MULTI-CHANNEL DETECTOR ASSEMBLY FOR DOWNHOLE SPECTROSCOPY

    公开(公告)号:CA2718449C

    公开(公告)日:2014-05-06

    申请号:CA2718449

    申请日:2010-10-19

    Abstract: A multi-channel detector assembly for downhole spectroscopy has a reference detector unit optically coupled to a reference channel of a source and has a measurement detector unit optically coupled to a measurement channel of the source. The reference and measurement detectors detect spectral signals across a spectral range of wavelengths from the reference and measurement channels. Conversion circuitry converts the detected spectral signals into reference signals and measurement signals, and control circuitry processes the reference and measurements signals based on a form of encoding used by the source. Then, the control circuitry can control the output of spectral signals from the source based on the processed signals or scale the measurement signal to correct for source fluctuations or changes in environmental conditions.

    274.
    发明专利
    未知

    公开(公告)号:DE60228542D1

    公开(公告)日:2008-10-09

    申请号:DE60228542

    申请日:2002-12-27

    Abstract: In a substrate inspecting apparatus comprising a projecting section (4) in which light sources (8), (9) and (10) for emitting colored lights of R, G and B are provided in directions having different elevation angles, one or two color components which is/are greater than the mean value of the intensities of color components of red, green and blue is/are extracted for an inspecting region including a soldered portion. Inclined surfaces adapted to the light sources (8), (9) and (10) are converted into monochromatic shaded images of red, green and blue by the extraction processing, respectively. Furthermore, a boundary position between the inclined surfaces adapted to the light sources (8) and (9) are converted into shaded images having a mixed color of red and green and the boundary position between the inclined surfaces adapted to the light sources (9) and (10) is converted into a shaded image having a mixed color of green and blue.

    Assembly and method for wavelength calibration in an echelle spectrometer

    公开(公告)号:AU2003210190B2

    公开(公告)日:2008-06-26

    申请号:AU2003210190

    申请日:2003-01-28

    Abstract: A spectrometer assembly ( 10 ) is disclosed. The assembly includes a light source ( 11 ) with a continuous spectrum. A pre-monochromator ( 2 ) generates a spectrum with a relatively small linear dispersion from which a spectral portion is selectable, the spectral bandwidth of the spectral portion being smaller than or equal to the bandwidth of the free spectral range of the order in the echelle spectrum. The centre wavelength of the selected spectral interval is measurable with maximum blaze efficiency. The assembly also includes an echelle spectrometer ( 4 ) with means for wavelength calibration, an entrance slit ( 21 ) at the pre-monochromator ( 2 ), an intermediate slit assembly ( 50 ) with an intermediate slit ( 3 ) and a spatially resolving light detector ( 5 ) in the exit plane of the spectrometer for the detection of wavelength spectra.

    276.
    发明专利
    未知

    公开(公告)号:NO20080166L

    公开(公告)日:2008-03-06

    申请号:NO20080166

    申请日:2008-01-09

    Abstract: This invention relates to a spectroscopic apparatus for measuring at least two spectrally shifted spectral distributions of a light beam, said apparatus comprises a dispersive element adapted to generate a spatial dispersion of the spectral components in a light beam when said dispersive element is being illuminated by said light beam; and a detector adapted to measure the intensity of at least a part of said dispersed spectral components where said apparatus further comprises an optical shifting means adapted to illuminate said dispersive element in at least two different ways, such that said light beam hits said dispersive element differently, and whereby said dispersive element generates at least two spatially shifted spatial dispersions of the spectral components in said light beam. The invention further relates to a probing system comprising said spectroscopic apparatus for measuring at least two spectrally shifted spectral distributions of a light beam, and a method for measuring at least two spectrally shifted spectral distributions of a light beam.

    278.
    发明专利
    未知

    公开(公告)号:AT350653T

    公开(公告)日:2007-01-15

    申请号:AT05253101

    申请日:2005-05-19

    Abstract: A radiation pulse, such as from a solar simulator, is spectrally analyzed over a selected sampling pulse that is shorter in duration than the radiation pulse and is timed to begin after the start of the radiation pulse. A deformable membrane mirror is controlled to function as a high speed shutter in the path of the radiation pulse. When not deformed, the mirror reflects the radiation pulse into an optical instrument, such as a spectroradiometer. A sampling pulse is generated for a selected time after the start of the radiation pulse and is applied to the mirror to ensure total reflection of the radiation pulse only for the duration of the sampling pulse. Controls are provided to adjust the start time and duration of the sampling pulse, and to adjust the sensitivity of sensing the start of the radiation pulse.

    280.
    发明专利
    未知

    公开(公告)号:DE59912273D1

    公开(公告)日:2005-08-18

    申请号:DE59912273

    申请日:1999-08-12

    Abstract: A device for detecting properties of a web of material has a crossbar extending across the web of material. An infrared spectrometer having a holographic grating is provided an has an input side and an output side. Infrared detectors are arranged at the output side of the infrared spectrometer and are formed by a detector matrix having n lines and m rows of infrared sensitive individual sensors. A plurality of optical waveguides are provided, each waveguide having an entrance area and an exit area. The entrance area is fastened to said crossbar, located in vicinity of the surface of the web of material and is oriented towards said surface. The exit areas of the optical waveguides are connected to the input side of the infrared spectrometer. The optical waveguides are arranged side by side in one line at this input side, so that infrared spectra inputted into the entrance areas of the individual optical waveguides appear in rows side by side at the output side of the spectrometer, and the spectra of up to m optical waveguides are distributed and detected in up to n spectral areas.

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