회전하는 다중 형광 검출 장치용 가열 요소
    24.
    发明公开
    회전하는 다중 형광 검출 장치용 가열 요소 无效
    旋转多重荧光检测装置的加热元件

    公开(公告)号:KR1020080041175A

    公开(公告)日:2008-05-09

    申请号:KR1020087000202

    申请日:2006-03-24

    Abstract: Techniques are described for the detection of multiple target species in real-time PCR (polymerase chain reaction). For example, a system comprises a data acquisition device and a detection device coupled to the data acquisition device. The detection device includes a rotating disk having a plurality of process chambers having a plurality of species that emit fluorescent light at different wavelengths. The device further includes a plurality of removable optical modules that are optically configured to excite the species and capture fluorescent light emitted by the species at different wavelengths. A fiber optic bundle coupled to the plurality of removable optical modules conveys the fluorescent light from the optical modules to a single detector. The device further includes a heating element for heating one or more process chambers on the disk. In addition, the device may control the flow of fluid in the disk by locating and selectively opening valves separating chambers by heating the valves with a laser.

    Abstract translation: 描述了用于在实时PCR(聚合酶链式反应)中检测多种靶物种的技术。 例如,系统包括数据采集装置和耦合到数据采集装置的检测装置。 检测装置包括具有多个处理室的旋转盘,该多个处理室具有发射不同波长的荧光的多种物质。 该装置还包括多个可移除的光学模块,其被光学配置为激发物种并捕获由不同波长的物质发射的荧光。 耦合到多个可移除光学模块的光纤束将来自光学模块的荧光传送到单个检测器。 该装置还包括用于加热盘上的一个或多个处理室的加热元件。 此外,该装置可以通过利用激光加热阀来定位和选择性地打开阀分离腔来控制盘中的流体流动。

    Measuring apparatus for absorbance
    27.
    发明专利
    Measuring apparatus for absorbance 失效
    用于吸收的测量装置

    公开(公告)号:JPS59178339A

    公开(公告)日:1984-10-09

    申请号:JP5467583

    申请日:1983-03-29

    Applicant: Toshiba Corp

    Inventor: MINEKANE TOMIJI

    Abstract: PURPOSE: To enable highly-precise absorptiometric analysis even with a xenon flash lamp used as a light source, by inputting an output of a detector which detects a monochromatic light coming from a spectroscopic element, and by calculating the average of n-time additions with respect to an absorbance in a plural-wavelength difference.
    CONSTITUTION: A pulse-form light, which is emitted (n) times from a xenon flash lamp 1 to the same sample in a reaction tube 3, is transmitted through said sample and falls sequentially on a diffraction grating 5. The light separated into wavelengths λ
    1 and λ
    2 by the diffraction grating 5 is detected by a detector 6, and an output of the detector 6 is inputted to an arithmetical means 8 through an amplifier 7. This input means the quantities I
    1 (λ
    1 )WI
    n (λ
    1 ) in the number of (n) of the light of the wavelength λ
    1 transmitted through the same sample and the quantities I
    1 (λ
    2 )WI
    n (λ
    2 ) in the number of (n) of the light of the wavelength λ
    2 transmitted thereby. With a constant (n) inputted from CPU11 furthermore, the arithmetical means 8 finds the average of n-time additions of an absorbance in a two-wavelength difference (λ
    1 -λ
    2 ). Based on the average value of n-time additions of the absorbance in the two-wavelength difference, the density of the sample is calculated according to the Lambert-Beer law.
    COPYRIGHT: (C)1984,JPO&Japio

    Abstract translation: 目的:即使使用氙气闪光灯作为光源,也可以通过输入检测来自分光元件的单色光的检测器的输出,并通过计算n次添加的平均值来实现高精度的吸光度分析 相对于多个波长差的吸光度。 构成:从氙闪光灯1向反应管3中的相同样品发射(n)次的脉冲形式的光通过所述样品透射并依次落在衍射光栅5上。将光分离成波长 λ1和λ2由检测器6检测,检测器6的输出通过放大器7被输入到算术装置8.该输入是指在第1 通过相同样本传输的波长λ1的光的(n)个数和从其传输的波长λ2的光的数量(λ)的数量I1(λ2)-In(λ2)。 利用从CPU11输入的常数(n),算术装置8找到在两个波长差(λ1-λ2)中吸光度的n次加法的平均值。 根据在两个波长差异中吸光度的n次加法的平均值,根据朗伯 - 比尔定律计算样品的密度。

