公开(公告)号：US12243806B2

公开(公告)日：2025-03-04

申请号：US18397906

申请日：2023-12-27

Applicant: Intel Corporation

Inventor： Ravindranath Mahajan ,  Debendra Mallik ,  Sujit Sharan ,  Digvijay Raorane

IPC: H01L23/48 ,  H01L21/56 ,  H01L21/768 ,  H01L23/00 ,  H01L23/31 ,  H01L23/34 ,  H01L23/538 ,  H01L25/18

Abstract: Embodiments disclosed herein include electronic packages and methods of forming such electronic packages. In an embodiment, the electronic package comprises a base substrate. The base substrate may have a plurality of through substrate vias. In an embodiment, a first die is over the base substrate. In an embodiment a first cavity is disposed into the base substrate. In an embodiment, the first cavity is at least partially within a footprint of the first die. In an embodiment, a first component is in the first cavity.

公开(公告)号：US20220102242A1

公开(公告)日：2022-03-31

申请号：US17032577

申请日：2020-09-25

Applicant: Intel Corporation

Inventor： Mitul Modi ,  Joseph Van Nausdle ,  Omkar Karhade ,  Edvin Cetegen ,  Nicholas Haehn ,  Vaibhav Agrawal ,  Digvijay Raorane ,  Dingying Xu ,  Ziyin Lin ,  Yiqun Bai

IPC: H01L23/42 ,  H01L23/31 ,  H01L21/48

Abstract: Techniques and mechanisms for facilitating heat conductivity in a packaged device with a dummy die. In an embodiment, a packaged device comprises a substrate and one or more IC die coupled to a surface thereof. A dummy die, adjacent to an IC die and coupled to a region of the substrate, comprises a polymer resin and a filler. A package mold structure of the packaged device adjoins respective sides of the IC die and the dummy die, and adjoins the surface of the substrate. In another embodiment, a first CTE of the dummy die is less than a second CTE of the package mold structure, and a first thermal conductivity of the dummy die is greater than a second thermal conductivity of the package mold structure.

公开(公告)号：US11189573B2

公开(公告)日：2021-11-30

申请号：US16069377

申请日：2016-03-31

Applicant: Intel Corporation

Inventor： Vijay K. Nair ,  Digvijay Raorane

IPC: H01L23/552 ,  H01L23/00 ,  H01L25/065 ,  H01L23/48 ,  H01L21/78 ,  H01L23/498 ,  H01L21/82

Abstract: A semiconductor package is described herein with electromagnetic shielding using metal layers and vias. In one example, the package includes a silicon substrate having a front side and a back side, the front side including active circuitry and an array of contacts to attach to a substrate, a metallization layer over the back side of the die to shield active circuitry from interference through the back side, and a plurality of through-silicon vias coupled to the back side metallization at one end and to front side lands of the array of lands at the other end to shield active circuitry from interference through the sides of the die.

公开(公告)号：US11128029B2

公开(公告)日：2021-09-21

申请号：US16335535

申请日：2016-09-26

Applicant: Intel Corporation

Inventor： Vijay K. Nair ,  Digvijay Raorane

IPC: H01Q1/22 ,  H01L21/48 ,  H01L23/13 ,  H01L23/538 ,  H01L23/66 ,  H01L23/00 ,  H01L25/065 ,  H01Q13/00

Abstract: Generally discussed herein are systems, devices, and methods that include a communication cavity. According to an example a device can include substrate with a first cavity formed therein, first and second antennas exposed in and enclosed by the cavity, and an interconnect structure formed in the substrate, the interconnect structure including alternating conductive material layers and inter-layer dielectric layers.

公开(公告)号：US20210035881A1

公开(公告)日：2021-02-04

申请号：US16529617

申请日：2019-08-01

Applicant: Intel Corporation

Inventor： Debendra Mallik ,  Ravindranath Mahajan ,  Digvijay Raorane

IPC: H01L23/367 ,  H01L23/538 ,  H01L23/31 ,  H01L21/48 ,  H01L21/56 ,  H01L23/00

Abstract: A multi-chip unit suitable for chip-level packaging may include multiple IC chips that are interconnected through a metal redistribution structure, and that are directly bonded to an integrated heat spreader. Bonding of the integrated heat spreader to the multiple IC chips may be direct so that no thermal interface material (TIM) is needed, resulting in a reduced bond line thickness (BLT) and lower thermal resistance. The integrated heat spreader may further serve as a structural member of the multi-chip unit, allowing a second side of the redistribution structure to be further interconnected to a host by solder interconnects. The redistribution structure may be fabricated on a sacrificial interposer that may facilitate planarizing IC chips of differing thickness prior to bonding the heat spreader. The sacrificial interposer may be removed to expose the RDL for further interconnection to a substrate without the use of through-substrate vias.

