中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

522 records (took 0.035 seconds)

    SPEKTROMETERANORDNUNG
    281.
    发明授权
    SPEKTROMETERANORDNUNG 有权

    公开(公告)号：EP2158460B1

    公开(公告)日：2012-04-04

    申请号：EP08759490.9

    申请日：2008-05-09

    Applicant: Leibniz - Institut für Analytische Wissenschaften - ISAS - E.V.

    Inventor： BECKER-ROSS, Helmut ,  OKRUSS, Michael ,  FLOREK, Stefan

    IPC: G01J3/02 ,  G01J3/08 ,  G01J3/18 ,  G01J3/22 ,  G01J3/28 ,  G01J3/32

    CPC classification number: G01J3/22 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/08 ,  G01J3/1809 ,  G01J3/2823 ,  G01J3/32

    Abstract: The invention relates to a spectrometer arrangement (10) having a spectrometer for producing a spectrum of radiation from a radiation source on a detector (34), comprising an imaging, optical Littrow arrangement (18, 20) for imaging the radiation entering the spectrometer arrangement (16) in an image plane, a first dispersion arrangement (28, 30) for the spectral decomposition of a first wavelength range of the radiation entering the spectrometer arrangement, a second dispersion arrangement (58, 60) for the spectral decomposition of a second wavelength range of the radiation entering the spectrometer arrangement, and a common detector (34) arranged in the image plane of the imaging optics, characterized in that the imaging optical arrangement (18, 20) comprises an element (20) that can be moved between two positions (20, 50), wherein the radiation entering the spectrometer arrangement in the first position is guided via the first dispersion arrangement and in the second position via the second dispersion arrangement.

    Abstract translation: 本发明涉及一种具有光谱仪的光谱仪装置（10），该光谱仪用于在检测器（34）上产生来自辐射源的辐射光谱，该光谱仪装置包括成像光学利特罗装置（18,20），用于对进入光谱仪装置 （16）;第二色散装置（28,30），用于对进入光谱仪装置的辐射的第一波长范围进行光谱分解;第二色散装置（58,60），用于将第二色散装置 进入光谱仪装置的辐射的波长范围以及布置在成像光学装置的图像平面中的公共检测器（34），其特征在于，成像光学装置（18,20）包括元件（20），该元件可以在 两个位置（20,50），其中在第一位置进入光谱仪装置的辐射经由第一分散装置被引导并且经由第二分散装置被引导至第二位置 e第二分散装置。

    LIGHT MEASURING INSTRUMENT
    287.
    发明公开
    LIGHT MEASURING INSTRUMENT 审中-公开
    LICHTMESSGERÄT

    公开(公告)号：EP1906172A1

    公开(公告)日：2008-04-02

    申请号：EP06768161.9

    申请日：2006-07-12

    Applicant: Olympus Corporation

    Inventor： YAMAGUCHI, Mitsushiro c/o OLYMPUS INT. PROP. SERV.CO., LTD. ,  HARADA, Mitsuo c/o OLYMPUS INTEL. PROP. SERV. CO., LTD.

    IPC: G01N21/64

    CPC classification number: G01N21/6452 ,  G01J3/02 ,  G01J3/021 ,  G01J3/0229 ,  G01J3/0235 ,  G01J3/0289 ,  G01J3/06 ,  G01J3/08 ,  G01J3/10 ,  G01J3/42 ,  G01J2003/123 ,  G01N21/6428 ,  G01N21/6445

    Abstract: An optical measurement apparatus which includes at least one each of a light source (1), an optical element, a photodetector (2), and a sample container (22), and which measures a physical property of a biological sample in a solution retained by the sample container according to a plurality of kinds of measurement items, wherein a combination of the light source, the optical element, and the photodetector is selected or changed according to the measurement item, and a position where the photodetector is located is adjusted according to the selection or change based on intensity of light accepted by the photodetector.

