Flexible hermetic thin film with light extraction layer
    29.
    发明授权
    Flexible hermetic thin film with light extraction layer 有权
    柔性密封薄膜与光提取层

    公开(公告)号:US08946754B2

    公开(公告)日:2015-02-03

    申请号:US14305314

    申请日:2014-06-16

    CPC classification number: H01L51/5253 H01L51/5268

    Abstract: A protected organic light emitting diode includes an organic light emitting diode structure formed on a substrate, a hermetic barrier layer formed over at least part of the organic light emitting diode structure, and a light extraction layer. The barrier layer may include a glass material such as a tin fluorophosphate glass, a tungsten-doped tin fluorophosphate glass, a chalcogenide glass, a tellurite glass, a borate glass or a phosphate glass. The light extraction layer, which may be formed over the barrier layer, includes a high refractive index matrix material and at least one of scattering particles dispersed throughout the matrix material and a roughened surface.

    Abstract translation: 受保护的有机发光二极管包括形成在衬底上的有机发光二极管结构,在至少部分有机发光二极管结构上形成的气密阻挡层和光提取层。 阻挡层可以包括玻璃材料,例如氟磷酸锡玻璃,掺杂钨的锡氟磷酸盐玻璃,硫族化物玻璃,碲酸盐玻璃,硼酸盐玻璃或磷酸盐玻璃。 可以形成在阻挡层上的光提取层包括高折射率基体材料和分散在整个基体材料中的散射粒子和粗糙化表面中的至少一种。

    METHOD FOR INHIBITING OXYGEN AND MOISTURE DEGRADATION OF A DEVICE AND THE RESULTING DEVICE
    30.
    发明申请
    METHOD FOR INHIBITING OXYGEN AND MOISTURE DEGRADATION OF A DEVICE AND THE RESULTING DEVICE 审中-公开
    用于抑制装置和结果装置的氧气和水分降解的方法

    公开(公告)号:US20140234542A1

    公开(公告)日:2014-08-21

    申请号:US14223380

    申请日:2014-03-24

    CPC classification number: B05D5/00 C03C3/122 C03C3/14 C03C3/247 H01L51/5253

    Abstract: A method for inhibiting oxygen and moisture degradation of a device and the resulting device are described herein. To inhibit the oxygen and moisture degradation of the device, a low liquidus temperature (LLT) material which typically has a low low liquidus temperature (or in specific embodiments a low glass transition temperature) is used to form a barrier layer on the device. The LLT material can be, for example, tin fluorophosphate glass, chalcogenide glass, tellurite glass and borate glass. The LLT material can be deposited onto the device by, for example, sputtering, evaporation, laser-ablation, spraying, pouring, frit-deposition, vapor-deposition, dip-coating, painting or rolling, spin-coating or any combination thereof. Defects in the LLT material from the deposition step can be removed by a consolidation step (heat treatment), to produce a pore-free, gas and moisture impenetrable protective coating on the device. Although many of the deposition methods are possible with common glasses (i.e. high melting temperature glasses like borate silicate, silica, etc.), the consolidation step is only practical with the LLT material where the consolidation temperature is sufficiently low so as to not damage the inner layers in the device.

    Abstract translation: 本文描述了一种用于抑制装置和所得装置的氧气和水分降解的方法。 为了抑制器件的氧气和水分降解,通常使用通常具有低液相线温度(或在特定实施方案中为低玻璃化转变温度)的低液相线温度(LLT)材料以在器件上形成阻挡层。 LLT材料可以是例如氟磷酸铁玻璃,硫族化物玻璃,碲化物玻璃和硼酸盐玻璃。 通过例如溅射,蒸发,激光烧蚀,喷涂,浇注,玻璃料沉积,气相沉积,浸涂,喷涂或轧制,旋涂或其任何组合,可将LLT材料沉积到器件上。 来自沉积步骤的LLT材料的缺陷可以通过固结步骤(热处理)去除,以在器件上产生无孔隙的气体和湿气不透明的保护涂层。 虽然许多沉积方法可能用普通玻璃(即,高熔点玻璃像硼酸硅酸盐,二氧化硅等),但固结步骤仅适用于LLT材料,其中固结温度足够低以免损坏 设备内层。

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