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公开(公告)号：JPH01287444A
公开(公告)日：1989-11-20
申请号：JP11719788
申请日：1988-05-13
Applicant: MINOLTA CAMERA KK
Inventor： KAMEZAWA HITOSHI
Abstract: PURPOSE:To find the concentration of a specific material in a sample with high accuracy by finding the peak wavelength of 2nd light source light after it shifts owing to temperature variation and then correcting an absorbance difference with the coefficient of absorbance of the specific material corresponding to the peak wavelength. CONSTITUTION:A light receiving element 6 detects the quantities of light beams which are emitted by a red light emitting diode 4 and an infrared-light emitting diode 5 and transmitted through the sample and they are inputted to a control arithmetic circuit 21. The control arithmetic circuit 21 calculates the difference in absorbance between both light beams from the measured values. Further, a temperature measuring circuit 23 measures the temperature variation of both light emitting diodes 4 and 5 and the light receiving element 6 at the time of measurement for calibration. The control arithmetic circuit 21 finds the peak wavelength of the infrared-light emitting diode 5 after it shifts owing to the measured temperature variation and corrects the calculated difference in absorbance with the absorbance coefficient of the specific material corresponding to the found peak wavelength. Thus, the concentration of the specific material in the sample is found with high accuracy.
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公开(公告)号：JPS63314423A
公开(公告)日：1988-12-22
申请号：JP14320088
申请日：1988-06-09
Applicant: SHIMADZU CORP
Inventor： FUKUMA TOSHIAKI , ICHIKAWA TETSUO
Abstract: PURPOSE:To enable the setting of a wavelength scan range of a sample beam irrelevant to an intensity ratio between two luminous fluxes with respective wavelengths, by inverting a matrix-numerator relationship in the computation of the intensity ratio of two beams when an output of a photometry circuit exceeds a fixed value. CONSTITUTION:A photometry circuit which outputs an intensity ratio between reference and sample transmission beams is made switchable in the matrix between the reference beam and the sample beam. In a base line memory mode, when an output of the photometry circuit is about to exceed a dynamic range thereof while the wavelength scanning of the sample beam is performed, a matrix-numerator relationship between the reference and sample beams is inverted to store a base line data into a second memory M. The wavelength of the sample beam during the inversion of the matrix- numerator relationship is stored into a first memory (m) and in an analysis mode, while the wavelength scanning of the sample beam is performed, with the passage through a wavelength stored in the first memory (m), the matrix-numerator relationship is inverted between the reference and sample beams in the photometry circuit. At the same time, an output of the photometry circuit undergoes a computation processing X, thereby obtaining a correct transmissivity.
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公开(公告)号：JPS63313024A
公开(公告)日：1988-12-21
申请号：JP14397687
申请日：1987-06-08
Applicant: KOLLMORGEN TECH CORP
Inventor： HARORUDO BAN AAKEN , UIRIAMU ERU UIIBAA
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Patent Agency Ranking
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公开(公告)号：JPS6333658B2
公开(公告)日：1988-07-06
申请号：JP15660981
申请日：1981-09-30
Applicant: SHIMADZU CORP
Inventor： IWAHASHI KENJI
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公开(公告)号：JPS6381226A
公开(公告)日：1988-04-12
申请号：JP18470187
申请日：1987-07-25
Applicant: ARESU SERONO RES & DEV LTD PAA
Inventor： KUREEGU JIYOOJI SOOYAAZU , ROORENSU JIYON ROBINSON
Abstract: A method and apparatus for analysing the spectrum of light reflected by a reflecting structure (24) in which the effect upon the analysis results of variation in the angle between the reflecting structure and the incident beam (22) is minimised. The method and apparatus may utilise a dispersive element (26) constructed and arranged so as to minimise the effect of the variations. The method and apparatus may also utilise a calibration technique in which light with a known spectrum is reflected off the reflecting structure and analysed so that compensation may be made for the effect of the variation.
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公开(公告)号：JPS62238426A
公开(公告)日：1987-10-19
申请号：JP8164586
申请日：1986-04-09
Applicant: HITACHI LTD
Inventor： TAKAHATA FUJIYA
IPC: G01J3/427
Abstract: PURPOSE:To reduce the effect of the coexisting component in a specimen to be measured, by a method wherein the light emitted from a single white light source is taken out from two different directions and one white light is allowed to irradiate a specimen container as it is while the other white light is allowed to irradiate said container through a spectroscopic means. CONSTITUTION:The light emitted from a light source 1 is taken out from two different directions. One white light is condensed by a condensing mirror 2 and subsequently spectrally diffracted to monochromatic light by a diffraction lattice 3 to irradiate a specimen container 7 as exciting light. Excited fluorescence is guided to a fluorescent side spectrometer 3 to be spectrally diffracted to monochromatic light which is, in turn, detected as fluorescent intensity by a detector 8 constituted of a plurality of detection elements. The other white light is guided so as to irradiate the container 7 through a flat mirror 4. The specific wavelength component of the white light is absorbed by a specimen and transmitted light is guided to the fluorescent side spectrometer and spectrally diffracted to monochromatic light to be detected by the detector 8. By this method, the effect of the coexisting component in the specimen to be measured is reduced to enable the removal of a measuring error.
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公开(公告)号：JPS6219946Y2
公开(公告)日：1987-05-21
申请号：JP5729679
申请日：1979-04-26
IPC: G01N21/27 , G01J3/18 , G01J3/427 , G01N33/483 , G01N33/50
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