    Abstract translation: 一种光学测量装置，其包括光源（1），光学元件，光电检测器（2）和样品容器（22）中的至少一个，并且测量保留的溶液中的生物样品的物理性质 通过根据测量项目选择或改变光源，光学元件和光电检测器的组合的多种测量项目的样本容器，并且根据测量项目调整光电探测器所在的位置 基于由光电检测器接收的光的强度进行选择或改变。

    A SPECTROMETRIC APPARATUS FOR MEASURING SHIFTED SPECTRAL DISTRIBUTIONS
    288.
    发明公开
    A SPECTROMETRIC APPARATUS FOR MEASURING SHIFTED SPECTRAL DISTRIBUTIONS 审中-公开
    SPEKTROMETRISCHE VORRICHTUNG ZUR MESSUNG VON VERSCHOBENEN SPEKTRALVERTEILUNGEN

    公开(公告)号：EP1889019A1

    公开(公告)日：2008-02-20

    申请号：EP06742453.1

    申请日：2006-06-08

    Applicant: RSP Systems APS

    Inventor： HENNEBERG, Morten ,  BANKE, Stephan, Ovesen

    IPC: G01J3/44 ,  G01J3/08

    CPC classification number: G01J3/08 ,  G01J3/0205 ,  G01J3/0294 ,  G01J3/0297 ,  G01J3/44 ,  G01J2003/4424

    Abstract: This invention relates to a spectroscopic apparatus for measuring at least two spectrally shifted spectral distributions of a light beam, said apparatus comprises a dispersive element adapted to generate a spatial dispersion of the spectral components in a light beam when said dispersive element is being illuminated by said light beam; and a detector adapted to measure the intensity of at least a part of said dispersed spectral components where said apparatus further comprises an optical shifting means adapted to illuminate said dispersive element in at least two different ways, such that said light beam hits said dispersive element differently, and whereby said dispersive element generates at least two spatially shifted spatial dispersions of the spectral components in said light beam. The invention further relates to a probing system comprising said spectroscopic apparatus for measuring at least two spectrally shifted spectral distributions of a light beam, and a method for measuring at least two spectrally shifted spectral distributions of a light beam.

    Abstract translation: 本发明涉及一种用于测量光束的至少两个光谱移动光谱分布的分光装置，所述装置包括色散元件，其适用于当所述色散元件被所述色散元件照亮时，在光束中产生光谱分量的空间色散 光束; 以及检测器，其适于测量所述分散光谱分量的至少一部分的强度，其中所述装置还包括适于以至少两种不同方式照亮所述色散元件的光学移动装置，使得所述光束不同地撞击所述色散元件 并且由此所述色散元件在所述光束中产生光谱分量的至少两个空间上移动的空间色散。 本发明还涉及一种包括用于测量光束的至少两个光谱移动光谱分布的所述分光装置的探测系统，以及用于测量光束的至少两个光谱移动的光谱分布的方法。

    A dual beam tunable spectrometer
    289.
    发明公开
    A dual beam tunable spectrometer 失效
    可调谐的双光束光谱仪

    公开(公告)号：EP0699898A3

    公开(公告)日：1996-10-30

    申请号：EP95113009.5

    申请日：1995-08-18

    Applicant: Bayer Corporation

    Inventor： Johnson, Rick J.

    IPC: G01J3/12

    CPC classification number: G01J3/1256 ,  G01J3/08 ,  G01J3/42

    Abstract: A dual beam tunable spectrometer comprises a radiation source, generating means, a detector, and a shutter arrangement. The radiation source generates an incident radiative beam. The generating means, which includes an acousto-optic tunable filter, receives the incident radiative beam and generates therefrom a reference beam and a sample beam. The detector detects at least part of the reference beam, and detects at least part of the sample beam emitted from a sample following illumination of the sample with the sample beam. The shutter arrangement includes a first shutter selectively permitting passage therethrough of the part of the reference beam and a second shutter selectively permitting passage therethrough of the part of the sample beam. The shutter arrangement opens the first shutter and closes the second shutter to permit the detector to detect only the part of the reference beam. Similarly, the shutter arrangement closes the first shutter and opens the second shutter to permit the detector to detect only the part of the sample beam.

Patent Agency Ranking