公开(公告)号：EP4251961A1

公开(公告)日：2023-10-04

申请号：EP21823963.0

申请日：2021-11-18

Applicant: Silios Technologies

Inventor： TISSERAND, Stéphane ,  ROUX, Laurent

IPC: G01J3/02 ,  G01J3/26 ,  G01J3/28 ,  G01J3/12

公开(公告)号：EP3830535A1

公开(公告)日：2021-06-09

申请号：EP19761924.0

申请日：2019-07-29

Applicant: Silios Technologies

Inventor： TISSERAND, Stéphane ,  ROUX, Laurent ,  HUBERT, Marc ,  SAUGET, Vincent

IPC: G01J3/26 ,  G01J3/28 ,  H01L27/146 ,  G01J3/02

公开(公告)号：EP2596333A1

公开(公告)日：2013-05-29

申请号：EP11757354.3

申请日：2011-07-18

Applicant: Silios Technologies

Inventor： REVERSAT, Fabien ,  HUBERT, Marc ,  TISSERAND, Stéphane ,  ROUX, Laurent

IPC: G01N21/27 ,  G01N21/85

CPC classification number: G01N21/59 ,  G01N21/274 ,  G01N21/8507

Abstract: The invention relates to an optical probe, comprising: a first cell (C1) which includes a first transmission module (LED1) and a first detection module (D1) capable of producing a first detection signal; a second cell (C2) which includes a second detection module (D2) capable of generating a first signal for monitoring the first transmission module (LED1); a control circuit for generating a first signal for the weighted measurement of the first detection signal using the first monitoring signal. Furthermore, the second cell (C2) includes a second transmission module (LED2); the second detection module (D2) is capable of generating a second detection signal; and the first detection module (D1) is capable of generating a second signal for monitoring the second transmission module (LED2).

公开(公告)号：EP1759165A1

公开(公告)日：2007-03-07

申请号：EP05783850.0

申请日：2005-06-23

Applicant: Silios Technologies

Inventor： TISSERAND, Stephane ,  ROUX, Laurent ,  JACOB, Sophie

IPC: G01B7/34 ,  G01N27/00 ,  H01L21/66 ,  H01J37/20

CPC classification number: H01L22/34

Abstract: The invention relates to a calibrating device on a silicon substrate SU formed in addition to reference level Nc by at least two distinct levels Ng and Nd which have two distinct dopings. Said invention also relates to a method for producing the inventive calibrating device consisting in defining at least two distinct sections Sg and Sd of the reference section Sc on a silicon substrate SU and in doping with different degrees the different sections of the reference section.