    형광 측정 장치
    28.
    发明公开
    형광 측정 장치 无效
    荧光测量装置

    公开(公告)号:KR1020040039398A

    公开(公告)日:2004-05-10

    申请号:KR1020047004194

    申请日:2003-03-24

    Abstract: 본 발명의 형광 측정 장치는 여기 광원을 사용하여 거의 동시에 샘플 챔버 내의 다수의 샘플을 측정하거나 또는 동일한 샘플의 다수의 지점을 측정한다. 형광 측정 장치는 여기광 조사 위치에서 로터리 샘플 스탠드(2)를 갖고, 다수의 관통 구멍(2a)이 로터리 샘플 스탠드(2) 주변에 형성되고, 샘플 배치 유닛(3)이 각각의 관통 구멍(2a) 내에 삽입될 수 있다. 샘플 스탠드(2)를 여기 광 조사 위치에 대해 이동시켜, 샘플 챔버(1) 내에서 요구되는 샘플 재배치 없이 다수의 샘플에 형광 측정이 이루어질 수 있다.

    순수 염료 장비 정규화 방법 및 시스템
    29.
    发明公开
    순수 염료 장비 정규화 방법 및 시스템 审中-实审
    纯染料设备的标准化方法和系统

    公开(公告)号:KR1020170134360A

    公开(公告)日:2017-12-06

    申请号:KR1020177025092

    申请日:2016-02-05

    Inventor: 막스,제프리

    Abstract: 본기술은다수의장비에걸쳐스펙트럼을정규화하기위한방법및 시스템에관한것이다. 이방법(800)은적어도하나의기준장비및 시험장비를포함한다. 각각의장비는쌍으로배열된적어도하나의여기필터및 적어도하나의방출필터를포함한다. 각각의장비는복수의웰을포함하는순수염료플레이트를추가로포함한다. 각각의웰은형광성분을포함하는복수의염료를함유한다. 다수의필터조합에걸쳐각각의염료에대해각각의장비(805, 820)로부터형광스펙트럼이얻어져, 기준장비에대한순수염료행렬 Mref 및시험장비에대한순수염료행렬 M에기여한다. 이어서, 순수염료스펙트럼에각각의필터쌍에대한교정계수를곱하여(840) 교정된순수염료스펙트럼이얻어지고, 이어서정규화(845)될수 있으며, 다성분화데이터가추출될수 있다(850).

    Abstract translation: 本技术涉及用于对多个仪器上的光谱进行归一化的方法和系统。 方法800包括至少一个参考仪器和测试仪器。 每个装置包括至少一个激励滤波器和至少一个成对排列的发射滤波器。 每个试剂盒还包含含有多个孔的纯染料板。 每个孔含有多个含有荧光部分的染料。 对于每种染料在各种仪器(805,820)上通过多种滤光器组合获得荧光光谱,有助于参考仪器的纯染料基质Mref和测试仪器的纯染料基质M. 然后,由校正系数乘以在纯染料光谱840的每个滤波器对得到纯染料光谱的校准,然后进行归一化845,性分化可以850中的数据被提取。

    OPTICAL INTERROGATION SYSTEM AND METHOD FOR USING SAME
    30.
    发明申请
    OPTICAL INTERROGATION SYSTEM AND METHOD FOR USING SAME 审中-公开
    光学互连系统及其使用方法

    公开(公告)号:WO2005006055A1

    公开(公告)日:2005-01-20

    申请号:PCT/US2004/015726

    申请日:2004-05-19

    CPC classification number: G01N21/253 G01N2201/04 G01N2201/10 G02B27/1086

    Abstract: An optical interrogation system and method are described herein that are capable of generating light beams that have desired optical properties which are directed towards a specimen array. In one embodiment, the optical interrogation system includes a light source, a diffractive element and a collimating optic (e.g., simple lens(es), f-θ lens(es), segmented mirror, fiber array). The light source emits a light beam to the diffractive optic which receives the light beam and outputs an array of light beams to the collimating optic. The collimating optic receives and conditions the light beams emitted from the diffractive optic and then outputs the conditioned light beams which have desired optical properties towards a specimen array. Several other embodiments of the optical interrogation system are also described herein.

    Abstract translation: 本文描述的光学询问系统和方法能够产生具有指向样本阵列的所需光学特性的光束。 在一个实施例中,光学询问系统包括光源,衍射元件和准直光学元件(例如简单透镜,f-θ透镜,分割镜,光纤阵列)。 光源向衍射光学器件发射光束,该衍射光学器件接收光束并将光束阵列输出到准直光学元件。 准直光学器件接收并调节从衍射光学器件发出的光束,然后将具有期望的光学特性的经调节的光束输出到样本阵列。 光学询问系统的其他几个实施例在这里也被描述。

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