Fluorometer
    21.
    发明申请
    Fluorometer 审中-公开

    公开(公告)号:US20170108435A1

    公开(公告)日:2017-04-20

    申请号:US14882839

    申请日:2015-10-14

    Inventor: Matthew Anctil

    Abstract: A fluorometer can comprise a microfluidics chip receptacle configured to receive a microfluidics chip. The fluorometer can comprise a reflective enclosure that has an outer surface and an inner surface. The microfluidics chip receptacle can be configured in relation to the reflective enclosure so that the reflective enclosure can receive, at the inner surface, light energy emitted from an analyte on a microfluidics chip disposed in the microfluidics chip receptacle. The fluorometer can comprise an excitation source configured to emit excitation energy to the microfluidics chip receptacle. The fluorometer can comprise a light sensor configured in relation to the microfluidics chip receptacle to receive light energy from the microfluidics chip receptacle. The light energy, caused by the excitation energy, is emitted from an analyte. The fluorometer can comprise a controller configured to determine a concentration of an analyte from the light energy received at the light sensor.

    SYSTEM AND METHOD FOR ACQUIRING IMAGES
    22.
    发明申请
    SYSTEM AND METHOD FOR ACQUIRING IMAGES 有权
    用于获取图像的系统和方法

    公开(公告)号:US20130002841A1

    公开(公告)日:2013-01-03

    申请号:US13611833

    申请日:2012-09-12

    Abstract: A vision system useful in acquiring images includes: a light dome having a window and a perimeter; an annular light curtain positioned within and radially inwardly from the perimeter of the light dome such that an annular gap is formed between the light dome and the light curtain; and a light ring positioned to illuminate the gap between the light dome and the light curtain. The light curtain and window are sized and positioned such that no direct light from the light ring reaches the window. The system further comprises a camera having a lens facing the window to acquire images of an object on a side of the window opposite the camera. The images acquired by the camera can then be compared to stored images to determine whether the identity of the objects (which may be pharmaceutical tablets) is as expected.

    Abstract translation: 用于获取图像的视觉系统包括:具有窗口和周边的光穹顶; 环形光幕位于光穹顶的周边内并径向向内,使得在光穹顶和光幕之间形成环形间隙; 以及定位成照亮光穹顶和光幕之间的间隙的光环。 光幕和窗户的大小和位置使得没有来自光环的直接光线到达窗口。 该系统还包括具有面向窗口的透镜的相机,以获取与相机相对的窗口一侧的物体的图像。 然后将相机获取的图像与存储的图像进行比较,以确定物体(可能是药片)的身份是否如预期的那样。

    QUANTUM EFFICIENCY MEASURING DEVICE AND QUANTUM EFFICIENCY MEASURING METHOD
    24.
    发明公开
    QUANTUM EFFICIENCY MEASURING DEVICE AND QUANTUM EFFICIENCY MEASURING METHOD 有权
    设备和方法测量量子效率

    公开(公告)号:EP2315003A4

    公开(公告)日:2011-10-05

    申请号:EP09709437

    申请日:2009-01-20

    Inventor: OHKUBO KAZUAKI

    Abstract: A sample (OBJ1) that is an object whose quantum efficiency is to be measured, and a standard object (REF1) having a known reflectance characteristic are each attached to a sample window (2) provided in a plane mirror (5). Based on respective spectrums measured by a spectrometer in respective cases where the sample (OBJ1) is attached and the standard object (REF1) is attached, the quantum efficiency of the sample (OBJ1) is measured. The plane of an opening of an observation window (3) is made substantially coincident with the exposed surface of the sample (OBJ1) or standard object (REF1), so that direct incidence, on the observation window (3), of the fluorescence generated from the sample (OBJ1) receiving an excitation light (L1) and the excitation light (L1) reflected from sample (OBJ1) is prevented.

    Surface inspection
    25.
    发明公开
    Surface inspection 失效
    Oberflächeninspektion。

    公开(公告)号:EP0275469A2

    公开(公告)日:1988-07-27

    申请号:EP87118384.4

    申请日:1987-12-11

    CPC classification number: G01N21/94 G01N21/9501 G01N2021/8867 G01N2201/0655

    Abstract: A system and procedure for the inspection of the surface of a semiconductor wafer (26) ascertains that particulate contaminants have been adequately cleaned from the surface during the manufacture of integrated electric circuits. The wafer is advanced in a first direction (30) and is optically scanned in a second direction, transverse to the first direction, for recording intensities of light reflected normally from the wafer surface as a function of location on the scan line. A high intensity reflection is indicative of a smooth flat surface suitable for inspection of particles by an integrating hemisphere (48) with plural photodetectors (50,52) therein. A weak reflection is indicative of undulations and patterned regions which are unfavorable for examination of particles on the wafer surface. A second scan is offset sideways to compensate for motion of the wafer so as to rescan the same line as the first scan. The photodetectors in the integrating sphere are gated on and off during the second scan at the locations of suitable inspection sites determined from the first scan.

