公开(公告)号：US20230225618A1

公开(公告)日：2023-07-20

申请号：US18069791

申请日：2022-12-21

Applicant: ILLUMISONICS INC.

Inventor： Parsin HAJI REZA ,  Kevan BELL

IPC: A61B5/00 ,  G01N21/17 ,  A61B1/00 ,  A61B5/145 ,  A61B1/06 ,  G01N21/64

CPC classification number: A61B5/0095 ,  G01N21/1702 ,  A61B1/00004 ,  A61B5/0035 ,  A61B5/14532 ,  A61B5/14542 ,  A61B1/0615 ,  A61B1/00172 ,  G01N21/64 ,  G01N2021/1706 ,  G01N2201/0683 ,  G01N2201/08 ,  A61B1/00117 ,  A61B5/02042

Abstract: A photoacoustic remote sensing system for imaging a subsurface structure in a sample, comprising exactly one laser source configured to generate a pulsed or intensity-modulated excitation beam configured to generate ultrasonic pressure signals in the sample at an excitation location, and an interrogation beam incident on the sample at the excitation location, a portion of the interrogation beam returning from the sample that is indicative of the generated ultrasonic pressure signals, an optical system configured to focus the excitation beam and the interrogation beam below a surface of the sample, a detector configured to detect the returning portion of the interrogation beam, and a processor configured to calculate an image of the sample based on a detected intensity modulation of the returning portion of the interrogation beam from below the surface of the sample.

公开(公告)号：US20180188189A1

公开(公告)日：2018-07-05

申请号：US15703541

申请日：2017-09-13

Applicant: LG Display Co., Ltd.

Inventor： SeokJu HWANG

IPC: G01N21/958 ,  G01N21/21 ,  G01B11/06 ,  G01N21/84

CPC classification number: G01N21/958 ,  G01B11/06 ,  G01B11/0625 ,  G01B11/0641 ,  G01N21/21 ,  G01N21/8422 ,  G01N21/95 ,  G01N2021/1748 ,  G01N2021/8427 ,  G01N2021/8433 ,  G01N2021/8848 ,  G01N2201/0683 ,  G01N2201/101

Abstract: Disclosed herein is a method for inspecting a transparent film. The method comprises irradiating an inspection target with light using a polarizer, receiving light that is reflected by the inspection target and passes through an analyzer by a line scan camera, synthesizing an amplitude and a phase of wavelength of the light into an intensity of light, comparing the intensity of the light with predetermined intensities of light for inspection targets having different thicknesses; and detecting a defect of the inspection target based on the compared intensity with the predetermined intensities. It can be determined whether there is a transparent film, and the thickness of the transparent film can be measured in a large area. The inspection is carried out in real-time after the transparent film is formed, such that if a defect is generated, it can be fed back immediately to thereby reduce defects. In this case, the processing cost can be saved.

公开(公告)号：US09964486B2

公开(公告)日：2018-05-08

申请号：US15317194

申请日：2015-03-25

Applicant: AMRONA AG

Inventor： Andreas Siemens

IPC: G01N21/00 ,  G01N21/53 ,  G08B17/107 ,  G08B17/113 ,  G01N21/47

CPC classification number: G01N21/53 ,  G01N2021/473 ,  G01N2201/062 ,  G01N2201/0642 ,  G01N2201/0683 ,  G08B17/107 ,  G08B17/113

Abstract: An assembly (100) for attenuating the impinging light of a beam of radiation of finite expansion with the objective of realizing reliable attenuation particularly of directly impinging light comprises a light source (10) for producing a beam of unpolarized light, preferably unpolarized monochromatic light, a useful light region (50) through which the unpolarized light passes and preferably passes through in a straight line from the light source (10) as well as an absorption device (30) arranged downstream of the useful light region (50) and preferably downstream in the direction of the direct beam radiation for at least partly absorbing impinging light, wherein the absorption device (30) comprises at least one polarization device (31, 32) arranged in the direction of the light beam.

