公开(公告)号：US20130031796A1

公开(公告)日：2013-02-07

申请号：US13548608

申请日：2012-07-13

Applicant: Wally Pipp

Inventor： Wally Pipp

IPC: G01B3/00

CPC classification number: G01B5/025 ,  G01B5/201

Abstract: A circumference measuring gauge for measuring an item is shown and described. The circumference measuring gauge may include a base, a fixture displaceably positioned on the base, the fixture capable of securing the item, and a measuring member having first and second ends, the first end fixed to the base and the second end fixed to the fixture, where the measuring member circumscribes the item. The circumference measuring gauge may also include a biasing member secured to the fixture, wherein the biasing member applies a predetermined force to the measuring member.

Abstract translation: 示出并描述了用于测量物品的圆周测量计。 圆周测量计可以包括基座，可移动地定位在基座上的固定装置，能够固定物品的固定装置，以及具有第一和第二端的测量构件，第一端固定到基座，第二端固定到固定装置 ，其中测量构件限定该物品。 圆周测量计还可以包括固定到固定装置的偏置构件，其中偏置构件向测量构件施加预定的力。

公开(公告)号：US08356417B2

公开(公告)日：2013-01-22

申请号：US13009227

申请日：2011-01-19

Applicant: Takeshi Hagino ,  Yuichiro Yokoyama

Inventor： Takeshi Hagino ,  Yuichiro Yokoyama

IPC: G01B7/28 ,  G01B5/20

CPC classification number: G01G21/20 ,  G01B5/008 ,  G01B5/201

Abstract: A spherical-form measuring apparatus which efficiently measures the sphericity and the form of a sphere to be measured with use of the mechanism of a roundness measuring machine, including a turntable, a probe for measuring a contour of a sphere to be measured on an equatorial plane parallel to a surface of the turntable, associated with rotation of the turntable, and a holding unit mounted on the turntable, for holding the sphere to be measured, wherein the holding unit positions the center of the sphere to be measured on a rotational axis of the turntable, and holds the sphere to be measured so that the sphere is rotatable about an inclined axis which passes the center of the sphere and is inclined at the angle in the range of −5 degrees-+5 degrees centered on the angle where the sine is 1√3 (1 divided by the square root of 3) against the surface of the turntable.

Abstract translation: 一种球形测量装置，其使用圆度测量机的机构有效地测量球体的球形度和形状，所述圆度测量机包括转台，用于测量赤道测量球体轮廓的探针 平行于转台的表面的平面与转盘的旋转相关联，以及安装在转台上的保持单元，用于保持要测量的球体，其中保持单元将待测球体的中心定位在旋转轴线上 并且保持要测量的球体，使得球体可以围绕通过球体中心的倾斜轴线旋转，并且以-5度-5度的范围内的角度倾斜，该角度以 正弦为转盘表面的1√3（1除以3的平方根）。

公开(公告)号：US08161657B2

公开(公告)日：2012-04-24

申请号：US12909293

申请日：2010-10-21

Applicant: Takeshi Yamamoto ,  Atsushi Shimaoka

Inventor： Takeshi Yamamoto ,  Atsushi Shimaoka

IPC: G01B7/28

CPC classification number: G01B5/201 ,  G01B3/008 ,  G01B5/016

Abstract: A position controller provided in a controlling module obtains a difference between a detected rotation angle of a stylus and a target rotation angle, and determines an energization amount to a voice coil motor so that the difference becomes zero. A variable limiter circuit limits a driving current, which is supplied from the position controller, to a limitation value so that a rotation force applied to the stylus from the voice coil motor is constant. A target rotation angle issuing portion switches over the target rotation angle based on a relative position of a contact portion of the stylus.

Abstract translation: 设置在控制模块中的位置控制器获得检测到的触针的旋转角度和目标旋转角度之间的差异，并且确定对音圈电动机的通电量，使得差值变为零。 可变限幅器电路限制从位置控制器提供的驱动电流到限制值，使得从音圈电机施加到触控笔的旋转力是恒定的。 目标旋转角度发出部分基于触针的接触部分的相对位置切换目标旋转角度。

公开(公告)号：US08051576B2

公开(公告)日：2011-11-08

申请号：US12299992

申请日：2007-05-01

Applicant: Ivor McDonnell ,  Jeremy Ayres

Inventor： Ivor McDonnell ,  Jeremy Ayres

IPC: G01B5/004 ,  G01B7/28

CPC classification number: G01B5/201

Abstract: An attitude arm mounted to a support arm is rotatable about a pivot. The attitude arm holds a stylus gauge, which generates a signal representing deflection of the stylus in a measurement direction as the stylus follows a surface of a workpiece rotated on a turntable. An attitude switching mechanism allows switching between a first stylus attitude generally aligned with the turntable spindle axis and a second stylus attitude generally aligned perpendicular to the turntable spindle axis. To enable alignment of the measurement direction with the spindle axis, first and second adjusters enable the stylus tip to be moved perpendicular to the spindle axis and the measurement direction when in the first and second stylus attitudes, respectively. An orientation mechanism is provided to rotate the measurement direction of the stylus. A stylus tilt mechanism is provided to tilt the stylus about a tilt axis parallel with the measurement direction.

