RAMAN SPECTRUM INSPECTION APPARATUS, AND SAMPLE SECURITY INSPECTING METHOD FOR RAMAN SPECTRUM INSPECTION

    公开(公告)号:US20200319111A1

    公开(公告)日:2020-10-08

    申请号:US16314172

    申请日:2018-12-21

    Abstract: A Raman spectrum inspection apparatus and a sample security inspecting method for Raman spectrum inspection are provided. The Raman spectrum inspection apparatus includes: an exciting light source configured to emit an exciting light to a sample; an optical device having a spectrum inspection optical path and a sample imaging optical path, wherein the spectrum inspection optical path is configured to collect a light signal from a location where the sample is irradiated by the exciting light, and the sample imaging optical path is configured to take an image of the sample; a spectrometer configured to receive a light signal from the spectrum inspection optical path, and to generate a Raman spectrum of the sample from the light signal; and a sample security decision device configured to determine security of the sample based on the image of the sample that is taken by the sample imaging optical path.

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