11.
    发明专利
    未知

    公开(公告)号:DE3382418D1

    公开(公告)日:1991-10-31

    申请号:DE3382418

    申请日:1983-01-26

    Abstract: The print quality evaluation system uses a processor for providing a value representing the obtained print quality and for adjusting the printing process to bring it into agreement with the required print quality value obtained from the optimal image contrast signal and from a standard deviation defined in terms of the background reflection level and the reflection level of the image elements. The image elements of each character along a line are scanned opto-electronically to obtain an image contrast signal for each image element and a summation function is used to obtain a factor which is divided into the standard deviation to provide the print qualtiy value. The latter is supplied to a closed regulating circuit adjusting the printing parameters.

    Arrangement and method for determining the height profile and reflectivity (reflecting power) of surfaces

    公开(公告)号:DE3126197A1

    公开(公告)日:1983-01-20

    申请号:DE3126197

    申请日:1981-07-03

    Abstract: By scanning a rough, uneven, undulating (corrugated) surface of an object (17) by means of a television camera (7) which is moved to and fro transversely over said surface without special height adjustment and as parallel as possible thereto, contains an optoelectric transducer and has a storage plate (5) situated obliquely relative to the scanned surface, it is possible to determine height profiles and, at the same time, values of reflectivity for the surface thus scanned, specifically due to connection of an appropriately programmed digital computer at the signal output of the television camera (7). However, it is presupposed that the focal length (f) of the lens (3) and the object distance (a) to the surface to be scanned are tuned appropriately to one another in conjunction with as small as possible a depth of focus (field) of the lens (3) assigned to the optoelectric transducer. A television camera (7) equipped in such a way and guided relative to the surface to be scanned can be used to prepare both micrographs in the production of, e.g. monolithically integrated semiconductor circuits, and macrophotographs, e.g. in satellite photography, in conjunction with appropriate adaptation.

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