OBJECT DETECTION SYSTEM
    11.
    发明申请
    OBJECT DETECTION SYSTEM 审中-公开
    对象检测系统

    公开(公告)号:WO1995014243A1

    公开(公告)日:1995-05-26

    申请号:PCT/US1993011231

    申请日:1993-11-16

    Abstract: A device (11) will detect man-made objects by using a polarizer (23). The polarizer (23) rotates about an axis in front of a lens array (19). The rotation of the polarizer alternately polarizes light received in proportion to the speed of rotation. This produces flashing in intensity for detecting the object as well as background rejection due to its lack of polarization. A man-made object (87) having both horizontal and vertical surfaces of a type that will reflect light that can be polarized will provide flashing through the lens array as the polarizer passes through horizontal and vertical position. On the other hand, backgrounds don't have polarized components and won't flash.

    Abstract translation: 设备(11)将通过使用偏振器(23)来检测人造物体。 偏振器(23)围绕透镜阵列(19)的前方的轴线旋转。 偏振器的旋转使得与旋转速度成比例地接收的光交替偏振。 由于其缺乏极化,这样会产生用于检测物体的强度的闪烁以及背景抑制。 具有能够反射可被偏振光的类型的水平和垂直表面的人造物体(87)将随着偏振片通过水平和垂直位置而在透镜阵列中闪烁。 另一方面,背景没有偏振分量,不会闪烁。

    偏光の測定
    12.
    发明专利
    偏光の測定 审中-公开

    公开(公告)号:JP2017523438A

    公开(公告)日:2017-08-17

    申请号:JP2017520017

    申请日:2015-06-26

    CPC classification number: G01J4/04 G01J2004/004

    Abstract: 電磁照射光の偏光を測定するための方法および装置が開示されている。この方法は、対象物体から受光した照射光の偏光状態を変調して変調強度照射光を生成するステップと、第1のゲーティング周波数で変調強度照射光への撮像デバイスの暴露を定期的にゲーティングすることによって変調強度照射光の強度を選択的に測定するステップと、測定された強度に応答して、受光した照射光の偏光パラメータを決定するステップと、複数の偏光パラメータを有する対象物体に対応する画像データを生成するステップとを含み、対象物体からの照射光は、第1の周波数に従って変調され、第1のゲーティング周波数は、少なくとも第1の周波数に関連付けられ、それと同期する。

    액정 위상지연기를 이용한 편광간 위상변화 검출방법
    13.
    发明授权
    액정 위상지연기를 이용한 편광간 위상변화 검출방법 有权
    使用液晶延迟器的极化光之间的相位变化检测方法

    公开(公告)号:KR101413998B1

    公开(公告)日:2014-07-04

    申请号:KR1020130059885

    申请日:2013-05-27

    Inventor: 홍성민 박순섭

    Abstract: A method of detecting a phase change between polarized lights using a liquid crystal retarder is disclosed. A method of detecting a phase change between polarized lights according to an embodiment of the present invention includes a light generation unit; a first polarizer to control a polarized state of an incident light from the light generation unit; an optical waveguide to generate phase change between two polarized lights of a light passing through the first polarizer by changing a surface material; a liquid crystal retarder to control a phase delay of the polarized light outputted from the optical waveguide by an electrical signal; a second polarizer to filter the light passing through the liquid crystal retarder; and a light detection unit to convert an intensity of the light passing through the second polarizer into an electrical signal. The method of detecting a phase change between polarized lights using the polarized interference surface detection apparatus includes a first step of setting the liquid crystal retarder so that an applied voltage is increased to a predetermined value in a unit of a first time; a second step of operating the light generation unit for a second time by driving the light generation unit, and measuring a detection signal generated during the second time in the unit of the first time by the light detection unit; a third step of calculating an average value after removing a maximum value and a minimum value of the detection signal of the light detection unit; a fourth step of reverse tracking the applied voltage value of the liquid crystal retarder when the average value of the detected signal is maximum; and a fifth step of calculating an amount of a phase transition of a liquid crystal of the liquid crystal retarder by calculating and processing the applied voltage of the liquid crystal retarder and the average value of the detected signal of the light detection unit.

    Abstract translation: 公开了使用液晶延迟器检测偏振光之间的相位变化的方法。 根据本发明的实施例的检测偏振光之间的相位变化的方法包括:光产生单元; 用于控制来自所述光产生单元的入射光的偏振状态的第一偏振器; 光波导,通过改变表面材料产生通过第一偏振器的光的两个偏振光之间的相位变化; 液晶延迟器,用于通过电信号控制从光波导输出的偏振光的相位延迟; 第二偏振器,用于过滤通过液晶延迟器的光; 以及光检测单元,用于将通过第二偏振器的光的强度转换为电信号。 使用偏振干涉面检测装置检测偏振光之间的相位变化的方法包括:将液晶延迟器设定为使得施加电压以第一次为单位增加到预定值的第一步骤; 第二步,通过驱动光产生单元第二次操作光产生单元,并且通过光检测单元测量在第一次单元中的第二时间内产生的检测信号; 在去除光检测单元的检测信号的最大值和最小值之后计算平均值的第三步骤; 当检测信号的平均值最大时,反向跟踪液晶延迟器的施加电压值的第四步骤; 以及第五步骤,通过计算和处理液晶延迟器的施加电压和光检测单元的检测信号的平均值来计算液晶延迟器的液晶的量的量。

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