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公开(公告)号：EP1688973A4
公开(公告)日：2010-03-03
申请号：EP04818194
申请日：2004-11-05
Applicant: TDK CORP
Inventor： YAMASHITA MITSUHIRO , NAGASAKA TAKASHI , MIURA HIDEKI , MATSUKAWA YASUHIRO , SATO KAZUO , SATO AKIRA , SATO HIRONORI , ITO TAKAYUKI , KITAJIMA YASUHIKO
CPC classification number: H01F27/292 , H01F17/045 , H01F27/027 , H01F27/33 , H01F41/082
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公开(公告)号：DE3906281A1
公开(公告)日：1989-10-19
申请号：DE3906281
申请日：1989-02-28
Applicant: TDK CORP
Inventor： MIZUNO TOURU , KITAJIMA YASUHIKO
Abstract: A method of optically checking the appearances of chips and sorting the chips comprises the steps of feeding chips onto chip-passage body to cause the chips to run on the chip-passage body in a predetermined direction; during the running of the chips on the chip-passage body, individually separating the chips to stop the chips one by one at each of two predetermined checking positions; irradiating light obliquely and straightly with respect to a chip at one of the predetermined checking positions to pick up an optical image of one of undersurface and top surface sides of the chip as a video signal by means of a first TV camera; irradiating light obliquely and straightly with respect to the chip at the other of the predetermined checking positions to pick up an optical image of the other of the undersurface and top surface sides of the chip as a video signal by means of a second TV camera; sending the video signals to image processing sections, each of which includes at least an analog-to-digital conversion unit, a video memory and a central processing unit, to process the video signals in the image processing sections and obtain data on the appearance of the chip and a tilt angle of the chip on each of the predetermined checking positions of the chip-passage body, thereby checking on the basis of the data whether the chip is acceptable or defective in its appearance; and thereafter sorting chips on the basis of the check results. Also, an apparatus for optically checking the appearances of chips and sorting the chips is disclosed.
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公开(公告)号：GB2217444B
公开(公告)日：1992-05-13
申请号：GB8904468
申请日：1989-02-28
Applicant: TDK CORP
Inventor： MIZUNO TOURU , KITAJIMA YASUHIKO
Abstract: A method of optically checking the appearances of chips and sorting the chips comprises the steps of feeding chips onto chip-passage body to cause the chips to run on the chip-passage body in a predetermined direction; during the running of the chips on the chip-passage body, individually separating the chips to stop the chips one by one at each of two predetermined checking positions; irradiating light obliquely and straightly with respect to a chip at one of the predetermined checking positions to pick up an optical image of one of undersurface and top surface sides of the chip as a video signal by means of a first TV camera; irradiating light obliquely and straightly with respect to the chip at the other of the predetermined checking positions to pick up an optical image of the other of the undersurface and top surface sides of the chip as a video signal by means of a second TV camera; sending the video signals to image processing sections, each of which includes at least an analog-to-digital conversion unit, a video memory and a central processing unit, to process the video signals in the image processing sections and obtain data on the appearance of the chip and a tilt angle of the chip on each of the predetermined checking positions of the chip-passage body, thereby checking on the basis of the data whether the chip is acceptable or defective in its appearance; and thereafter sorting chips on the basis of the check results. Also, an apparatus for optically checking the appearances of chips and sorting the chips is disclosed.