公开(公告)号：US20180073979A1

公开(公告)日：2018-03-15

申请号：US15459393

申请日：2017-03-15

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Seongkeun CHO ,  Sang-woo BAE ,  Won-don JOO ,  Sang-don JANG

IPC: G01N21/21 ,  G01N21/95 ,  G01N21/88 ,  H04N5/225 ,  H04N5/247

CPC classification number: G01N21/211 ,  G01N21/8806 ,  G01N21/9501 ,  G01N2021/8848 ,  G01N2201/0683 ,  H04N5/2256 ,  H04N5/247

Abstract: Provided are a defect inspection system and a method of inspecting a defect, by which a defect in an inspection target may be precisely detected at a high speed. The defect inspection system includes a light source, a linear polarizer to linearly polarize light from the light source, a compensator to circularly or elliptically polarize light from the linear polarizer, a stage on which an inspection target is located, a polarization analyzer to selectively transmit light reflected by the inspection target, and a first camera to collect light from the polarization analyzer. Light transmitted through the compensator is obliquely incident to the inspection target, and reference light, which corresponds to light reflected in a defectless state, from among the light reflected by the inspection target, is blocked by the polarization analyzer.

公开(公告)号：US09909984B2

公开(公告)日：2018-03-06

申请号：US15019974

申请日：2016-02-10

Applicant: Tian Yang

Inventor： Tian Yang ,  Xiaolong He

IPC: G01N21/49 ,  G02B6/28 ,  G01N33/487 ,  G02B6/26 ,  G01N33/497

CPC classification number: G01N21/49 ,  G01N21/554 ,  G01N21/7703 ,  G01N33/487 ,  G01N33/497 ,  G01N2021/7773 ,  G01N2201/06113 ,  G01N2201/0621 ,  G01N2201/0683 ,  G01N2201/0846 ,  G02B6/262 ,  G02B6/2808 ,  G02B6/354 ,  G02B6/3624

Abstract: The present invention provides a multichannel label-free biosensing fiber-optic system, which comprises one or more light sources coupled into optical fibers, one or more optical fiber circuits for performing coupling or/and directional transmission of optical-fiber guided lightwaves, one or more optical-fiber-input and optical-fiber-output optical switches, a plurality of optical fibers provided with label-free optical sensing elements working in the reflection manner on the optical fiber ends, and the light detection parts, wherein the optical-fiber-input and optical-fiber-output optical switch is provided with a plurality of outputs and/or a plurality of inputs, and with the plurality of outputs and/or plurality of inputs, by the switching function, the reflected light from the label-free optical sensing elements working in the reflection manner on the designated optical fiber ends is received by the light detection part, so that multichannel sensing is realized.

公开(公告)号：US09903861B2

公开(公告)日：2018-02-27

申请号：US14894452

申请日：2014-05-30

Applicant: OSAKA PREFECTURE UNIVERSITY PUBLIC CORPORATION

Inventor： Takuya Iida ,  Shiho Tokonami

IPC: G01N21/21 ,  G01N33/543 ,  G01N21/552 ,  G01N21/65 ,  G01N33/53 ,  G01N33/553 ,  C12Q1/68

CPC classification number: G01N33/54346 ,  C12Q1/6834 ,  C12Q2563/155 ,  C12Q2565/628 ,  G01N21/21 ,  G01N21/554 ,  G01N21/658 ,  G01N33/5308 ,  G01N33/553 ,  G01N2201/061 ,  G01N2201/0683

Abstract: A detection device detects an analyte that may be contained in a specimen. The detection device includes a plurality of gold nanoparticles, an optical trapping light source, an illumination light source, an objective lens, an image pick-up device, and a computation unit. The plurality of gold nanoparticles are each modified with a probe DNA allowing the analyte to specifically adhere thereto. The optical trapping light source emits polarized light for assembling the plurality of gold nanoparticles together. The objective lens focuses and introduces the polarized light into a liquid containing a specimen and the plurality of gold nanoparticles. The image pick-up device receives light from the liquid. The computation unit detects an analyte based on a signal received from the image pick-up device.

公开(公告)号：US09897543B2

公开(公告)日：2018-02-20

申请号：US14364574

申请日：2012-08-06

Applicant: Anjan Kr. Dasgupta ,  Sarita Roy

Inventor： Anjan Kr. Dasgupta ,  Sarita Roy

IPC: G01N21/21 ,  G01N21/64 ,  G01N33/15 ,  G01N33/58 ,  B01D59/00 ,  G01N15/14 ,  G01N15/00

CPC classification number: G01N21/64 ,  B01D59/00 ,  G01N15/1459 ,  G01N21/21 ,  G01N21/6445 ,  G01N21/6486 ,  G01N33/15 ,  G01N33/582 ,  G01N2015/0038 ,  G01N2015/149 ,  G01N2201/0683

Abstract: A technique for determining whether or not a fluorescent material exhibits a directionally dependent property, such as anisotropy or chirality, involves illuminating the particle at its excitation wavelength to stimulate fluorescent emission at both a full-frequency (fundamental) wavelength and a half-frequency wavelength. The ratio of the full-frequency signal strength to the half-frequency signal strength provides an indication of the sample's directionally dependent property. This half-frequency spectral analysis can be used to sort anisotropic particles suspended in fluid flowing through a flow cytometer. For instance, the present technique may be used to separate racemic mixtures of chiral enantiomers of cells, pharmaceutical compounds, and other samples.

