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20 records (took 0.026 seconds)

    12.
    发明专利
    未知

    公开(公告)号：DD260326A1

    公开(公告)日：1988-09-21

    申请号：DD30240687

    申请日：1987-05-04

    Applicant: ZEISS JENA VEB CARL

    Inventor： BECKER-ROSS HELMUT ,  FLOREK STEFAN ,  KERSTEN FELIX ,  MOEBIUS GUENTHER ,  SANDERS HORST

    IPC: G01J3/04 ,  G01J3/12 ,  G01J3/18 ,  G01J3/00

    Abstract: An adjustable Echelle spectrometer arrangement which can be used in single- and multi-element analysis by the emission or absorption of optical radiation. To compensate all the manufacturing and setup errors, the only arrangements present are those to change the height of the entry slit arrangement above the base plate and to rotate the dispersion prism about a first axis, approximately parallel to its roof edge, and about a second axis, that is vertical thereto. This compensates for the effect of errors associated with component and setup parameters which results from greater tolerances, without impairing mechanical and thermal stability and imaging quality.

    OPTICAL SYSTEM FOR SPECTRAL ANALYSIS DEVICES
    14.
    发明专利
    OPTICAL SYSTEM FOR SPECTRAL ANALYSIS DEVICES 未知

    公开(公告)号：GB2163567B

    公开(公告)日：1988-03-02

    申请号：GB8516395

    申请日：1985-06-28

    Applicant: ZEISS JENA VEB CARL

    Inventor： FLOREK STEFAN ,  BECKER-ROSS HELMUT ,  DOBSCHAL HANS-JURGEN ,  MOHR JOACHIM

    IPC: G01J3/12 ,  G01J3/02 ,  G01J3/04 ,  G01J3/18

    Abstract: The invention relates to an optical system for spectral analysis devices particularly for use in atomic emission spectroscopy in which the aberrations, astigmatis and coma are compensated separately, comprising two concave spherical reflectors adjacently arranged and having their vertices equidistantly located relative to a center of a dispersing member. The latter has a dispersion plane at right angles to the dispersing structure of the dispersing member and to its surface, the vertices are located in said dispersion plane. The center beams originating from an excitation light source are reflected at the reflectors in reflection planes which are at right angles to the dispersion plane. The light entrance of the optical system comprises two slits the images of which coincide in a focal plane. The center of the focal plane and the light entrance have a same distance to the dispersion plane and are located on different sides of the latter.

    OPTICAL SYSTEM FOR SPECTRAL ANALYSIS DEVICES
    16.
    发明专利
    OPTICAL SYSTEM FOR SPECTRAL ANALYSIS DEVICES 未知

    公开(公告)号：GB2163567A

    公开(公告)日：1986-02-26

    申请号：GB8516395

    申请日：1985-06-28

    Applicant: ZEISS JENA VEB CARL

    Inventor： FLOREK STEFAN ,  BECKER-ROSS HELMUT ,  DOBSCHAL HANS-JURGEN ,  MOHR JOACHIM

    IPC: G01J3/12 ,  G01J3/02 ,  G01J3/04 ,  G01J3/18

    Abstract: The invention relates to an optical system for spectral analysis devices particularly for use in atomic emission spectroscopy in which the aberrations, astigmatis and coma are compensated separately, comprising two concave spherical reflectors adjacently arranged and having their vertices equidistantly located relative to a center of a dispersing member. The latter has a dispersion plane at right angles to the dispersing structure of the dispersing member and to its surface, the vertices are located in said dispersion plane. The center beams originating from an excitation light source are reflected at the reflectors in reflection planes which are at right angles to the dispersion plane. The light entrance of the optical system comprises two slits the images of which coincide in a focal plane. The center of the focal plane and the light entrance have a same distance to the dispersion plane and are located on different sides of the latter.

    20.
    发明专利
    未知

    公开(公告)号：FR2566902A1

    公开(公告)日：1986-01-03

    申请号：FR8509825

    申请日：1985-06-27

    Applicant: ZEISS JENA VEB CARL

    Inventor： FLOREK STEFAN ,  BECKER-ROSS HELMUT ,  DOBSCHAL HANS-JURGEN ,  MOHR JOACHIM

    IPC: G01J3/12 ,  G01J3/02 ,  G01J3/04 ,  G01J3/18 ,  G01J3/08

    Abstract: The invention relates to an optical system for spectral analysis devices particularly for use in atomic emission spectroscopy in which the aberrations, astigmatis and coma are compensated separately, comprising two concave spherical reflectors adjacently arranged and having their vertices equidistantly located relative to a center of a dispersing member. The latter has a dispersion plane at right angles to the dispersing structure of the dispersing member and to its surface, the vertices are located in said dispersion plane. The center beams originating from an excitation light source are reflected at the reflectors in reflection planes which are at right angles to the dispersion plane. The light entrance of the optical system comprises two slits the images of which coincide in a focal plane. The center of the focal plane and the light entrance have a same distance to the dispersion plane and are located on different sides of the latter.

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