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公开(公告)号：US20150185253A1
公开(公告)日：2015-07-02
申请号：US14557697
申请日：2014-12-02
Applicant: MPI CORPORATION
Inventor： WEI-CHENG KU , HAO WEI , CHEN-KANG CHIU
CPC classification number: G01R1/06772
Abstract: A probe module including a housing, a PCB, three probes, a resonating member, and a signal connector. The housing has a room therein, a first opening, and a second opening at opposite ends thereof. The PCB is received in the room of the housing, and has a substrate, on which a circuit and two groundings are provided. The probes are electrical connected to the circuit and the groundings of the PCB respectively, and then extend out of the housing via the first opening. The resonating member has a chamber, and is attached to the PCB. The signal connector is connected to the PCB, and extends out of the housing via the second opening. The signal connector has a signal transmission portion electrically connected to the circuit of the PCB, and a grounding portion electrically connected to the at least one grounding of the PCB.
Abstract translation: 探针模块，包括壳体，PCB，三个探针，谐振构件和信号连接器。 壳体在其中具有一个房间，第一开口和在其相对端的第二开口。 PCB被容纳在壳体的房间中，并且具有衬底，在衬底上设置电路和两个接地。 探针分别电连接到电路和PCB的接地处，然后经由第一开口延伸出壳体。 谐振构件具有室，并且附接到PCB。 信号连接器连接到PCB，并通过第二个开口延伸出外壳。 信号连接器具有电连接到PCB的电路的信号传输部分和与PCB的至少一个接地电连接的接地部分。
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公开(公告)号：US20150233969A1
公开(公告)日：2015-08-20
申请号：US14552957
申请日：2014-11-25
Applicant: MPI CORPORATION
Inventor： WEI-CHENG KU , SHAO-WEI LU , HAO WEI , YU-TSE WANG
CPC classification number: G01R1/07314 , G01R1/025 , G01R1/04 , G01R1/07392 , G01R31/2812 , G01R35/005
Abstract: A testing system includes a test machine, a plurality of probe sets, a data input device, a controller, a memory, and a data output device. The test machine has a platform for a DUT to be placed thereon, and a test arm which is movable relative to the platform. The probe sets are provided on the test machine with at least one probe set provided on the test arm to contact the DUT. The data input device is used to input information about the DUT. The controller is electrically connected to the test arm, the probe set on the test arm, and the data input device to move the test arm to a predetermined position according to the inputted information, and to make the probe set contact the DUT for electrical test. The memory saves electrical test result, which is outputted by the data output device.
Abstract translation: 测试系统包括测试机，多个探针组，数据输入设备，控制器，存储器和数据输出设备。 测试机具有用于被放置在其上的DUT的平台以及可相对于平台移动的测试臂。 探头组在测试机器上提供，测试臂上提供至少一个探针组，以便与DUT接触。 数据输入设备用于输入有关DUT的信息。 控制器电气连接到测试臂，测试臂上设置的探头和数据输入设备，根据输入的信息将测试臂移动到预定位置，并使探头组接触DUT进行电气测试 。 存储器节省了由数据输出装置输出的电气测试结果。
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公开(公告)号：US20150204929A1
公开(公告)日：2015-07-23
申请号：US14557311
申请日：2014-12-01
Applicant: MPI CORPORATION
Inventor： WEI-CHENG KU , SHOA-WEI LU , YU-TSE WANG
CPC classification number: G01R31/00 , G01R31/31718
Abstract: A testing system includes a test machine, a communication device, a server, and a user-end device. The test machine does electrical test on an electronic product, wherein the test machine generates a first signal when the test is completed, and generates a second signal when the measured yield is lower than a predetermined threshold. The communication device is electrically connected to the test machine to receive the first signal or the second signal. The communication device correspondingly converts the received signals into first information or second information, and then outputs the first and the second information to a first network. The server communicates with the first network to receive the first and the second information outputted by the communication device, and then outputs the received information to a second network. The user-end device communicates with the second network to receive the first and the second information outputted by the server.
