公开(公告)号：WO1989003986A1

公开(公告)日：1989-05-05

申请号：PCT/US1988003683

申请日：1988-10-20

Applicant: BECKMAN INSTRUMENTS, INC.

Inventor： BECKMAN INSTRUMENTS, INC. ,  GIEBELER, Robert

IPC: G01N21/31

CPC classification number: G01N15/042 ,  G01J3/18 ,  G01J2003/1857 ,  G01N2015/045

Abstract: A centrifuge sample is optically scanned during centrifuging. The sample, placed in a centrifuge rotor having a cell with top and bottom windows, is spun until stratification and discrete layering occurs within the sample. Such layering occurs on layers that are precisely normal to the radius of the centrifuge at the point of sample and parallel to the spin axis of the centrifuge. A slit scanner having a slit normal to the sample plane transverses the width of the sample below the cell to detect with precision the precise location of the strata in the cell. A light source is reflected by a toroidal mirror having two radius of curvature. One radius of curvature is selected to collimate rays of light parallel to the layer of the sample. The mirror is ruled with respect to the other radius of curvature to chromatically classify light to preselect band width. Rotation of the mirror preserved collimation but enables selected scanning light frequency.

公开(公告)号：EP0340279B1

公开(公告)日：1992-08-26

申请号：EP88909862.0

申请日：1988-10-20

Applicant: BECKMAN INSTRUMENTS, INC.

Inventor： GIEBELER, Robert

IPC: G01N21/31

CPC classification number: G01N15/042 ,  G01J3/18 ,  G01J2003/1857 ,  G01N2015/045

Abstract: A centrifuge sample is optically scanned during centrifuging. The sample, placed in a centrifuge rotor having a cell with top and bottom windows, is spun until stratification and discrete layering occurs within the sample. Such layering occurs on layers that are precisely normal to the radius of the centrifuge at the point of sample and parallel to the spin axis of the centrifuge. A slit scanner having a slit normal to the sample plane transverses the width of the sample below the cell to detect with precision the precise location of the strata in the cell. A light source is reflected by a toroidal mirror having two radius of curvature. One radius of curvature is selected to collimate rays of light parallel to the layer of the sample. The mirror is ruled with respect to the other radius of curvature to chromatically classify light to preselect band width. Rotation of the mirror preserved collimation but enables selected scanning light frequency.

公开(公告)号：EP0340279A1

公开(公告)日：1989-11-08

申请号：EP88909862.0

申请日：1988-10-20

Applicant: BECKMAN INSTRUMENTS, INC.

Inventor： GIEBELER, Robert

IPC: G01J3 ,  G01N15 ,  G01N21

CPC classification number: G01N15/042 ,  G01J3/18 ,  G01J2003/1857 ,  G01N2015/045

Abstract: A centrifuge sample is optically scanned during centrifuging. The sample, placed in a centrifuge rotor having a cell with top and bottom windows, is spun until stratification and discrete layering occurs within the sample. Such layering oc­ curs on layers that are precisely normal to the radius of the centrifuge at the point of sample and parallel to the spin axis of the centrifuge. A slit scanner having a slit normal to the sample plane transverses the width of the sample below the cell to detect with precision the precise location of the strata in the cell. A light source is reflected by a toroidal mirror having two radius of curvature. One radius of curvature is selected to collimate rays of light parallel to the layer of the sample. The mirror is ruled with respect to the other radius of curvature to chromatically classify light to preselect band width. Rotation of the mirror preserved collimation but enables selected scanning light frequency.

公开(公告)号：TW201738585A

公开(公告)日：2017-11-01

申请号：TW106112306

申请日：2017-04-13

Applicant: 中央研究院 ,  ACADEMIA SINICA

Inventor： 魏培坤 ,  WEI, PEI KUEN ,  林恩宏 ,  LIN, EN HUNG ,  駱書成 ,  LO, SHU CHENG ,  李光立 ,  LEE, KUANG LI

IPC: G02B5/18 ,  G01J3/18

CPC classification number: G02B5/1861 ,  G01J3/0221 ,  G01J3/24 ,  G01J2003/1857 ,  G02B5/1852

Abstract: 一種曲面繞射光柵，包括一基板以及一金屬層。基板為一二維曲板結構，基板具有一第一表面、一第二表面及複數微結構。第一表面與第二表面對應設置，該些微結構設置於第二表面上，各該微結構為一鋸齒狀結構，且該微結構具有明確的閃耀角(blazed angle)。金屬層設置於該些微結構上，金屬層具有與該些微結構相對應的複數繞射結構。

Abstract in simplified Chinese: 一种曲面绕射光栅，包括一基板以及一金属层。基板为一二维曲板结构，基板具有一第一表面、一第二表面及复数微结构。第一表面与第二表面对应设置，该些微结构设置于第二表面上，各该微结构为一锯齿状结构，且该微结构具有明确的闪耀角(blazed angle)。金属层设置于该些微结构上，金属层具有与该些微结构相对应的复数绕射结构。

公开(公告)号：CN205879360U

公开(公告)日：2017-01-11

申请号：CN201620552586.7

申请日：2016-06-08

Applicant: 西克股份公司

Inventor： 尤利安·埃德勒 ,  帕斯卡尔·奥特维恩 ,  米夏埃尔·奥弗迪克 ,  马库斯·丹巴赫尔 ,  罗尔夫·迪施

IPC: G01J3/12 ,  G01J3/14 ,  G01J3/18 ,  G01J3/02 ,  G01N21/25

CPC classification number: G01J3/0205 ,  G01J3/18 ,  G01J3/42 ,  G01J2003/1857 ,  G01J2003/2813 ,  G01N21/31 ,  G01N2201/068

Abstract: 本实用新型涉及一种分光计，其包括多个色散光学元件，多个色散光学元件被排布为使得进入分光计的电磁辐射入射在色散光学元件上以在那里进行光谱分裂，其中，色散光学元件相对于它们的空间位置和/或它们的光谱分裂能力而彼此不同；以及其中色散光学元件被排布为使得通过电磁辐射的分裂的由各个色散光学元件生成的光谱在相同的方向上延伸以及横向于光谱分裂的该方向而彼此相邻；以及检测器，检测器在两个维度中是空间上可分辨的和位于分裂的电磁辐射的光路中以用于检测所述光谱的至少相应部分段。本实用新型还涉及一种分析设备，用于确定固体的、液体的或气体的物质或物质混合物的吸收性质，分析设备包括分光计、电磁辐射源、和光学测量路径。