Abstract translation: 安装到支撑臂的姿态臂可绕枢轴旋转。 姿态臂保持一个触针计，当触笔跟随在转台上旋转的工件的表面时，它产生一个表示测量方向上的触针偏转的信号。 姿态切换机构允许在与转盘主轴轴线大致对准的第一触针姿态与大致垂直于转盘主轴​​轴线对准的第二触针姿态之间进行切换。 为了使测量方向与主轴轴线对准，第一和第二调节器分别使得触针尖端能够在第一和第二触针姿态下分别垂直于主轴轴线和测量方向移动。 提供定向机构以旋转触针的测量方向。 提供触针倾斜机构以使测针绕与测量方向平行的倾斜轴倾斜。

公开(公告)号：US20100251559A1

公开(公告)日：2010-10-07

申请号：US12648042

申请日：2009-12-28

Applicant: ZIH-WEI WANG

Inventor： ZIH-WEI WANG

IPC: G01B5/20

CPC classification number: G01B5/201

Abstract: An exemplary surface geometry characters measuring gauge includes a chassis, a spindle, a locating assembly, and a micrometer. The spindle is rotatably mounted on a surface of the chassis. The locating assembly is mounted on the spindle and structured and arranged for fastening a workpiece on the spindle. The micrometer is attached on the chassis corresponding to and spaced from the spindle. The micrometer is configured for contacting a surface of the workpiece and measuring one or more surface geometry characters of the workpiece.

Abstract translation: 示例性表面几何字符测量计包括底盘，主轴，定位组件和千分尺。 主轴可旋转地安装在底盘的表面上。 定位组件安装在主轴上并构造和布置成用于将工件紧固在主轴上。 千分尺安装在与主轴对应并与主轴相隔的底盘上。 千分尺被配置为接触工件的表面并测量工件的一个或多个表面几何特征。

公开(公告)号：US07748134B1

公开(公告)日：2010-07-06

申请号：US12399989

申请日：2009-03-09

Applicant: Yao-Chung Wang

Inventor： Yao-Chung Wang

IPC: G01B5/20

CPC classification number: G01B5/201

Abstract: A measuring device includes a base, a holding member mounted to the base and having a notch for holding a cylinder, a guide rod connected to the base and defining an axial direction parallel to an axial direction of the cylinder, and a gauge mounted with the guide rod and defining a measuring direction perpendicular to the axial direction of the cylinder. As a result, the measuring device of the present invention has the advantage of proving a simple way to measure the roundness of the cylinder.

Abstract translation: 一种测量装置，包括基座，安装到基座上的保持构件，具有用于保持气缸的凹口，连接到基座并限定与气缸的轴向方向平行的轴向方向的导杆，以及安装有 导杆，并限定垂直于气缸轴向的测量方向。 结果，本发明的测量装置具有证明测量圆筒圆度的简单方法的优点。

公开(公告)号：US07733477B2

公开(公告)日：2010-06-08

申请号：US11916861

申请日：2006-07-19

Applicant: Jiubin Tan ,  Jiwen Cui

Inventor： Jiubin Tan ,  Jiwen Cui

IPC: G01N21/00

CPC classification number: G01B5/201 ,  G01B11/007

Abstract: A micro-cavity measuring equipment based on double optical fiber coupling includes a sight and transmitter, a controller, and a length measuring device. The equipment detects small changes in the position of an object with respect to a probe from a moment when the sight and transmitter starts working to another moment when the sight and transmitter stops working. The controller has a program to automatically control the whole measuring process. The measuring equipment is characterized in that the sight and transmitter consists of a laser unit, a data collecting and processing unit, and a double optical fiber coupling unit with its ends of incident and effluent optical fibers fixed on a coupler. A micro-cavity measuring method based on double optical fiber coupling consists of the following steps: inserting the probe into the micro-cavity and moving it in the measuring direction; sending signals to the length measuring device by the sight and transmitter to cause the length measuring device to record the corresponding position of the probe when the probe is contact with the sides of the micro-cavity; and then calculating the dimensions of the micro-cavity.