Abstract translation: 测试系统包括测试机，通信设备，服务器和用户端设备。 测试机对电子产品进行电气测试，其中当测试完成时，测试机器产生第一信号，并且当测量的产量低于预定阈值时产生第二信号。 通信设备电连接到测试机器以接收第一信号或第二信号。 通信装置将接收的信号相应地转换为第一信息或第二信息，然后将第一和第二信息输出到第一网络。 服务器与第一网络进行通信以接收由通信设备输出的第一和第二信息，然后将接收到的信息输出到第二网络。 用户端设备与第二网络通信以接收由服务器输出的第一和第二信息。
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公开(公告)号：US20150204908A1
公开(公告)日：2015-07-23
申请号：US14557043
申请日：2014-12-01
Applicant: MPI CORPORATION
Inventor： WEI-CHENG KU , SHAO-WEI LU , HUNG-CHIH SUNG , CHUN-NAN CHEN
CPC classification number: G01R1/04 , G01R1/07392 , G01R31/2887
Abstract: An electrical testing machine includes a base having two parallel first rails, a platform provided on the base, a probe holder provided on the base and having a plurality of placement locations, a support provided between the first rails and having a second rail thereon, a test arm provided on the second rail and above the platform, a receiving seat provided on the test arm, and a plurality of probe sets, wherein one of the probe sets is engaged on the receiving seat, while the others are respectively provided on the placement locations. The support is movable relative to the base and the platform. The test arm is movable along with the support, and is also movable relative to the support. The receiving seat is movable or rotatable relative to the test arm. The probe set engaged on the receiving seat is movable along with the receiving seat.
Abstract translation: 电测试机包括具有两个平行的第一轨道的基座，设置在基座上的平台，设置在基座上并具有多个放置位置的探针保持架，设置在第一轨道之间并具有第二轨道的支撑件， 设置在第二导轨上并位于平台上的测试臂，设置在测试臂上的接收座和多个探针组，其中探针组中的一个接合在接收座上，而其它探针组分别设置在放置位置 位置。 支撑件相对于基座和平台是可移动的。 测试臂与支撑件一起可移动，并且也可相对于支撑件移动。 接收座椅相对于测试臂是可移动的或可旋转的。 接合在接收座上的探针组可与接收座一起移动。
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公开(公告)号：US20150204907A1
公开(公告)日：2015-07-23
申请号：US14556612
申请日：2014-12-01
Applicant: MPI CORPORATION
Inventor： WEI-CHENG KU , SHAO-WEI LU , YA-HUNG LO , SHOU-JEN TSAI
CPC classification number: G01R1/04 , G01R1/07392 , G01R31/2887
Abstract: An electrical testing device includes a base having two parallel first rails, a platform provided on the base, a support provided between the first rails, a test arm, a rotary table provided on the test arm, a plurality of holders provided on the rotary table, and a plurality of probe sets respectively provided on the holders. The support has a second rail provided thereon, and is moveable relative to the base and the platform. The test arm is provided on the second rail and above the platform, wherein the test arm is moveable along with the support, and is also movable relative to the support. The rotary table is moveable or rotatable relative to the test arm. The holders are moveable along with the rotary table, and are also moveable or rotatable relative to the rotary table. The probe sets are moveable along with the holders.
Abstract translation: 电测试装置包括具有两个平行的第一轨道的基座，设置在基座上的平台，设置在第一轨道之间的支撑件，测试臂，设置在测试臂上的旋转台，设置在旋转台上的多个保持架 ，以及分别设置在保持器上的多个探针组。 支撑件具有设置在其上的第二轨道，并且可相对于基座和平台移动。 测试臂设置在第二轨道上并在平台上方，其中测试臂可与支撑件一起移动，并且也可相对于支撑件移动。 旋转台相对于测试臂是可移动的或可旋转的。 支架可与旋转工作台一起移动，并且也可相对于旋转工作台移动或旋转。 探头组与支架一起可移动。
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Patent Agency Ranking
公开(公告)号：US20150168531A1
公开(公告)日：2015-06-18
申请号：US14558625
申请日：2014-12-02
Applicant: MPI CORPORATION
Inventor： WEI-CHENG KU , HAO WEI , CHEN-KANG CHIU , SHIN-LAN KAO
CPC classification number: G01R35/005 , G01R31/024
Abstract: A substrate has a first side and a second side opposite to the first side. The substrate further has a first calibrating region and a second calibrating region on the first side, on each of which two pads are provided, and the pads on the first calibrating region are or are not electrically connected to each other. A resistance device is provided on the second side of the substrate, wherein the resistance device has a predetermined resistance, and has opposite ends electrically connected to the pads on the second calibrating region.
