25

    CPC classification number: G02B21/0056 G01N21/553 G02B21/18 G02B21/361

    Abstract: A differential interference contrast (DIC) determination device and method utilizes an illumination source, a layer having a pair of two apertures that receive illumination from the illumination source, and a photodetector to receive Young's interference from the illumination passing through the pair of two apertures. In addition, a surface wave assisted optofluidic microscope and method utilize an illumination source, a fluid channel having a layer with at least one aperture as a surface, and a photodetector that receives a signal based on the illumination passing through the aperture. The layer is corrugated (e.g., via fabrication) and parameters of the corrugation optimize the signal received on the photodetector.

    Abstract translation: 差分干涉对比度(DIC)确定装置和方法利用照明源,具有一对两个孔的层,其接收来自照明源的照明,以及光电检测器,用于接收来自穿过该对两个孔的照明的杨氏干扰。 此外,表面波辅助光流体显微镜和方法利用照明源,具有至少一个孔的层作为表面的流体通道,以及基于穿过孔的照明而接收信号的光电检测器。 该层是波纹状的(例如通过制造),并且波纹的参数优化了在光电检测器上接收的信号。

    On-chip phase microscope/beam profiler based on differential interference contrast and/or surface plasmon assisted interference
    20.
    发明授权
    On-chip phase microscope/beam profiler based on differential interference contrast and/or surface plasmon assisted interference 有权
    基于差分干涉对比和/或表面等离子体辅助干涉的片上相位显微镜/光束轮廓仪

    公开(公告)号:US07768654B2

    公开(公告)日:2010-08-03

    申请号:US11743581

    申请日:2007-05-02

    CPC classification number: G02B21/0056 G01N21/553 G02B21/18 G02B21/361

    Abstract: A differential interference contrast (DIC) determination device and method utilizes an illumination source, a layer having a pair of two apertures that receive illumination from the illumination source, and a photodetector to receive Young's interference from the illumination passing through the pair of two apertures. In addition, a surface plasmon assisted optofluidic microscope and method utilize an illumination source, a fluid channel having a layer with at least one aperture as a surface, and a photodetector that receives a signal based on the illumination passing through the aperture. The layer is corrugated (e.g., via fabrication) and parameters of the corrugation optimize the signal received on the photodetector.

    Abstract translation: 差分干涉对比度(DIC)确定装置和方法利用照明源,具有一对两个孔的层,其接收来自照明源的照明,以及光电检测器,用于接收来自穿过该对两个孔的照明的杨氏干扰。 此外,表面等离子体激元辅助光流体显微镜和方法利用照明源,具有至少一个孔的层作为表面的流体通道,以及基于穿过孔的照明而接收信号的光电检测器。 该层是波纹状的(例如通过制造),并且波纹的参数优化了在光电检测器上接收的信号。

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