Abstract translation: 基于双光纤耦合的微腔测量设备包括瞄准器和发射器，控制器和长度测量装置。 当瞄准器和发射器开始工作时，当瞄准器和变送器停止工作时，设备可以检测物体相对于探头位置的微小变化。 控制器具有自动控制整个测量过程的程序。 测量设备的特征在于，瞄准器和发射器由激光单元，数据采集处理单元和双光纤耦合单元组成，其入射光纤和流出光纤的端部固定在耦合器上。 基于双光纤耦合的微腔测量方法包括以下步骤：将探头插入微腔并沿测量方向移动; 通过瞄准器和变送器将信号发送到长度测量装置，以使得当探针与微腔的侧面接触时，长度测量装置记录探针的相应位置; 然后计算出微腔的尺寸。

公开(公告)号：US20090048799A1

公开(公告)日：2009-02-19

申请号：US12153164

申请日：2008-05-14

Applicant: Soichi Kadowaki ,  Tsukasa Kojima

Inventor： Soichi Kadowaki ,  Tsukasa Kojima

IPC: G01B5/20 ,  G01B5/008

CPC classification number: G01B5/201 ,  G01B5/252

Abstract: A roundness measuring device obtains an eccentric position of a measured object with respect to a rotation axis in measuring roundness of the measured object by rotating and driving the measured object. The roundness measuring device includes: a measurement acquisition unit obtaining, as measurements, rotation angles of the measured object and distances from the rotation axis to a surface of the measured object, the distance corresponding to the rotating angle; and an eccentricity calculation unit setting a circular correction circle with its center position provided as variable parameters, calculating the center position of the correction circle that minimizes sum of squares of distances between each of the measurements and the correction circle, in a direction from each of the measurements toward the center position of the correction circle, and determining the center position of the correction circle as the eccentric position.

Abstract translation: 圆度测量装置通过旋转和驱动测量对象来测量被测物体相对于旋转轴的偏心位置，以测量被测物体的圆度。 圆度测量装置包括：测量获取单元，作为测量，获得测量对象的旋转角度和从旋转轴线到测量对象的表面的距离，对应于旋转角度的距离; 以及偏心计算单元，其中心位置设置为可变参数的圆形校正圆，计算校正圆的中心位置，该中心位置使得每个测量与校正圆之间的距离的平方和最小化， 对校正圆的中心位置的测量，并且将校正圆的中心位置确定为偏心位置。

公开(公告)号：US20080294369A1

公开(公告)日：2008-11-27

申请号：US12153340

申请日：2008-05-16

Applicant: Tsukasa Kojima

Inventor： Tsukasa Kojima

IPC: G01B5/20

CPC classification number: G01B21/045 ,  G01B5/201

Abstract: A roundness measuring device includes: an eccentric position calculation unit calculating, based on a measured distance and a measured angle, a distance between a axis of the measured object and a rotation axis as an eccentric distance, and calculating an angle formed between the detection line and a line segment connecting the rotation axis and the axis of the measured object as an eccentric angle; and a measurement correction unit correcting the measured distance based on the eccentric distance, the eccentric angle, the measured angle, a radius of the measured object, and a length from the center to the surface of the detector unit, and correcting the measured angle by adding a correction angle to the measured angle, the correction angle being formed between the detection line and a line segment connecting the rotation axis and a contact point where the measured object and the detector unit come in contact with one another.

Abstract translation: 圆度测量装置包括：偏心位置计算单元，基于测量的距离和测量的角度，将测量对象的轴线与旋转轴线之间的距离作为偏心距离计算，并且计算检测线 以及将测量对象的旋转轴和轴线连接成偏心角的线段; 以及测量校正单元，基于偏心距离，偏心角度，测量角度，测量对象的半径以及从检测器单元的中心到表面的长度来校正测量的距离，并且将测量的角度由 在测量角度上增加校正角，校正角形成在检测线与连接旋转轴线的线段和测量对象与检测器单元彼此接触的接触点之间。

公开(公告)号：US20080208523A1

公开(公告)日：2008-08-28

申请号：US12072196

申请日：2008-02-25

Applicant: Rene Schenck ,  Ralf Friedrich ,  Thomas Iffland ,  Daniel Skiera

Inventor： Rene Schenck ,  Ralf Friedrich ,  Thomas Iffland ,  Daniel Skiera

IPC: G01B5/00

CPC classification number: G01B5/02 ,  G01B5/201

Abstract: A method of determining geometric parameters of a wafer (16) is disclosed. For this purpose, the wafer (16) is inserted in a wafer holder (30). The wafer holder (30) is equipped with at least three mechanical contacting elements (22). The wafer is in mechanical contact with the contacting elements (22). The contacting elements (22) are distributed on the wafer holder (30) in such a way that they define a geometric figure which is configured such that the center point (40) of the wafer (16) comes to lie within the geometric figure. The position of each contacting element (22) is determined. Each desired geometric parameter of the wafer (16) is then calculated from the position of the contacting elements (22).

Abstract translation: 公开了一种确定晶片（16）的几何参数的方法。 为此，将晶片（16）插入晶片保持器（30）中。 晶片保持器（30）配备有至少三个机械接触元件（22）。 晶片与接触元件（22）机械接触。 接触元件（22）以这样的方式分布在晶片保持器（30）上，使得它们限定几何图形，其被配置为使得晶片（16）的中心点（40）位于几何图形内。 确定每个接触元件（22）的位置。 然后从接触元件（22）的位置计算晶片（16）的每个期望的几何参数。