Abstract translation: 衬底具有与第一侧相对的第一侧和第二侧。 衬底还在第一侧上具有第一校准区域和第二校准区域，其中每个校准区域和第二校准区域均设置有两个衬垫，并且第一校准区域上的焊盘彼此不电连接。 电阻器件设置在衬底的第二侧上，其中电阻器件具有预定电阻，并且具有电连接到第二校准区上的焊盘的相对端。
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公开(公告)号：US20150168454A1
公开(公告)日：2015-06-18
申请号：US14557786
申请日：2014-12-02
Applicant: MPI CORPORATION
Inventor： WEI-CHENG KU , HAO WEI , YOU-HAO CHEN , CHIH-HAO HO
CPC classification number: G01R1/06772
Abstract: A probe module, which is provided between a tester and a DUT for transmitting electrical signals therebetween, includes a PCB, a plurality of probes, a positioning member, and a signal connector. The PCB has a circuit and two grounding. The probes are electrical connected to the circuit and the groundings of the PCB. The positioning member is made of an insulating material, and provided on the probes. The positioning member is above the substrate, and the probes are between the substrate and the positioning member. The signal connector is adapted to be electrically connected to the tester, wherein the signal connector has a signal transmission portion and a grounding portion; the signal transmission portion is electrically connected to the circuit of the PCB, and the grounding portion is electrically connected to the at least one grounding of the PCB.
Abstract translation: 探针模块，其设置在测试器和DUT之间用于在其间传输电信号，包括PCB，多个探针，定位构件和信号连接器。 PCB有一个电路和两个接地。 探头电连接到PCB的电路和接地。 定位构件由绝缘材料制成，并设置在探针上。 定位构件位于基板上方，探针位于基板和定位构件之间。 信号连接器适于电连接到测试器，其中信号连接器具有信号传输部分和接地部分; 信号传输部分电连接到PCB的电路，并且接地部分电连接到PCB的至少一个接地。
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公开(公告)号：US20240118313A1
公开(公告)日：2024-04-11
申请号：US18377158
申请日：2023-10-05
Applicant: MPI CORPORATION
Inventor： WEI-CHENG KU , WEN-YI WANG , CHIH-WEI WEN
CPC classification number: G01R1/06722 , G01R1/07307
Abstract: A probe head includes upper, middle and lower dies having upper, middle and lower guiding holes respectively, and a plurality of spring probes. The spring probe includes upper and lower abutting sections disposed in the upper and lower guiding holes, a spring section connecting the upper and lower abutting sections, and a barrel disposed on the periphery of the spring section and inserted in the middle guiding hole. The spring probes include adjacent first and second probes whose barrels has first and second outer diameters and are accommodated in first and second middle guiding holes having first and second widths. The difference between the first width and outer diameter and/or the difference between the second width and outer diameter is larger than or equal to 10 micrometers, and/or the difference between the first and second outer diameters is larger than or equal to 5 μm. Alternatively, the middle guiding holes include a multi-probe matching hole, and the outer diameters of two adjacent barrels accommodated therein are larger than the smallest distance therebetween. The present invention is capable of satisfying the test requirements of fine pitch and impedance matching.
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公开(公告)号：US20170146634A1
公开(公告)日：2017-05-25
申请号：US15401987
申请日：2017-01-09
Applicant: MPI CORPORATION
Inventor： WEI-CHENG KU , SHAO-WEI LU , HAO WEI , YU-TSE WANG
CPC classification number: G01R35/005 , G01R1/073 , G01R31/2808 , G01R31/2894
Abstract: A method of calibrating and debugging a testing system is provided. First, values of different electrical path segments are calibrated, and parameters of the electrical path segments while being calibrated are saved. After calibration, electrical tests can be processed on a DUT. If the testing system malfunctions, the values of the electrical path segments are calibrated again to compare the current parameters to the previously saved parameters. The component which goes wrong can be found out quickly in this way.
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公开(公告)号：US20160018441A1
公开(公告)日：2016-01-21
申请号：US14797582
申请日：2015-07-13
Applicant: MPI CORPORATION
Inventor： WEI-CHENG KU , HAO WEI , JUN-LIANG LAI , CHIH-HAO HO
CPC classification number: G01R1/0416 , G01R1/06794 , G01R31/02 , G01R31/2889
Abstract: A probe card includes a connecting circuit board, a connector, and a probe. The connecting circuit board includes a substrate having a signal via and a plurality of ground vias, a signal feeding structure disposed on the substrate, and a connecting layer having the connector disposed thereon. The signal feeding structure includes a signal feeding pad and a ground pad, which is connected to the ground via, and has a matching compensation opening having a first side and a second side wider than the first side. The signal feeding pad does not contact the ground pad, and has a first end and a second end wider than the first end. The second end is connected to the signal via. The connecting layer has a signal connecting portion connected to the signal via, and a ground connecting portion connected to the ground vias. The probe is connected to the first end.
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