公开(公告)号：US12176268B2

公开(公告)日：2024-12-24

申请号：US16828405

申请日：2020-03-24

Applicant: Intel Corporation

Inventor： Omkar Karhade ,  Digvijay Raorane ,  Sairam Agraharam ,  Nitin Deshpande ,  Mitul Modi ,  Manish Dubey ,  Edvin Cetegen

IPC: H01L23/48 ,  H01L23/482 ,  H01L23/495 ,  H01L23/538

Abstract: Embodiments disclosed herein include multi-die packages with open cavity bridges. In an example, an electronic apparatus includes a package substrate having alternating metallization layers and dielectric layers. The package substrate includes a first plurality of substrate pads and a second plurality of substrate pads. The package substrate also includes an open cavity between the first plurality of substrate pads and the second plurality of substrate pads, the open cavity having a bottom and sides. The electronic apparatus also includes a bridge die in the open cavity, the bridge die including a first plurality of bridge pads, a second plurality of bridge pads, and conductive traces. An adhesive layer couples the bridge die to the bottom of the open cavity. A gap is laterally between the bridge die and the sides of the open cavity, the gap surrounding the bridge die.

公开(公告)号：US12142545B2

公开(公告)日：2024-11-12

申请号：US18238726

申请日：2023-08-28

Applicant: Intel Corporation

Inventor： Ravindranath Mahajan ,  Debendra Mallik ,  Sujit Sharan ,  Digvijay Raorane

IPC: H01L23/48 ,  H01L21/56 ,  H01L21/768 ,  H01L23/00 ,  H01L23/31 ,  H01L23/34 ,  H01L23/538 ,  H01L25/18

Abstract: Embodiments disclosed herein include electronic packages and methods of forming such electronic packages. In an embodiment, the electronic package comprises a base substrate. The base substrate may have a plurality of through substrate vias. In an embodiment, a first die is over the base substrate. In an embodiment a first cavity is disposed into the base substrate. In an embodiment, the first cavity is at least partially within a footprint of the first die. In an embodiment, a first component is in the first cavity.

公开(公告)号：US12068222B2

公开(公告)日：2024-08-20

申请号：US17032577

申请日：2020-09-25

Applicant: Intel Corporation

Inventor： Mitul Modi ,  Joseph Van Nausdle ,  Omkar Karhade ,  Edvin Cetegen ,  Nicholas Haehn ,  Vaibhav Agrawal ,  Digvijay Raorane ,  Dingying Xu ,  Ziyin Lin ,  Yiqun Bai

IPC: H01L23/42 ,  H01L21/48 ,  H01L23/31

CPC classification number: H01L23/42 ,  H01L21/481 ,  H01L23/3128

Abstract: Techniques and mechanisms for facilitating heat conductivity in a packaged device with a dummy die. In an embodiment, a packaged device comprises a substrate and one or more IC die coupled to a surface thereof. A dummy die, adjacent to an IC die and coupled to a region of the substrate, comprises a polymer resin and a filler. A package mold structure of the packaged device adjoins respective sides of the IC die and the dummy die, and adjoins the surface of the substrate. In another embodiment, a first CTE of the dummy die is less than a second CTE of the package mold structure, and a first thermal conductivity of the dummy die is greater than a second thermal conductivity of the package mold structure.

公开(公告)号：US11798865B2

公开(公告)日：2023-10-24

申请号：US16291314

申请日：2019-03-04

Applicant: Intel Corporation

Inventor： Ravindranath Mahajan ,  Debendra Mallik ,  Sujit Sharan ,  Digvijay Raorane

IPC: H01L23/48 ,  H01L21/56 ,  H01L21/768 ,  H01L23/31 ,  H01L23/34 ,  H01L23/538 ,  H01L23/00 ,  H01L25/18

CPC classification number: H01L23/481 ,  H01L21/565 ,  H01L21/76898 ,  H01L23/315 ,  H01L23/3128 ,  H01L23/34 ,  H01L23/5383 ,  H01L23/5386 ,  H01L24/09 ,  H01L24/17 ,  H01L24/29 ,  H01L24/73 ,  H01L25/18 ,  H01L2224/73253

Abstract: Embodiments disclosed herein include electronic packages and methods of forming such electronic packages. In an embodiment, the electronic package comprises a base substrate. The base substrate may have a plurality of through substrate vias. In an embodiment, a first die is over the base substrate. In an embodiment a first cavity is disposed into the base substrate. In an embodiment, the first cavity is at least partially within a footprint of the first die. In an embodiment, a first component is in the first cavity.

公开(公告)号：US11742261B2

公开(公告)日：2023-08-29

申请号：US18089535

申请日：2022-12-27

Applicant: Intel Corporation

Inventor： Ravindranath Mahajan ,  Debendra Mallik ,  Sujit Sharan ,  Digvijay Raorane

IPC: H01L23/48 ,  H01L21/56 ,  H01L21/768 ,  H01L23/31 ,  H01L23/34 ,  H01L23/538 ,  H01L23/00 ,  H01L25/18

CPC classification number: H01L23/481 ,  H01L21/565 ,  H01L21/76898 ,  H01L23/315 ,  H01L23/3128 ,  H01L23/34 ,  H01L23/5383 ,  H01L23/5386 ,  H01L24/09 ,  H01L24/17 ,  H01L24/29 ,  H01L24/73 ,  H01L25/18 ,  H01L2224/73253

Abstract: Embodiments disclosed herein include electronic packages and methods of forming such electronic packages. In an embodiment, the electronic package comprises a base substrate. The base substrate may have a plurality of through substrate vias. In an embodiment, a first die is over the base substrate. In an embodiment a first cavity is disposed into the base substrate. In an embodiment, the first cavity is at least partially within a footprint of the first die. In an embodiment, a first component is in the first cavity.