Abstract:
PURPOSE: A surface plasmon resonance sensor using beam profile ellipsometry is provided to measure the junction characteristic and dynamic characteristic of bio materials in real time through simultaneous measurement of surface plasmon resonance and ellipsometer phase change. CONSTITUTION: A surface plasmon resonance sensor using beam profile ellipsometry comprises a vertical beam profile ellipsometry, a surface plasmon resonance sensor(40), and a fluid path(1). The vertical beam profile ellipsometry detects polarized light by polarizing light and collecting a part of the polarized light to a metallic foil(42). The surface plasmon resonance sensor unit is provided in a condenser lens(40) of the beam profile ellipsometry and generates surface plasmon resonance by the angular variation of the polarized light. The fluid path provides the metallic foil with a buffer solution including bio materials to induce adsorption or desorption. The vertical beam profile ellipsometry comprises a light source(10), a polarized light device(20), a beam splitter(30), the condenser lens, a light analyzer(50), an optical detector(60), and an arithmetic processing unit(70).
Abstract:
본 발명은 고속 대면적 정밀측정 장치 및 방법에 관한 것으로, 보다 상세하게는 초점 타원계측부에서 시편의 특성을 고속으로 측정한 후에, 특이점이 나타나는 위치를 정밀측정부에서 보다 상세하게 측정하는 고속 대면적 정밀측정 장치 및 방법에 관한 것이다. 이를 위해 본 발명은 편광된 빛을 시편에 집중 조사한 후, 상기 시편으로부터 반사된 빛을 검출하여 상기 시편의 광학적 특성을 고속으로 측정하는 초점 타원계측부; 및 상기 시편의 광학적 특성 중 특이점이 나타나는 위치를 다시 원자 단위까지 측정하는 정밀측정부;를 포함하는 것을 특징으로 하는 고속 대면적 정밀측정 장치를 제공한다. 상기 고속 대면적 정밀측정 장치는 초점 타원계측부에서 고속으로 시편의 광학적 특성을 측정한 후에, 특이점이 나타나는 위치를 정밀측정부에서 다시 세밀하게 측정함으로써 시편의 광학적 특이점을 신속하고 정밀하게 측정할 수 있는 효과가 있다. 타원계측기, SPM, 탐침
Abstract:
A focused-beam ellipsometer is provided to relatively improve measuring precision and the drive speed of an optical detector by remove errors of rotation of optical parts and signal noises of motor vibration. A focused-beam ellipsometer includes light source(110), a light source unit module(120), a beam splitter(130), an objective lens(140), a light-receiving unit module(160), an optical detector(170), and an operation processing unit(180). The light source unit module has a linear polarizer linear-polarizing light emitted from the light source. The beam splitter splits the polarized light from the light source unit module. The objective lens illuminates some of the light from the beam splitter to a sample. The light-receiving unit module receives the reflected light from the sample. The optical detector detects the light received by light-receiving unit module to pixels. The operation processing unit compensates the strength of the light detected by the optical detector.
Abstract:
The present invention relates to a device and a method for simultaneously measuring the molecular binding characteristics of low molecular bio substances and the refractive index of a buffer solution using an ellipsometry under an immersed microchannel environment and, more specifically, to a device and a method for simultaneously measuring the refractive index of a buffer solution and the dynamic binding characteristics of bio substances at high sensitiveness by introducing polarized incident beams to an adsorption layer formed of the bio substances on substrate substances for semiconductors using a prism structure and a microchannel under p-wave non-reflective conditions. The device comprises: a microchannel structure; a sample injection part for forming the adsorption layer of a sample on a substrate by injecting the buffer solution containing the sample of the bio substances to the microchannel; a polarized beam generation part for radiating the incident beams polarized through the incident surface of a prism to the adsorption layer at an incident angle satisfying the p-wave non-reflective conditions; and a polarized beam detection part for detecting the polarized beam variation of reflected beams after the reflected beams of the adsorption layer are introduced through the reflection surface of the prism. The microchannel structure comprises: the substrate composed of a support, and semiconductors or dielectric substances formed on the support; a cover part formed as the prism structure and installed in the support; and the microchannel formed on one among the upper part of the support and the bottom of the cover part.
Abstract:
PURPOSE: An apparatus for measuring dynamic characteristic of molecule adsorption and dissociation is provided to measure the dynamic characteristic of low molecular bio material with high sensitivity. CONSTITUTION: An apparatus for measuring dynamic characteristic of molecule adsorption and dissociation comprises: a microchannel structure(100), a sample injection unit(200), a polarized light generator(300), and polarized light detector(400). The microchannel structure comprises a support(110), a substrate(120), a dielectric thin film(130), and cover part(140). The sample injection unit forms an adsorption layer(160) of a sample on the dielectric thin film by injecting a buffer solution(210). The polarized light generator irradiates incident light to the adsorption layer. The polarized light detector detects the change of the polarized light of the reflected light.
Abstract:
PURPOSE: An apparatus and a method for surface Plasmon resonance imaging ellipsometry are provided to enable a user to clearly and accurately observe the shape of samples and the attachment position of cells. CONSTITUTION: An apparatus for surface Plasmon resonance imaging ellipsometry comprises an elliptical polarized light supplying part and a surface plasmon resonance sensor. The an elliptical polarized light supplying part has a light source(10), a polarizer(12), and a phase delay unit. The polarizer generates linearly polarized light in the light source. The phase delay unit forms elliptical polarized light by phase-delaying the linearly polarized light emitted from the polarizer. The surface plasmon resonance sensor has a prism(21) and a metallic foil(23).