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公开(公告)号：FR2629585A1
公开(公告)日：1989-10-06
申请号：FR8902564
申请日：1989-02-28
Applicant: TDK CORP
Inventor： MIZUNO TOURU , KITAJIMA YASUHIKO
Abstract: A method of optically checking the appearances of chips and sorting the chips comprises the steps of feeding chips onto chip-passage body to cause the chips to run on the chip-passage body in a predetermined direction; during the running of the chips on the chip-passage body, individually separating the chips to stop the chips one by one at each of two predetermined checking positions; irradiating light obliquely and straightly with respect to a chip at one of the predetermined checking positions to pick up an optical image of one of undersurface and top surface sides of the chip as a video signal by means of a first TV camera; irradiating light obliquely and straightly with respect to the chip at the other of the predetermined checking positions to pick up an optical image of the other of the undersurface and top surface sides of the chip as a video signal by means of a second TV camera; sending the video signals to image processing sections, each of which includes at least an analog-to-digital conversion unit, a video memory and a central processing unit, to process the video signals in the image processing sections and obtain data on the appearance of the chip and a tilt angle of the chip on each of the predetermined checking positions of the chip-passage body, thereby checking on the basis of the data whether the chip is acceptable or defective in its appearance; and thereafter sorting chips on the basis of the check results. Also, an apparatus for optically checking the appearances of chips and sorting the chips is disclosed.
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25.发明专利
公开(公告)号：GB2217444A
公开(公告)日：1989-10-25
申请号：GB8904468
申请日：1989-02-28
Applicant: TDK CORP
Inventor： MIZUNO TOURU , KITAJIMA YASUHIKO
Abstract: A method of optically checking the appearances of chips and sorting the chips comprises the steps of feeding chips onto chip-passage body to cause the chips to run on the chip-passage body in a predetermined direction; during the running of the chips on the chip-passage body, individually separating the chips to stop the chips one by one at each of two predetermined checking positions; irradiating light obliquely and straightly with respect to a chip at one of the predetermined checking positions to pick up an optical image of one of undersurface and top surface sides of the chip as a video signal by means of a first TV camera; irradiating light obliquely and straightly with respect to the chip at the other of the predetermined checking positions to pick up an optical image of the other of the undersurface and top surface sides of the chip as a video signal by means of a second TV camera; sending the video signals to image processing sections, each of which includes at least an analog-to-digital conversion unit, a video memory and a central processing unit, to process the video signals in the image processing sections and obtain data on the appearance of the chip and a tilt angle of the chip on each of the predetermined checking positions of the chip-passage body, thereby checking on the basis of the data whether the chip is acceptable or defective in its appearance; and thereafter sorting chips on the basis of the check results. Also, an apparatus for optically checking the appearances of chips and sorting the chips is disclosed.
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Patent Agency Ranking
公开(公告)号：JPS62297978A
公开(公告)日：1987-12-25
申请号：JP14161286
申请日：1986-06-18
Applicant: TDK CORP
Inventor： TAKAHASHI TETSUO , ARAYA SHINICHI , KITAJIMA YASUHIKO
IPC: G06T1/60
Abstract: PURPOSE:To ensure image processing with high accuracy by taking out only video signals of either one of even and odd fields forming a frame through a TV camera and storing them in a video memory. CONSTITUTION:A TV camera 1 photographs a stationary subject and the video signals of an even or odd field of the camera 1 are taken out and amplified by a video preamplifier 2. Then the analog video signals are converted into digital binary signals by an A/D converter 3. Picture element information is stored in a video memory 4 and a microcomputer 5 reads out images stored in the memory 4 and the position, the distance, the size, etc. of a subject to be measured is properly calculated. Thus the variance equivalent to a single picture element caused by the 2:1 interface of the camera 1 is eliminated and the images are processed with high accuracy.
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公开(公告)号：JP2001230140A
公开(公告)日：2001-08-24
申请号：JP2000038327
申请日：2000-02-16
Applicant: TDK CORP
Inventor： KITAJIMA YASUHIKO
IPC: H01F41/00
Abstract: PROBLEM TO BE SOLVED: To enhance the freedom of the manufacturing order of electronic components in every kind and to prevent excess or shortage of the components in the latter half of the production line of the components by a method, where the indication of pallets is enabled by arbitrarily setting pallet numbers on pallet number set indication to contrive to manufacture the components cor responding to the pallet numbers. SOLUTION: The assembly method of electronic components is provided with a manufacturing process that pallets 10 to simultaneously transfer a plurality of the components in every kind are used and at the same time, the plurality of the components, which are transferred by the pallets 10, are simultaneously manufactured in every kind and a composite component assembly process that a prescribed kind of the components are transferred on a base board from the pallets by a mounting part 26 and a plurality of the components are integrally assembled on the base board, each pallet 10 has a set pallet number indicator 30 and a pallet number to respond to the kind of the components to be transferred by the pallet is set on the indicator 30.
