Abstract:
A system and method for profile measurement based on triangulation involves arrangement of an image acquisition assembly relative to an illumination assembly such that an imaging plane is parallel to a light plane (measurement plane defined by where the light plane impinges on the object), which supports uniform pixel resolution in the imaging plane. The image acquisition assembly includes an imaging sensor having a sensor axis and a lens having a principal axis, wherein the lens axis is offset from the imaging axis.
Abstract:
The present invention is directed to solving the problems associated with the detection of surface defects on metal bars as well as the problems associated with applying metal flat inspection systems to metal bars for non-destructive surface defects detection. A specially designed imaging system, which is comprised of a computing unit, line lights and high data rate line scan cameras, is developed for the aforementioned purpose. The target application is the metal bars (1) that have a circumference/cross-section-area ratio equal to or smaller than 4.25 when the cross section area is unity for the given shape, (2) whose cross-sections are round, oval, or in the shape of a polygon, and (3) are manufactured by mechanically cross-section reduction processes. The said metal can be steel, stainless steel, aluminum, copper, bronze, titanium, nickel, and so forth, and/or their alloys. The said metal bars can be at the temperature when they are being manufactured. A removable cassette includes various mirrors. A protection tube isolates the moving metal bar from the line light assembly and image acquisition camera. assembly and image acquisition camera. A contaminant reduction mechanism applies a vacuum to remove airborne contaminants.
Abstract:
A method is used for imaging applications so that one can simultaneously apply multiple illumination schemes and simultaneously acquire the images, each associated with one of the multiple illumination schemes. The illumination schemes can be, but not limited to, any combination of reflective illumination, transmitive illumination (backlighting), bright field illumination, dark field illumination, diffused illumination, cloudy-day illumination, and structured illumination. The radiation can be in any wavelengths, ranging from sonic waves, ultra sound, radio waves, microwaves, infrared, near infrared, visible light, ultra violet, X-rays, and gamma rays. The radiation of each of the illumination schemes used in an imaging application is modulated (57), that is, affixed with a unique signature. One or more imaging devices (52) can be used to collect the radiating rays simultaneously after the rays interact with the object (66). The image signals are then demodulated (54) and separated into several images, each being associated an illumination scheme, based on the signatures. A preferred embodiment is to use radiation wavelengths of 430 nm, 575 nm or 670 nm as the signatures.
Abstract:
The present invention is directed to solving the problems associated with the detection of surface defects on metal bars as well as the problems associated with applying metal flat inspection systems to metal bars for non-destructive surface defects detection. A specially designed imaging system, which is comprised of a computing unit, line lights and high data rate line scan cameras, is developed for the aforementioned purpose. The target application is the metal bars (1) that have a circumference/cross-section-area ratio equal to or smaller than 4.25 when the cross section area is unity for the given shape, (2) whose cross-sections are round, oval, or in the shape of a polygon, and (3) are manufactured by mechanically cross-section reduction processes. The said metal can be steel, stainless steel, aluminum, copper, bronze, titanium, nickel, and so forth, and/or their alloys. The said metal bars can be at the temperature when they are being manufactured. A removable cassette includes various mirrors. A protection tube isolates the moving metal bar from the line light assembly and image acquisition camera. assembly and image acquisition camera. A contaminant reduction mechanism applies a vacuum to remove airborne contaminants.
Abstract:
An inspection system is used to view an image of the inside diameter (ID) of an engine bearing. The inspection system includes a stationary line scan camera, a pivoting mirror, a scanning mirror and a stationary mount. The engine bearing is placed in the stationary mount such that the bearing remains motionless throughout the entire scanning process. The light line generator produces a light line that initially contacts a beam splitter. The beam splitter then guides the light line onto the pivoting mirror, which then directs the light line onto one of a pair of stationary mirrors and then finally onto the scanning mirror. The scanning mirror will sweep the light line across a portion of the engine bearing ID surface. The light line will generate reflected images of the ID surface. These reflected images will return along the light line's path; however, instead of being directed back into the light line generator by the beam splitter, the reflected images will pass through the beam splitter. Once the reflected images pass through the beam splitter, they will journey through the lens and into the stationary line scan camera. From the stationary line camera, the reflected images can be viewed on a monitor and recorded for future use.
Abstract:
An optical system for viewing hot objects is disclosed. The system projects electromagnetic radiation to the part surface and detects the reflected portion. Based on wavelength and/or modulation of the applied illumination, the surface characteristics of the part can be observed without interference from self-emitted radiation.
Abstract:
An optical system for viewing hot objects (2) is disclosed. The system projects electromagnetic radiation (26) to the part surface and detects the reflected portion. Based on wavelength and/or modulation of the applied illumination, the surface characteristics of the part can be observed (30) without interference from self-emitted radiation.
Abstract:
The present invention is directed to solving the problems associated with the detection of surface defects on metal bars as well as the problems associated with applying metal flat inspection systems to metal bars for non-destructive surface defects detection. A specially designed imaging system, which is comprised of a computing unit, line lights and high data rate line scan cameras, is developed for the aforementioned purpose. The target application is the metal bars (1) that have a circumference/cross-section-area ratio equal to or smaller than 4.25 when the cross section area is unity for the given shape, (2) whose cross-sections are round, oval, or in the shape of a polygon, and (3) are manufactured by mechanically cross-section reduction processes. The said metal can be steel, stainless steel, aluminum, copper, bronze, titanium, nickel, and so forth, and/or their alloys. The said metal bars can be at the temperature when they are being manufactured.