    Abstract translation: 用于检查半导体晶片(26)的表面的系统和程序确定在制造集成电路期间颗粒污染物已被充分地从表面清洁。 晶片沿着第一方向(30)前进,并且沿与第一方向垂直的第二方向被光学扫描,用于记录来自晶片表面的光的正常反射的强度作为扫描线上的位置的函数。 高强度反射表示适于通过其中具有多个光电检测器(50,52)的积分半球(48)检查颗粒的平滑平坦表面。 弱反射表示不利于检查晶片表面上的颗粒的起伏和图案区域。 第二扫描侧向偏移以补偿晶片的运动,以便重新扫描与第一扫描相同的线。 在第二次扫描期间,在从第一次扫描确定的合适的检查位置的位置处,积分球中的光电检测器被门控打开和关闭。

    QUANTUM EFFICIENCY MEASURING DEVICE AND QUANTUM EFFICIENCY MEASURING METHOD
    26.
    发明授权
    QUANTUM EFFICIENCY MEASURING DEVICE AND QUANTUM EFFICIENCY MEASURING METHOD 有权
    量子效率测量装置和量子效率测量方法

    公开(公告)号:EP2315003B1

    公开(公告)日:2017-11-29

    申请号:EP09709437.9

    申请日:2009-01-20

    Inventor: OHKUBO, Kazuaki

    Abstract: A sample (OBJ1) that is an object whose quantum efficiency is to be measured, and a standard object (REF1) having a known reflectance characteristic are each attached to a sample window (2) provided in a plane mirror (5). Based on respective spectrums measured by a spectrometer in respective cases where the sample (OBJ1) is attached and the standard object (REF1) is attached, the quantum efficiency of the sample (OBJ1) is measured. The plane of an opening of an observation window (3) is made substantially coincident with the exposed surface of the sample (OBJ1) or standard object (REF1), so that direct incidence, on the observation window (3), of the fluorescence generated from the sample (OBJ1) receiving an excitation light (L1) and the excitation light (L1) reflected from sample (OBJ1) is prevented.

    Optical measurement apparatus, optical measurement system, and fiber coupler
    28.
    发明专利
    Optical measurement apparatus, optical measurement system, and fiber coupler 有权
    光学测量装置,光学测量系统和光纤耦合器

    公开(公告)号:JP2011203077A

    公开(公告)日:2011-10-13

    申请号:JP2010069964

    申请日:2010-03-25

    Abstract: PROBLEM TO BE SOLVED: To provide a quantum efficiency measuring method which can reduce the error resulting from re-excitation (secondary excitation) during measurement of quantum efficiency, a quantum efficiency measuring apparatus, and an integrator made to face the apparatus.SOLUTION: The optical measurement apparatus includes a spectroscopic measurement device 50, an incidence-side fiber 20 for propagating light to be measured, a hemispherical part 1 having a light diffuse reflection layer 1a on its inner wall, and a plane part 2 disposed to close an opening of the hemispherical part 1 and having a mirror reflection layer 2a located to face the inner wall of the hemispherical part 1. The plane part 2 includes an incidence window 5 for directing the light emitted thorough the incidence-side fiber 20 into an integrating space formed by the hemispherical part 1 and the plane part 2, and an emission-side fiber 30 for propagating the light in the integrating space to the spectroscopic measurement device 50 through an emission window 6.

    Abstract translation: 要解决的问题:提供量子效率测量方法,其可以减少量子效率测量期间的再激励(二次激发)导致的误差,量子效率测量装置和面向设备的积分器。解决方案: 光学测量装置包括光谱测量装置50,用于传播待测光的入射侧光纤20,在其内壁上具有光漫反射层1a的半球形部分1和用来封闭被测光的开口的平面部分2 半球形部分1并且具有面对半球形部分1的内壁的镜面反射层2a。平面部分2包括入射窗5,用于将通过入射侧光纤20射出的光引导到由 半球形部分1和平面部分2以及用于将积分空间中的光传播到光谱m的发射侧光纤30 测量装置50通过发射窗口6。

    QUANTUM EFFICIENCY MEASURING DEVICE AND QUANTUM EFFICIENCY MEASURING METHOD
    29.
    发明公开
    QUANTUM EFFICIENCY MEASURING DEVICE AND QUANTUM EFFICIENCY MEASURING METHOD 有权
    量子效率测量装置和量子效率测量方法

    公开(公告)号:EP2315003A1

    公开(公告)日:2011-04-27

    申请号:EP09709437.9

    申请日:2009-01-20

    Inventor: OHKUBO, Kazuaki

    Abstract: A sample (OBJ1) that is an object whose quantum efficiency is to be measured, and a standard object (REF1) having a known reflectance characteristic are each attached to a sample window (2) provided in a plane mirror (5). Based on respective spectrums measured by a spectrometer in respective cases where the sample (OBJ1) is attached and the standard object (REF1) is attached, the quantum efficiency of the sample (OBJ1) is measured. The plane of an opening of an observation window (3) is made substantially coincident with the exposed surface of the sample (OBJ1) or standard object (REF1), so that direct incidence, on the observation window (3), of the fluorescence generated from the sample (OBJ1) receiving an excitation light (L1) and the excitation light (L1) reflected from sample (OBJ1) is prevented.

    Abstract translation: 将作为量子效率被测量对象的样品(OBJ1)和具有已知反射特性的标准物(REF1)分别附着到设置在平面镜(5)中的样品窗口(2)。 基于分别安装样本(OBJ1)和标准物体(REF1)的情况下通过光谱仪测量的各个光谱,测量样本(OBJ1)的量子效率。 观察窗(3)的开口的平面基本上与样品(OBJ1)或标准物(REF1)的暴露表面重合,从而在观察窗(3)上直接入射产生的荧光 从接收激发光(L1)的样本(OBJ1)和从样本(OBJ1)反射的激发光(L1)被阻止。

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