INTEGRATED PHOTONIC DEVICE WITH IMPROVED OPTICAL COUPLING

    公开(公告)号:US20220091330A1

    公开(公告)日:2022-03-24

    申请号:US17540626

    申请日:2021-12-02

    Abstract: A three-dimensional photonic integrated structure includes a first semiconductor substrate and a second semiconductor substrate. The first substrate incorporates a first waveguide and the second semiconductor substrate incorporates a second waveguide. An intermediate region located between the two substrates is formed by a one dielectric layer. The second substrate further includes an optical coupler configured for receiving a light signal. The first substrate and dielectric layer form a reflective element located below and opposite the grating coupler in order to reflect at least one part of the light signal.

    PHOTODIODE INSULATION
    254.
    发明申请

    公开(公告)号:US20220005850A1

    公开(公告)日:2022-01-06

    申请号:US17363345

    申请日:2021-06-30

    Abstract: An optoelectronic device includes a photodiode. At least a portion of an active area of the photodiode is separated from a neighboring photodiode by a first wall including a conductive core and an insulating sheath and by a second optical insulation wall. The first wall and second optical insulation wall further extend parallel to each other and separate the active area from a memory area of the photodiode.

    CAPACITIVE OPTICAL MODULATOR
    255.
    发明申请

    公开(公告)号:US20220004076A1

    公开(公告)日:2022-01-06

    申请号:US17476668

    申请日:2021-09-16

    Abstract: A capacitive electro-optical modulator includes a silicon layer having a cavity having sidewalls and a floor. A germanium or silicon-germanium strip overlies the silicon layer within the cavity. A silicon strip overlies the germanium or silicon-germanium strip within the cavity. The silicon strip is wider than the germanium or silicon-germanium strip. An insulator fills the cavity laterally adjacent the germanium or silicon-germanium strip and the silicon strip and extending between the sidewalls of the cavity. An upper insulating layer overlies the silicon strip and the insulator. A layer of III-V material overlies the upper insulating layer. The layer of III-V material formed as a third strip is arranged facing the silicon strip and separated therefrom by a portion of the upper insulating layer.

    IONIZING RADIATION DETECTOR
    258.
    发明申请

    公开(公告)号:US20210382189A1

    公开(公告)日:2021-12-09

    申请号:US17408679

    申请日:2021-08-23

    Abstract: A diode and a transistor are connected in parallel. The transistor is located on a first doped region forming a PN junction of the diode with a second doped region located under the first region. The circuit functions as an ionizing radiation detection cell by generating a current through the PN junction which changes by a voltage generated across the transistor. This change in voltage is compared to a threshold to detect the ionizing radiation.

    Low-noise wide dynamic range image sensor

    公开(公告)号:US11195872B2

    公开(公告)日:2021-12-07

    申请号:US16547231

    申请日:2019-08-21

    Abstract: A semiconductor image sensor includes a plurality of pixels. Each pixel of the sensor includes a semiconductor substrate having opposite front and back sides and laterally delimited by a first insulating wall including a first conductive core insulated from the substrate, electron-hole pairs being capable of forming in the substrate due to a back-side illumination. A circuit is configured to maintain, during a first phase in a first operating mode, the first conductive core at a first potential and to maintain, during at least a portion of the first phase in a second operating mode, the first conductive core at a second potential different from the first potential.

    INTEGRATED OPTICAL SENSOR WITH PINNED PHOTODIODES

    公开(公告)号:US20210376170A1

    公开(公告)日:2021-12-02

    申请号:US17324619

    申请日:2021-05-19

    Inventor: Didier DUTARTRE

    Abstract: An integrated optical sensor is formed by a pinned photodiode. A semiconductor substrate includes a first semiconductor region having a first type of conductivity located between a second semiconductor region having a second type of conductivity opposite to the first type one and a third semiconductor region having the second type of conductivity. The third semiconductor region is thicker, less doped and located deeper in the substrate than the second semiconductor region. The third semiconductor region includes both silicon and germanium. In one implementation, the germanium within the third semiconductor region has at least one concentration gradient. In another implementation, the germanium concentration within the third semiconductor region is substantially constant.

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