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公开(公告)号：JP2000153441A
公开(公告)日：2000-06-06
申请号：JP32714498
申请日：1998-11-17
Applicant: TDK CORP
Inventor： KITAJIMA YASUHIKO
IPC: B24B27/04
Abstract: PROBLEM TO BE SOLVED: To perform high accurate grinding work by simple equipment without being influenced by a cut object, even when it has dispersion in thickness, distortion, etc., so as to enhance durability of use of a cutting tool. SOLUTION: A balance bar 10 of which the halfway in the longitudinal direction is supported by a bearing on a support point 11 with its axis swingable is provided, a cutting tool 12 is provided on one end side of the balance bar 10, and a weight 13 is provided on the other end side. A cutting load by the cutting tool 12 abutting to a surface of a cut object 1 to apply cutting work is set by weight balance with the weight 13. Further, this set cutting load is fixedly maintained by a swing of the balance bar 10 in accordance with the cutting tool 12 abutting to the surface of the cut object 1, to constitute a balance type trimming device capable of cutting the surface of the cut object 1 by the cutting tool 12 sliding along the surface.
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公开(公告)号：JPH01249181A
公开(公告)日：1989-10-04
申请号：JP7957888
申请日：1988-03-31
Applicant: TDK CORP
Inventor： MIZUNO TORU , KITAJIMA YASUHIKO
Abstract: PURPOSE:To improve screening efficiency by providing three classifying chutes to the terminal part of a carrying path and operating a chute opening/closing gate member by the signal of an image processing part, thereby sorting the carried parts to 3 kinds. CONSTITUTION:A chip capacitor 1 which is the part to be inspected is subjected to transmission illumination by a light source 7 from the lower side of ground glass 5 and the transmitted therethrough from a light source 7 is passed through a condenser lens 8 and a slit 4 and is taken into a camera 10 by diagonal illumination via a reflecting plate 9. This light is inputted as a video signal into A/D conversion parts 12a, 12b of the image processing part. Two units of the optical system cameras 10 are provided along the chip carrying path to detect the front and rear of the chip capacitor. The results of the front face and the rear face are decided by a CPU 15 for controlling the mechanism part, by which the carrying, separating, stopping in the inspection position, and selecting are controlled. The reliability of the inspection is thereby improved.
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公开(公告)号：JP2002301569A
公开(公告)日：2002-10-15
申请号：JP2001108196
申请日：2001-04-06
Applicant: TDK CORP
Inventor： OGASAWARA HIROYUKI , KITAJIMA YASUHIKO
IPC: B23K9/00 , B23K9/16 , B23K101/38
Abstract: PROBLEM TO BE SOLVED: To provide a method of welding a conductor and terminal to prevent the occurrence of such discoloration which arises in appearance in the periphery of a weld zone and part of the conductor even if the terminal and the conductor are welded by jetting gaseous argon to the circumference of an electrode generat ing an arc and the degradation in merchandise value arising from the discolora tion, and also to provide welding device. SOLUTION: The terminal 910 and the conductor 920 are held in the state of coming into contact with each other and are housed into a container 2 which is internally and hermetically shielded from the atmosphere air. The gaseous argon is supplied from one end (IN) into the container 2 and is discharged from the other end (OUT), by which the prescribed gaseous atmosphere is maintained in the container 2. The arc is discharged between the terminal 910 and the conductor 920 from the tip of a torch 20, and terminal 910 and the conductor 20 are welded by arc heat.
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