Abstract:
PROBLEM TO BE SOLVED: To form a homogeneous and dense aluminum film by a simple method.SOLUTION: An aluminum film forming method includes: a coating film forming process of coating a surface of a metal oxide layer with composition for forming an aluminum film containing the complex of a first amine compound and aluminum hydride and organic solvent to form a coating film; and an aluminum film forming process of forming the aluminum film on the coating film by executing at least one kind of treatment to be selected from heat treatment and light irradiation treatment.
Abstract:
PROBLEM TO BE SOLVED: To provide an electrically conductive stacked film easily and inexpensively usable for the wiring and electrode of many electronic devices, to provide a method of forming the same, and to provide wiring and an electrode obtained by using the same. SOLUTION: The electrically conductive stacked film is obtained by stacking a metal aluminum film and an electrically conductive film comprising metal selected from the group consisting of molybdenum, tungsten and tantalum, and carbon. The electrode or wiring of an electronic device is obtained by using the same. In the method of forming an electrically conductive film, an organic metal complex of metal selected from the group consisting of molybdenum, tungsten and tantalum is applied to the surface of a substrate, next, heat treatment is performed to form an electrically conductive film, then, a complex of an amine compound and alane (aluminum hydride) is applied to the surface of the electrically conductive film, and next, heat and/optical treatment is performed to form a metal aluminum film. COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a ruthenium compound from which film-like metallic ruthenium of high quality can be obtained, and to provide a method of forming a metallic ruthenium film by a chemical vapor deposition method using the same. SOLUTION: The ruthenium compound as a chemical vapor deposition material is, e.g. expressed by formula (1). COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a method for synthesizing a trifluorophosphine-ruthenium compound under low-temperature and low-pressure conditions.SOLUTION: The method for producing a ruthenium compound includes a step of reacting a compound represented by general formula (1): RuLwith trifluorophosphine, or reacting the compound represented by general formula (1) with trifluorophosphine, and hydrogen or a halogen to obtain a compound represented by general formula (2): Ru(PF)(L)(L)(in general formulas (1) and (2), each of Land Lrepresents an unsaturated 4-10C hydrocarbon compound having at least two double bonds; Lrepresents a hydrogen atom or a halogen atom; l is an integer of 1-5; m is an integer of 0-4; and n is an integer of 0-2, provided that l+m+2n=5 or 6).
Abstract translation:待解决的问题:提供在低温低压条件下合成三氟化膦 - 钌化合物的方法。 解决方案:钌化合物的制造方法包括使通式(1)表示的化合物:RuL 0 SP> 或使通式(1)表示的化合物与三氟化膦反应,得到通式(2)表示的化合物:Ru(PF ) 1 SB>(L 1 SP>) m SB> SP POS =“POST”> 2 SP>) n SB>(在通式(1)和(2)中,L 0 SP>和L 2 SP>表示具有至少两个双键的不饱和4-10C烃化合物; L 1 SP> 氢原子或卤原子; l为1-5的整数; m为0-4的整数; n为0-2的整数,条件是l + m + 2n = 5或6)。 版权所有(C)2012,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a composition for forming a ruthenium film by a simple and inexpensive coating method, and a method for forming the ruthenium film by the coating using the composition. SOLUTION: The composition for forming the ruthenium film includes ruthenium compounds such as tetra (μ-trifluoro-acetate) di (acetone) di-ruthenium, and a tetra (μ-pentafluoro-propionate) di (acetone) di-ruthenium, and solvent. In the method for forming the ruthenium film, the ruthenium film is formed on a base body by coating the composition for forming the ruthenium film on the base body, and heating the composition and/or applying the light thereon. COPYRIGHT: (C)2010,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a method for forming a conductive foundation film for burying a trench by a plating method to an insulating base having a trench of a small opening width and a large aspect ratio, or a formation method for forming an aluminum film which is useful as a method for forming a conductive film of a uniform thickness in an inner surface of a through-hole of a multilayer structure. SOLUTION: The method for forming an aluminum film comprises a process (1) for preparing a base with a trench or a hole, a process (2) for applying a composition comprising compound and solvent comprising at least one kind of atom selected from a group consisting of titanium, palladium and aluminum on the base under a first pressure, a process (3) for putting the base after applied under a second pressure which is smaller than the first pressure in the application process, a process (4) for performing heat treatment for the base, a process (5) for applying a composition comprising a complex and solvent of amine compound and aluminum hydride, and a process (6) for performing heat treatment for the base. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a chemical vapor deposition method capable of performing a stable film deposition and obtaining a high-definition film even when using a raw material having low decomposition temperature. SOLUTION: The chemical vapor deposition method is characterized in that the pressure in a reaction chamber is varied by being reached to a first set pressure and a second set pressure, which is higher than the first set pressure, alternately. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a method for preventing peeling in an interface between an insulating film layer of especially a low dielectric constant and a diffusion preventing film layer when wiring is formed on the insulating film layer of a low dielectric constant by a damascene method. SOLUTION: A ruthenium-silicon mixed film is formed by a method wherein a specified ruthenium compound (A) and an annular silane compound (B) are used as a raw material. The specified ruthenium compound (A) is expressed by, for example, formula (1): (Cp') 2 Ru, wherein Cp' is a ligand expressed by formula (2) and the two Cp's can be the same or different from each other. Wherein, R 1 is a 1-6C alkyl group or fluoro-alkyl group, trimethylsilyl group or fluorine atom, a is an integer of 0 to 5, and when a plurality of R 1 s exist, they can be the same or different from each other. COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a composition for forming a tantalum oxide film capable of easily and efficiently forming a high quality tantalum oxide film having a large specific dielectric constant and a less leak current and being preservable for a long time under an atmospheric condition at a high humidity, a tantalum oxide film formed thereby, and its manufacturing method. SOLUTION: The composition for forming the tantalum oxide film contains a reaction product prepared from tantalum alkoxide and at least one or more kinds among carboxylic acids and carboxylic acid anhydrides and a solvent. The tantalum oxide film is formed by forming a coating film of the composition and then treating it with heat and/or light. COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a composition capable of forming a cured product excellent in at least water-absorbing properties, oxygen-absorbing properties, and heat resistance; a cured product formed from the composition; and an electronic device including the cured product. SOLUTION: The composition contains: (A) an organometallic compound represented by general formula (1): (R 1 )nM; and (B) a polymer including a repeating unit represented by general formula (2) and having a weight-average molecular weight (Mw) of 10,000-1,000,000. COPYRIGHT: (C)2011,JPO&INPIT