Abstract:
A system for placing a sample at a predefined measurement location for measuring an optical property of that sample. The apparatus includes a measurement platform for supporting the sample at the measurement location, the measurement platform having an orifice therein beneath the measurement location, and a nozzle configured to retain the sample therein when a vacuum is applied to the nozzle. The sample is contacted by the nozzle, and a vacuum is applied to the nozzle so that the sample is retained therein by air pressure. The nozzle with the sample retained therein is then transported to the measurement location. The vacuum at the nozzle is disabled to release the sample from the nozzle, and a vacuum is applied to the orifice in the measurement platform so as to retain the sample on the measurement platform. The nozzle is then retracted away from the measurement platform.
Abstract:
Method includes positioning a first carrier assembly on a system stage. The carrier assembly includes a support frame having an inner frame edge that defines a window of the support frame. The first carrier assembly includes a first substrate that is positioned within the window and surrounded by the inner frame edge. The first substrate has a sample thereon. The method includes detecting optical signals from the sample of the first substrate. The method also includes replacing the first carrier assembly on the system stage with a second carrier assembly on the system stage. The second carrier assembly includes the support frame and an adapter plate held by the support frame. The second carrier assembly has a second substrate held by the adapter plate that has a sample thereon. The method also includes detecting optical signals from the sample of the second substrate
Abstract:
This invention concerns spectroscopy apparatus comprising a light source (101) arranged to generate a light profile (110) on a sample, a photodetector (103) having at least one photodetector element (104) for detecting characteristic light generated from interaction of the sample with light from the light source (101), a support (109) for supporting the sample, the support (109) movable relative to the light profile (110), and a processing unit (121). The processing unit (121) is arranged to associate a spectral value recorded by the photodetector element (104) at a particular time with a point on the sample predicted to have generated the characteristic light recorded by the photodetector element (104) at the particular time based on relative motion anticipated to have occurred between the support (109) and the light profile (110).
Abstract:
The present invention provides a substrate collecting device (1) that includes a stage (3) on which a sheet (11) is placed with a plurality of substrates (2) facing downward, an acquiring section (4) which carries out a predetermined operation on some of the substrates (2), which are disposed at predetermined positions, from above the stage (3) thereby to cause the substrates (2) to come off from the sheet (11) and fall, an observation section (5) and a collecting section (7) disposed below the stage (3), and a moving mechanism (8), which integrally moves the observation section (5) and the collecting section (7) in a horizontal direction. The moving mechanism (8) is capable of positioning the observation section (5) and the collecting section (7) at two positions at which the observation section (5) or the collecting section (7) is positioned substantially vertically below a predetermined position.
Abstract:
Improved gas leak detection from moving platforms is provided. Automatic horizontal spatial scale analysis can be performed in order to distinguish a leak from background levels of the measured gas. Source identification can be provided by using isotopic ratios and/or chemical tracers to distinguish gas leaks from other sources of the measured gas. Multi-point measurements combined with spatial analysis of the multi-point measurement results can provide leak source distance estimates. These methods can be practiced individually or in any combination.
Abstract:
A method and device are provided for determining the properties and evolution of gemstone by detecting the internal and external structure of the gemstone. The method and device are used to identify the size, location of impurities/defects in raw gemstone with the help of optimized spectroscopy scanning and are used for precise automatic evolution of gemstones and possibilities of final value of planned gemstone after remaining gemstone processing cycle.
Abstract:
The invention relates to a flow apparatus (1) for a spectrometer system, comprising a first optics element (2) that is optically coupleable to a spectrometer (4) and comprising a second optics element (3) that is optically coupleable to a light source (5), which are arranged at a distance from one another in the region of a measurement gap (6) through which a liquid (8) can flow, in the region of which a light beam (7) emerging from the second optics element (3) and reaching into the first optics element (2) is at least partly absorbable, wherein a through-flow amount of the liquid (8) through the measurement gap (6) is influenceable by a change in the distance (10) between the two optics elements (2, 3) in order to be able to use the spectrometer system with a multiplicity of different samples. The invention also relates to a method for operating such a flow apparatus (1).