Abstract:
Disclosed herein is a method of analyzing spectrum using multi-slit member and multi-channel spectrograph using the method. The multi-channel spectrograph includes a focusing lens (12a) for focusing the focus of an objective light (2) generated in a light source (4) and passed through a specimen (3). A slit unit passes the objective light focused by the focusing lens (12a) through at least one slit formed therein. A concave grating (16) diffracts the objective light (2) passed through the slit unit. A detector unit detects the objective light diffracted by the concave grating (16). The slit unit is a multi-slit member (14) with a plurality of slits (14a). The objective light (2) diffracted by the concave grating (16) and directed toward the detector unit is moved by the movement of the multi-slit member (14).
Abstract:
A beam of visible or UV light is directed by a sliding mirror (20) onto a diffraction grating (33) through each of a plurality of collimators (29 to 32) in turn. At each turn a photodiode array (35) measures the spectrum of a corresponding portion of the range of frequencies over which the instrument operates. A set of broad-band band-pass filters (16) may eliminate undesired frequencies at each turn.
Abstract:
A spectrometer with interferential selective amplitude modulation comprises, located consecutively along the light beam, a collimating means, a diffraction grating (7) and an additional mirror (10) oriented perpendicularly in relation to each other, two scanning mirrors (14, 15) on a common support (13) and a recording device (27), which comprises a means for compensation of the phase distortions. A plane-parallel plate (16) is placed between the scanning mirror (15) and the support (13), of which the thickness ''h'' corresponds to the following relationship: l
Abstract:
Systems and methods of the present disclosure are directed to optics used in absorption cell spectrometers. The absorption cell includes a plurality of mirrors arranged in a manner such that a detection light traverses multiple passes through the fluid within the absorption cell. In some implementations, the detection light is reflected by the plurality of mirrors to form optical paths in more than one plane. In some implementations, the orientation of the mirrors are aligned with specific orientations to provide the desired optical path to the detection light. In one or more embodiments, an alignment apparatus can be used to pre-align the mirrors before they are placed within the absorption cell. The alignment apparatus includes an aperture plate and an adjustable mount to mount one or more mirrors. The mirrors are aligned based on reflected images on the aperture plate laser light incident on the mirrors.
Abstract:
실시 예에 의한 광 배열 도파로 격자형 멀티플렉서 및 디멀티플렉서는, 제1 기판과, 제1 기판 위에 제1 기판의 두께 방향인 수직 방향으로 중첩되어 배치된 복수의 제1 도파로와, 복수의 제1 도파로 중 제1 기판과 가장 가까운 제1-1 도파로와 제1 기판 사이에 배치된 제1-1 클래딩층과, 복수의 제1 도파로 사이에 배치된 제1-2 클래딩층 및 복수의 제1 도파로 중 제1 기판과 가장 먼 제1-2 도파로 위에 배치된 제1-3 클래딩층을 포함한다.
Abstract:
A system for analyzing in-elastic scattered electromagnetic radiation from an object being irradiated by electromagnetic radiation is provided. The system comprises a tunable lens assembly having a tunable lens provided in the beam path between an electromagnetic radiation source and the object and arranged to project a beam of electromagnetic radiation emitted from the electromagnetic radiation source onto an area of the object and receive and collimate the in-elastic scattered electromagnetic radiation from the object. Based on detected electromagnetic radiation a control unit is capable making a decision to change the operational settings of the tunable lens.
Abstract:
The present invention provides a spectrometer, comprising: an inlet for the receipt of incident light; an optical path for transmitting the incident light from the inlet to an analysis plane; a focusing element located along the optical path, wherein the spectrometer has an in-focus position in which a focal point of the spectrometer and the analysis plane coincide; and a controller adapted in use, when a removable light disperser is placed along the optical path, to cause the spectrometer to be in the in- focus position by controlling the position of the focusing element relative to the analysis plane. The spectrometer is used in the analysis of light from a light source and, due to the ability of the controller to manage the focus point by way of moving the focusing element, the spectrometer is able to bring itself into an in-focus configuration without the need for a user to intervene.
Abstract:
The present application discloses a system comprising a compact curved grating (CCG) and its associated compact curved grating spectrometer (CCGS) or compact curved grating wavelength multiplexer/demultiplexer (WMDM) module and a method for making the same. The system is capable of achieving a very small (resolution vs. size) RS factor. The location; of the entrance slit and detector can be adjusted in order to have the best performance for a particular design goal. The initial groove spacing is calculated using a prescribed formula dependent on operation wavelength. The location of the grooves is calculated based on two conditions. The first one being that the path-difference between adjacent grooves should be ah integral multiple of the wavelength in the medium to achieve aberration-free grating focusing at the detector or a first anchor output slit even with large beam diffraction angle from the entrance slit or input slit, the second one being specific for a particular design goal of a curved-grating spectrometer.
Abstract:
The present invention provides a spectrometer, comprising: an inlet for the receipt of incident light; an optical path for transmitting the incident light from the inlet to an analysis plane; a focusing element located along the optical path, wherein the spectrometer has an in-focus position in which a focal point of the spectrometer and the analysis plane coincide; and a controller adapted in use, when a removable light disperser is placed along the optical path, to cause the spectrometer to be in the in- focus position by controlling the position of the focusing element relative to the analysis plane. The spectrometer is used in the analysis of light from a light source and, due to the ability of the controller to manage the focus point by way of moving the focusing element, the spectrometer is able to bring itself into an in-focus configuration without the need for a user to intervene.
Abstract:
Techniques and mechanisms for a monolithic photonic integrated circuit (PIC) to provide spectrometry functionality. In an embodiment, the PIC comprises a photonic device, a first waveguide and a second waveguide, wherein one of the first waveguide and the second waveguide includes a released portion which is free to move relative to a substrate of the PIC. During a metering cycle to evaluate a material under test, control logic operates an actuator to successively configure a plurality of positions of the released portion relative to the photonic device. In another embodiment, light from the first waveguide is variously diffracted by a grating of the photonic device during the metering cycle, where portions of the light are directed into the second waveguide. Different wavelengths of light diffracted into the second waveguide may be successively detected, for different positions of the released portion, to determine spectrometric measurements over a range of wavelength.