Abstract:
PROBLEM TO BE SOLVED: To provide an actinic ray- or radiation-sensitive resin composition and an actinic ray- or radiation-sensitive film with excellent immersion liquid followability whose sensitivity degradation by the immersion exposure compared to the dry exposure is suppressed, and to provide a pattern forming method using this composition.SOLUTION: The actinic ray- or radiation-sensitive resin composition contains (A), (B) and (C) in the following: (A) at least one kind of compound which generates sulfonic acid represented as general formula (I) by exposure to an actinic or radiation ray; (B) a resin which is decomposed by the action of an acid and increases the solubility in an alkali developer; and (C) a resin having at least one of fluorine and silicon atoms. (The definition of the symbols in the formula is the same as that in the patent claims and specifications.)
Abstract:
PROBLEM TO BE SOLVED: To provide a new polymeric compound useful for the production process for semiconductors including IC, for producing liquid crystals and circuit boards such as thermal heads, furthermore, for a resist composition used in lithographic processes in other photofabrications, and to provide a new polymerizable compound to be used in synthesizing the polymeric compound. SOLUTION: The new polymerizable compound having a lactone structure represented by a specific structural formula is provided. Besides, the polymeric compound to be obtained by polymerizing the polymerizable compound is also provided. COPYRIGHT: (C)2011,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide an active light sensitive or radiation sensitive resin composition of which a depth of focus margin (DOF), surface roughness, and a development defect are improved, and to provide a pattern forming method using the composition. SOLUTION: The active light sensitive or radiation sensitive resin composition and the pattern forming method using the composition are provided. The active light sensitive or radiation sensitive resin composition contains: a resin which has a group represented by -C(X 1 )(X 2 )(OR 1 ) (wherein X 1 and X 2 are each independently hydrogen atom, fluorine atom, alkyl, or fluorinated alkyl, either one of or both of the X 1 and X 2 include at least one or more fluorine atoms, and R 1 is hydrogen atom, alkyl, cycloalkyl, or acid-degradable group) and which increases a dissolution rate in an alkali developing solution by the action of acids; an compound which generates an acid by irradiation of active light or radiation; and a resin which contains a repeating unit having at least one polar conversion group, and at least either of a fluorine atom or a silicon atom. COPYRIGHT: (C)2011,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a positive photosensitive composition which is excellent in line edge roughness and exposure latitude, and to provide a pattern formation method using the positive photosensitive composition. SOLUTION: The positive photosensitive composition contains: a resin (A) which includes a recurring unit containing a lactone structure and a recurring specific structural unit having a Van der Waals volume of 306×10 -30 m 3 or less, and facilitates dissolution to alkali by the action of acid; and a compound (B) which produces alkane sulfonic acid substituted with fluorine having a Van der Waals volume less than 135×10 -30 m 3 by the irradiation of active light rays or radiation. The pattern formation method uses the positive photosensitive composition. COPYRIGHT: (C)2010,JPO&INPIT
Abstract translation:要解决的问题:提供线边缘粗糙度和曝光宽容度优异的正性感光性组合物,并提供使用正性感光性组合物的图案形成方法。 正型感光性组合物含有:包含含有内酯结构的重复单元的树脂(A)和范德华体积为306×10 -30 SP>的重复特定结构单元, m 3 SP>以下,通过酸的作用促进了对碱的溶解; 和通过活性光线照射产生Van der Waals体积小于135×10 -30 SP> m 3 SP>的被氟取代的烷烃磺酸的化合物(B) 或辐射。 图案形成方法使用正性感光性组合物。 版权所有(C)2010,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a resin having a narrow composition distribution, to provide a method for supplying the same in excellent reproducibility, to provide a positive type photosensitive composition having an improved pattern formation during fine pattern formation and to provide a method for forming a pattern using the composition. SOLUTION: The method for producing a resin that increases a dissolution rate in an alkali development solution by an acid action comprises a process for carrying out a copolymerization while continuously adding a monomer solution (A) and a polymerization initiator to a monomer solution (B) not containing a polymerization initiator. When a monomer component having the highest polymerization rate in the case of polymerizing only the monomer solution (A) is (P), a monomer component having the lowest polymerization rate is (Q), the ratios (mol%) of (P) in the monomer solution (A) and in the monomer solution (B) are Pa and Pb, respectively and the ratios (mol%) of (Q) in the monomer solution (A) and in the monomer solution (B) are Qa and Qb, respectively, Pa>Pb and Qb>Qa. COPYRIGHT: (C)2009,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a curable resin raw material composition for optical components having stability and giving a cured product excellent in transparency and thermal discoloration resistance, exhibiting enough gas barrier properties and hardly generating cracks; and to provide optical components using the same.SOLUTION: This curable resin raw material composition contains an adamantane derivative A expressed by formula (I). In formula, Aand Aeach independently is a group selected from an acryloyloxy group, methacryloyl group, vinyl group, vinyloxy group and allyloxy group; provided that Aand Aare different from each other; Rrepresents a substituent not containing a double bond; and n denotes an integer of 0 to 8.
