PROCEDE ET DISPOSITIF OPTIQUE POUR ANALYSER UNE MARQUE SUR UNE PAROI COURBE TRANSLUCIDE OU TRANSPARENTE
    13.
    发明公开
    PROCEDE ET DISPOSITIF OPTIQUE POUR ANALYSER UNE MARQUE SUR UNE PAROI COURBE TRANSLUCIDE OU TRANSPARENTE 有权
    方法和设备有关半透明或标记的光学分析 透明CROOKED WALL

    公开(公告)号:EP2297672A2

    公开(公告)日:2011-03-23

    申请号:EP09784479.9

    申请日:2009-07-07

    Applicant: Tiama

    CPC classification number: G06K7/10732

    Abstract: The invention relates to a method for analyzing, by means of a light source (5) having a lighting surface (S) and by means of a camera (6) having an optical observation axis (A), a mark (2) made on the outer surface (3i) of a curved wall (3) made of a translucent or transparent material, characterized in that: - the extended, uniform light source is produced such that: the area of the virtual image (S1) of the lighting surface (S) of the light source (5) completely covers the surface of the mark (2), and such that the luminance of the virtual image (S1) of the lighting surface (S) of the light source (5) is uniform; and – the surface of the mark (2), placed over the surface of the virtual image (S1), is observed so as to enable analysis of the mark (2).

    Abstract translation: 本发明涉及使用光源的方法(5)波塞唱的照明表面(S)和照相机(6)在观察光轴(A)呈现分析的标记(2)制成的外表面(31) 弯曲的壁(3)的材料制成的并是半透明或透明的,所述方法的其特点:使光源广泛而均匀寻求的方式:所述照明的虚像(S“)的首先的程度 所述光源(5)的表面(S)完全呼叫覆盖标记(2)的表面上; 和光源(5)的照明表面(S)的虚像(S“)的亮度是均匀的; 并观察标记的表面(2)重叠的虚像(S“),以使所述标记(2)要被分析的表面上。

    PROCEDE ET DISPOSITIF POUR DETECTER DES DEFAUTS A FAIBLE ET FORT CONTRASTES DANS DES OBJETS TRANSPARENTS OU TRANSLUCIDES
    14.
    发明公开
    PROCEDE ET DISPOSITIF POUR DETECTER DES DEFAUTS A FAIBLE ET FORT CONTRASTES DANS DES OBJETS TRANSPARENTS OU TRANSLUCIDES 有权
    方法和设备适用于高,低反差对比缺陷的透明或半透明物体DUCH检测

    公开(公告)号:EP2082216A2

    公开(公告)日:2009-07-29

    申请号:EP07858657.5

    申请日:2007-10-24

    Applicant: Tiama

    Inventor: LECONTE, Marc

    CPC classification number: G01N21/90 G01N2021/8832 G01N2201/0628

    Abstract: The invention relates to an in-line optical method of inspecting transparent or translucent objects (2) running at high speed between a light source (3) and means (4) for taking images of the objects and for analyzing the images taken, so as to detect defects in the objects. According to the invention the method consists: in controlling the single light source (3) so that said source produces in succession two types of illumination for each object running past said source, the first type being a homogenous illumination whereas the second type is formed from alternate dark zones and light zones with a discontinuous spatial variation; in taking images of each running object when each of them is illuminated in succession by the two types of illumination; and in analyzing the images taken with the illuminations of the first and second types for the purpose of detecting high-contrast defects and low-contrast defects respectively.

    PROCEDE ET DISPOSITIF POUR DETECTER DES DEFAUTS A FAIBLE ET FORT CONTRASTES DANS DES OBJETS TRANSPARENTS OU TRANSLUCIDES
    17.
    发明授权
    PROCEDE ET DISPOSITIF POUR DETECTER DES DEFAUTS A FAIBLE ET FORT CONTRASTES DANS DES OBJETS TRANSPARENTS OU TRANSLUCIDES 有权
    方法和设备适用于高,低反差对比缺陷的透明或半透明物体DUCH检测

    公开(公告)号:EP2082216B1

    公开(公告)日:2012-02-22

    申请号:EP07858657.5

    申请日:2007-10-24

    Applicant: Tiama

    Inventor: LECONTE, Marc

    CPC classification number: G01N21/90 G01N2021/8832 G01N2201/0628

    Abstract: The invention relates to an in-line optical method of inspecting transparent or translucent objects (2) running at high speed between a light source (3) and means (4) for taking images of the objects and for analyzing the images taken, so as to detect defects in the objects. According to the invention the method consists: in controlling the single light source (3) so that said source produces in succession two types of illumination for each object running past said source, the first type being a homogenous illumination whereas the second type is formed from alternate dark zones and light zones with a discontinuous spatial variation; in taking images of each running object when each of them is illuminated in succession by the two types of illumination; and in analyzing the images taken with the illuminations of the first and second types for the purpose of detecting high-contrast defects and low-contrast defects respectively.

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