公开(公告)号：US09810633B2

公开(公告)日：2017-11-07

申请号：US15047563

申请日：2016-02-18

Applicant: Seagate Technology LLC

Inventor： Joachim Walter Ahner ,  David M. Tung ,  Samuel Kah Hean Wong ,  Henry Luis Lott ,  Stephen Keith McLaurin ,  Maissarath Nassirou ,  Florin Zavaliche

IPC: G01N21/64 ,  G01N21/88 ,  G01N21/95 ,  G01N21/63 ,  G01N21/47 ,  G01N21/94

CPC classification number: G01N21/6456 ,  G01N21/47 ,  G01N21/63 ,  G01N21/64 ,  G01N21/8851 ,  G01N21/94 ,  G01N21/95 ,  G01N21/9501 ,  G01N21/9506 ,  G01N2021/8864 ,  G01N2201/06153 ,  G01N2201/0683

Abstract: Provided herein is an apparatus, including a photon emitter configured to emit photons onto a surface of an article, a photon detector array configured to receive photons from surface features of the article; and a processing means configured for processing photon-detector-array signals corresponding to photons scattered from the surface features and photons fluoresced from the surface features, wherein the processing means is further configured for classifying the surface features of the article.

公开(公告)号：US09778245B2

公开(公告)日：2017-10-03

申请号：US15425729

申请日：2017-02-06

Applicant: Case Western Reserve University

Inventor： Brian T. Grimberg ,  Robert Deissler ,  William Condit ,  Robert Brown ,  Jason Jones ,  Richard Bihary

IPC: G01N33/48 ,  G01N33/49

CPC classification number: G01N33/48 ,  G01N1/28 ,  G01N21/21 ,  G01N21/59 ,  G01N33/49 ,  G01N2201/06113 ,  G01N2201/0683

Abstract: A diagnostic device is provided that comprises a light source for transmitting a light beam through a blood sample to a light detector, and a permanent magnet, wherein one of the permanent magnet and blood sample is automatically movable relative to the other between a “HIGH” magnetic state position and a “LOW” magnetic state position, such that a substantially high magnetic field is applied to the blood sample causing any hemozoin in the blood sample to tend toward perpendicular orientation to the substantially magnetic field and the suppression, or enhancement of light based on its polarization, and a zero-to-near-zero magnetic field is applied to the blood sample causing the randomization of any hemozoin in the blood sample and a baseline amount of light to pass through the blood sample in the “LOW” magnetic state position.

公开(公告)号：US20170276613A1

公开(公告)日：2017-09-28

申请号：US15468608

申请日：2017-03-24

Applicant: KLA-Tencor Corporation

Inventor： Sheng Liu ,  Guoheng Zhao

IPC: G01N21/88 ,  G01N21/95 ,  G01N21/21

CPC classification number: G01N21/8806 ,  G01N21/21 ,  G01N21/9501 ,  G01N2021/8848 ,  G01N2201/0683

Abstract: Disclosed are methods and apparatus for inspecting a semiconductor sample. This system comprises an illumination optics subsystem for generating and directing an incident beam towards a defect on a surface of a wafer. The illumination optics subsystem includes a light source for generating the incident beam and one or more polarization components for adjusting a ratio and/or a phase difference for the incident beam's electric field components. The system further includes a collection optics subsystem for collecting scattered light from the defect and/or surface in response to the incident beam, and the collection optics subsystem comprises an adjustable aperture at the pupil plane, followed by a rotatable waveplate for adjusting a phase difference of electric field components of the collected scattered light, followed by a rotatable analyzer. The system also includes a controller that is configured for (i) selecting a polarization of the incident beam, (ii) obtaining a defect scattering map, (iii) obtaining a surface scattering map, and (iv) determining a configuration of the one or more polarization components, aperture mask, and rotatable ¼ waveplate, and analyzer based on analysis of the defect and surface scattering map so as to maximize a defect signal to noise ratio,