Abstract translation:要解决的问题:提供一种具有稳定性的光固化树脂固化性树脂原料组合物,提供透明性,耐热变色性优异的固化物,具有足够的阻气性,难以产生裂纹; 并提供使用其的光学部件。 该固化性树脂原料组合物含有式(I)表示的金刚烷衍生物A. 在式中,A 1 SP>和A 2 SP>各自独立地为选自丙烯酰氧基,甲基丙烯酰基,乙烯基,乙烯基氧基 基团和烯丙氧基; 只要A 1 SP>和A 2 SP>彼此不同; R A SP>表示不含双键的取代基; 并且n表示0至8的整数。版权所有(C)2013,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide an actinic-ray-sensitive or radiation-sensitive resin composition capable of forming a pattern excellent in in-plane uniformity (CDU) of line width, and a pattern forming method using the composition.SOLUTION: An actinic-ray-sensitive or radiation-sensitive resin composition contains (A) a resin that has a repeating unit having a specific lactone structure and a repeating unit having a specific monoalicyclic structure and whose solubility in an alkaline developer is increased by the action of an acid and (B) a compound having a specific structure which generates an acid upon irradiation with an actinic ray or a radiation.
Abstract:
PROBLEM TO BE SOLVED: To provide an actinic ray sensitive or radiation sensitive resin composition that can satisfy both excellent developing property and excellent followability of immersion liquid and to provide a method for forming pattern using the composition.SOLUTION: An actinic ray sensitive or radiation sensitive resin composition according to the present invention is a resin (B) having at least one of fluorine atom and silicon atom and includes a resin (B) including a repeating unit expressed by the following formula (I); a resin (A) whose solubility in an alkali developing solution is increased by an action of an acid; and a compound which generates an acid upon irradiation with actinic ray or radiation.
Abstract:
PROBLEM TO BE SOLVED: To provide an active ray sensitive or radiation sensitive resin composition capable of improving roughness characteristics, an exposure latitude and a development defect performance, and suppressing a standing wave, and to provide a pattern forming method using the composition.SOLUTION: This active ray sensitive or radiation sensitive resin composition includes: a resin (P) containing a repeated unit (A) including a structure portion (S1) for generating an alkali-soluble group by being decomposed by action of an acid, and a structure portion (S2) for raising dissolution speed into alkali developing solution by being decomposed by action of the alkali developing solution; and a compound including a group desorbed by action of an acid and expressed by expression (C-I), or a compound having a structure wherein the compounds including the group desorbed by action of the acid and expressed by the expression (C-I) are connected plurally through a linking group. In the expression (C-I), each of p and q shows an integer of 1 or larger satisfying a relation: p+q=3. Rshows a hydrogen atom, an alkyl group, a cycloalkyl group, an aryl group, an aralkyl group or the linking group. In the case of p=2, two Rs may be mutually the same or mutually different, or may be mutually bonded to form a ring. R-Rshow respectively and independently a hydrogen atom, an alkyl group, a cycloalkyl group, an aryl group, an aralkyl group or the linking group. At least two of the R-Rmay mutually bonded to form a ring.
Abstract:
PROBLEM TO BE SOLVED: To provide an active ray sensitive or radiation sensitive resin composition excellent in roughness characteristics, exposure latitude, focus depth and development defect performance and capable of forming a pattern having a satisfactory shape and to provide a pattern forming method using the same. SOLUTION: The active ray sensitive or radiation sensitive resin composition contains: a resin (P) including a recurring unit (A) having a structural part (S1) decomposed by action of an acid and generating an alkali soluble group and a structural part (S2) decomposed by action of an alkali developer and increasing dissolved speed in the alkali developer; and a compound (Q) having a molar extinction coefficient of 55,000 or below in 193 nm wavelength and generating an acid by irradiation with an active ray or a radiation. COPYRIGHT: (C)2011,JPO&INPIT